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NTIS 바로가기Current applied physics : the official journal of the Korean Physical Society, v.17 no.5, 2017년, pp.661 - 674
Seol, Daehee (Corresponding author.) , Kim, Bora , Kim, Yunseok
Piezoresponse force microscopy (PFM) has been used extensively for exploring nanoscale ferro/piezo-electric phenomena over the past two decades. The imaging mechanism of PFM is based on the detection of the electromechanical (EM) response induced by the inverse piezoelectric effect through the canti...
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