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NTIS 바로가기IEEE transactions on dielectrics and electrical insulation : a publication of the IEEE Dielectrics and Electrical Insulation Society, v.24 no.3, 2017년, pp.1574 - 1581
Kim, Kwangho (Sungkyunkwan University, Department of Electrical and Electronic Engineering, Suwon 440-746, Korea) , Shin, Jaeyoung (Sungkyunkwan University, Department of Electrical and Electronic Engineering, Suwon 440-746, Korea) , Kim, Byung-Sung (Sungkyunkwan University, Department of Electrical and Electronic Engineering, Suwon 440-746, Korea) , Nah, Wansoo (Sungkyunkwan University, Department of Electrical and Electronic Engineering, Suwon 440-746, Korea) , Lim, Chanwoo (Ajou University, Department of Mechanical Engineering, Suwon 443-749, Korea) , Chai, Jangbom (Ajou University, Department of Mechanical Engineering, Suwon 443-749, Korea)
This paper proposes electrical and mechanical diagnostic methods to estimate the aging effects of 14 American wire gage (AWG) 600 V rated shielded twisted pair (STP) cables used in nuclear power plant. The cables were accelerated to be degraded in a dry oven using Arrhenius's equation, and the prope...
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