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NTIS 바로가기Microelectronics reliability, v.76/77, 2017년, pp.606 - 609
Lee, Sang Myung (Corresponding author.) , Yun, Ilgu
For the next generation display, foldable display is one of the attractive candidates. However, the degradation effects due to the mechanical stress on the device are unavoidable. A strain due to the mechanical stress generates cracks on the thin film transistors (TFTs). In this case, if the methodo...
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