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NTIS 바로가기IEEE transactions on instrumentation and measurement, v.66 no.12, 2017년, pp.3399 - 3401
Pepe, Domenico (Keysight Technologies Ltd., Wokingham, U.K.) , Barnett, Clive (Keysight Technologies Netherlands B.V., Amsterdam, BV, The Netherlands) , D'Amore, Giovanni , Zito, Domenico
This paper addresses the extension of the on-chip cold-source noise figure (NF) measurement methodology to millimeter-wave (mm-wave) integrated circuits by using the PNA-X. The proposed methodology has been successfully applied to the on-chip NF measurements of mm-wave building blocks on silicon suc...
Gao, Yuan, Zoughi, Reza. Millimeter Wave Reflectometry and Imaging for Noninvasive Diagnosis of Skin Burn Injuries. IEEE transactions on instrumentation and measurement, vol.66, no.1, 77-84.
Tae-Weon Kang, Jeong-Hwan Kim, No-Weon Kang, Jin-Seob Kang.
A Thermal Noise Measurement System for Noise Temperature Standards in
Eur GaAs Rel III-V Compounds Appl Symp Dig A wideband automated measurement system for on-wafer noise parameter measurements at 50–75 GHz kantanen 2001 255
High-Accuracy Noise Figure Measurements Using the PNA-X Series Network Analyzer 0
Proc Eur Solid-State Circuits Conf (ESSCIRC) A 78.8–92.8 GHz 4-bit 0–360° active phase shifter in 28 nm FDSOI CMOS with 2.3 dB average peak gain pepe 2015 64
Noise figure measurement accuracy The Y-factor method 0
Vaha-Heikkila, T., Lahdes, M., Kantanen, M., Tuovinen, J.. On-wafer noise-parameter measurements at W-band. IEEE transactions on microwave theory and techniques, vol.51, no.6, 1621-1628.
Mereni, Lorenzo, Pepe, Domenico, Zito, Domenico. Analyses and design of 95-GHz SoC CMOS radiometers for passive body imaging. Analog integrated circuits and signal processing, vol.77, no.3, 373-383.
Eur GaAs Rel III-V Compounds Appl Symp Dig V-band on-wafer noise parameter measurements lahdes 1998 39
Rappaport, Theodore S., Sun, Shu, Mayzus, Rimma, Zhao, Hang, Azar, Yaniv, Wang, Kevin, Wong, George N., Schulz, Jocelyn K., Samimi, Mathew, Gutierrez, Felix. Millimeter Wave Mobile Communications for 5G Cellular: It Will Work!. IEEE access : practical research, open solutions, vol.1, 335-349.
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