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IEEE transactions on electron devices, v.59 no.12, 2012년, pp.3401 - 3404
Jianping Zhang (Shanghai Univ. of Electr. Power, Shanghai, China) , Fang Liu (Shanghai Univ. of Electr. Power, Shanghai, China) , Yu Liu (Shanghai Inst. of Ceramics, Shanghai, China) , Wu, Helen (Sch. of Comput., Eng. & Math., Univ. of Western Sydney, Sydney, NSW, Australia) , Wenli Wu (Shanghai Univ. of Electr. Power, Shanghai, China) , Aixi Zhou (Dept. of Eng. Technol., Univ. of North Carolina at Charlotte, Charlotte, NC, USA)
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In this paper, accelerated life tests of white organic light-emitting diodes (WOLEDs) are conducted to obtain failure data at normal operation conditions. The lognormal distribution function was applied to describe WOLED life distribution. Log mean and log standard deviation were determined by maxim...
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