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A perspective on two chemometrics tools: PCA and MCR, and introduction of a new one: Pattern recognition entropy (PRE), as applied to XPS and ToF-SIMS depth profiles of organic and inorganic materials 원문보기

Applied surface science, v.433, 2018년, pp.994 - 1017  

Chatterjee, Shiladitya (Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA) ,  Singh, Bhupinder (Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA) ,  Diwan, Anubhav (Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA) ,  Lee, Zheng Rong (Department of Physics, Illinois Institute of Technology, Chicago, IL 60616, USA) ,  Engelhard, Mark H. (Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, Richland, WA 99354, USA) ,  Terry, Jeff (Department of Physics, Illinois Institute of Technology, Chicago, IL 60616, USA) ,  Tolley, H. Dennis (Department of Statistics, Brigham Young University, Provo, UT 84602, USA) ,  Gallagher, Neal B. (Eigenvector Research, Inc., PO Box B, Manson, WA 98831, USA) ,  Linford, Matthew R. (Department of Chemistry and Biochemistry, Brigham Young University, Provo, UT 84602, USA)

Abstract AI-Helper 아이콘AI-Helper

Abstract X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) are much used analytical techniques that provide information about the outermost atomic and molecular layers of materials. In this work, we discuss the application of multivariate spectral ...

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