최소 단어 이상 선택하여야 합니다.
최대 10 단어까지만 선택 가능합니다.
다음과 같은 기능을 한번의 로그인으로 사용 할 수 있습니다.
NTIS 바로가기IEEE transactions on components, packaging, and manufacturing technology, v.8 no.12, 2018년, pp.2152 - 2162
Park, Junyong (Korea Advanced Institute of Science and Technology, Terahertz Interconnection and Package Laboratory, Daejeon, South Korea) , Kim, Hyesoo (Korea Advanced Institute of Science and Technology, Terahertz Interconnection and Package Laboratory, Daejeon, South Korea) , Kim, Jonghoon J. (Korea Advanced Institute of Science and Technology, Terahertz Interconnection and Package Laboratory, Daejeon, South Korea) , Kim, Dong-Hyun (Korea Advanced Institute of Science and Technology, Terahertz Interconnection and Package Laboratory, Daejeon, South Korea) , Son, Kyungjune (Korea Advanced Institute of Science and Technology, Terahertz Interconnection and Package Laboratory, Daejeon, South Korea) , Kim, Subin (Korea Advanced Institute of Science and Technology, Terahertz Interconnection and Package Laboratory, Daejeon, South Korea) , Lee, Seongsoo (Korea Advanced Institute of Science and Technology, Terahertz In) , Cho, Kyungjun , Bae, Bumhee , Ha, Dongho , Bae, Michael , Kim, Joungho
This paper, for the first time, proposes and verifies a new coaxial silicone rubber socket for high-bandwidth and high-density package test using a fabricated sample. In addition, this paper also characterizes and verifies the coaxial silicone rubber socket. Because of the proposed coaxial socket's ...
Lee, H.-H.S., Chakrabarty, K.. Test Challenges for 3D Integrated Circuits. IEEE design & test of computers, vol.26, no.5, 26-35.
Tunaboylu, Bahadir. Electrical Characterization of Test Sockets With Novel Contactors. IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society, vol.14, no.1, 580-582.
Ruey-Bo Sun, Chang-Yi Wen, Ruey-Beei Wu. A New Isolation Structure of Pogo Pins for Crosstalk Reduction in a Test Socket. IEEE transactions on components, packaging, and manufacturing technology, vol.1, no.4, 586-594.
Norberg, G., Dejanovic, S., Hesselbom, H.. Very high density interconnect elastomer chip sockets. IEEE transactions on advanced packaging : a publication of the IEEE Components, Packaging, and Manufacturing Technology Society and the Lasers and Electro Optics Society, vol.29, no.2, 202-210.
Capacitance of Parallel Cylinder Conductor 2018
Katti, G., Stucchi, M., De Meyer, K., Dehaene, W.. Electrical Modeling and Characterization of Through Silicon via for Three-Dimensional ICs. IEEE transactions on electron devices, vol.57, no.1, 256-262.
Inductance Loop and Partial paul 2010 195
IEEE Trans Electromagn Compat Progress review of electromagnetic compatibility analysis technologies for packages, printed circuit boards, and novel interconnects li 2010 10.1109/TEMC.2010.2048755 52 248
Introduction to Flip-Chip 2000
IBM J Res Develop Is 3D chip technology the next growth engine for performance improvement? emma 2008 10.1147/JRD.2008.5388561 52 541
Davis, W.R., Wilson, J., Mick, S., Xu, J., Hua, H., Mineo, C., Sule, A.M., Steer, M., Franzon, P.D.. Demystifying 3D ICs: the pros and cons of going vertical. IEEE design & test of computers, vol.22, no.6, 498-510.
Liu, Weifeng, Lee, Mikyoung, Pecht, M., Martens, R.. An investigation of the contact resistance of a commercial elastomer interconnect under thermal and mechanical stresses. IEEE transactions on device and materials reliability : a publication of the IEEE Electron Devices Society and the IEEE Reliability Society, vol.3, no.2, 39-43.
Inductance of Parallel Cylinder Conductor 2018
*원문 PDF 파일 및 링크정보가 존재하지 않을 경우 KISTI DDS 시스템에서 제공하는 원문복사서비스를 사용할 수 있습니다.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.