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NTIS 바로가기Solid-State and Integrated Circuit Technology (ICSICT), 2010 10th IEEE International Conference on, 2010 Nov, 2010년, pp.950 - 952
Zhu, Xuqiang (School of Microelectronics and Solid-state Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China) , Chen, Xingbi (School of Microelectronics and Solid-state Electronics, University of Electronic Science and Technology of China, Chengdu 610054, China)
A novel silicon-controlled rectifier (SCR) device with high-current low-voltage triggering characteristics is proposed to improve Electrostatic Discharge (ESD) immunity of the input gate oxide based on a standard 2-µm CMOS technology. The numeral simulation results shows that the device has a...
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