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NTIS 바로가기Applied surface science, v.433, 2018년, pp.994 - 1017
Chatterjee, Shiladitya (Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA) , Singh, Bhupinder (Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA) , Diwan, Anubhav (Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA) , Lee, Zheng Rong (Department of Physics, Illinois Institute of Technology, Chicago, IL 60616, USA) , Engelhard, Mark H. (Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA 99354, USA) , Terry, Jeff (Department of Physics, Illinois Institute of Technology, Chicago, IL 60616, USA) , Tolley, H. Dennis (Department of Statistics, Brigham Young University, Provo, UT 84602, USA) , Gallagher, Neal B. (Eigenvector Research, Inc., PO Box B, Manson, WA 98831, USA) , Linford, Matthew R. (Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA)
Abstract X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) are much used analytical techniques that provide information about the outermost atomic and molecular layers of materials. In this work, we discuss the application of multivariate spectral ...
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