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2. Kwon, Jong-Hoon, Rhee, Hyug-Gyo, Ghim, Young-Sik, Lee, Yun-Woo. Field-Curvature Correction According to the Curvature of a CMOS Image-Sensor Using Air-Gap Optimization. Journal of the Optical Society of Korea, vol.19, no.6, 658-664.

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3. Son, S. W., Kihm, H. Y., and Yang, H. S, “Effect of Die Bonding Epoxy on the Warpage and Optical Performance of Mobile Phone Camera Packages,” Journal of the Semiconductor & Display Technology, Vol. 15, No. 4, pp. 1-9, 2016. 

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10. Ruprecht, A. K., Wiesendanger, T. F., Tiziani, H. J.. Chromatic confocal microscopy with a finite pinhole size. Optics letters, vol.29, no.18, 2130-.

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11. Miks, Antonin, Novak, Jiri, Novak, Pavel. Analysis of method for measuring thickness of plane-parallel plates and lenses using chromatic confocal sensor. Applied optics, vol.49, no.17, 3259-.

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12. Browne, M. A., Akinyemi, O., Boyde, A.. Confocal surface profiling utilizing chromatic aberration. Scanning : the journal of scanning microscopies, vol.14, no.3, 145-153.

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