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Chemical plating process 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-003/02
출원번호 US-0641134 (1975-12-15)
발명자 / 주소
  • Bellis Harold E. (Wilmington DE) Booker Donald E. (Wilmington DE)
출원인 / 주소
  • E. I. Du Pont de Nemours and Company (Wilmington DE 02)
인용정보 피인용 횟수 : 40  인용 특허 : 0

초록

A process for chemical plating of nickel or cobalt onto materials otherwise noncatalytic to the plating baths by pretreating the materials with a reducing agent such as sodium borohydride or dimethylamine borane prior to chemical plating. Treating the material with an oxidizing agent prior to the pr

대표청구항

A process for plating nickel or cobalt by chemical reduction of a plating bath onto the surface of an electrically conducting material which is normally non-catalytic to the plating bath, said material selected from the group (measured by weight) consisting of copper and copper-based alloys containi

이 특허를 인용한 특허 (40)

  1. Kolics, Artur; Petrov, Nicolai; Ting, Chiu; Ivanov, Igor, Activation-free electroless solution for deposition of cobalt and method for deposition of cobalt capping/passivation layer on copper.
  2. Narcus Harold (15 Vesper St. Worcester MA 01602), Bright electroless plating process and plated articles produced thereby.
  3. Reid, Jonathan D.; Webb, Eric G.; Minshall, Edmund B.; Kepten, Avishai; Stowell, R. Marshall; Mayer, Steven T., Capping before barrier-removal IC fabrication method.
  4. Reid, Jonathan D.; Webb, Eric G.; Minshall, Edmund B.; Kepten, Avishai; Stowell, R. Marshall; Mayer, Steven T., Capping before barrier-removal IC fabrication method.
  5. Reid, Jonathan D.; Webb, Eric G.; Minshall, Edmund B.; Kepten, Avishai; Stowell, R. Marshall; Mayer, Steven T., Capping before barrier-removal IC fabrication method.
  6. Reid, Jonathan D.; Webb, Eric G.; Minshall, Edmund B.; Kepten, Avishai; Stowell, R. Marshall; Mayer, Steven T., Capping before barrier-removal IC fabrication method.
  7. Rice James H. (Sylmar CA), Circuit board material and electroplating bath for the production thereof.
  8. McComas C. Edward, Coating compositions containing nickel and boron.
  9. Nakatsugawa Hiroshi (Yokohama JPX), Copper foil for a printed circuit and a method for the production thereof.
  10. Kolics, Artur; Ivanov, Igor, Electroless deposition chemical system limiting strongly adsorbed species.
  11. Park, Heung L.; Webb, Eric G.; Reid, Jonathan D.; Cleary, Timothy Patrick, Electroless layer plating process and apparatus.
  12. Feldstein Nathan (Princeton NJ), Electrolessly metallized product of non-catalytic metal or alloy.
  13. Feldstein Nathan (63 Hemlock Cir. Princeton NJ 08540), Electrolessly metallized silver coated article.
  14. Mallory ; Jr. Glenn O. (Los Angeles CA), Electrolessly plated product having a polymetallic catalytic film underlayer.
  15. Hodgens ; II Henry M. (Jupiter FL), Ethylenethiourea wear resistant electroless nickel-boron coating compositions.
  16. Koos, Daniel A.; Mayer, Steven T.; Park, Heung L.; Cleary, Timothy Patrick; Mountsier, Thomas, Fabrication of semiconductor interconnect structure.
  17. Mayer, Steven T.; Koos, Daniel A.; Webb, Eric, Fabrication of semiconductor interconnect structure.
  18. Mayer, Steven T.; Koos, Daniel A.; Webb, Eric, Fabrication of semiconductor interconnect structure.
  19. Fakler John ; Rush Michael ; Campbell Scott, Method and composition for amine borane reduction of copper oxide to metallic copper.
  20. Kolics, Artur; Petrov, Nicolai; Ting, Chiu; Ivanov, Igor C., Method for electroless deposition of phosphorus-containing metal films onto copper with palladium-free activation.
  21. Koos,Daniel A.; Mayer,Steven T.; Park,Heung L.; Cleary,Timothy Patrick; Mountsier,Thomas, Method for fabrication of semiconductor interconnect structure with reduced capacitance, leakage current, and improved breakdown voltage.
  22. Satoh Hiroshi (Hyogo JPX) Utsui Yoshihiko (Hyogo JPX) Kitazaki Kuraki (Hyogo JPX) Taniguchi Takashi (Hyogo JPX) Hayashi Kiyoshi (Hyogo JPX), Method for manufacturing a strain detector.
  23. Feldstein Nathan (63 Hemlock Cir. Princeton NJ 08540), Method for rendering a non-platable semiconductor substrate platable.
  24. Feldstein Nathan (63 Hemlock Cir. Princeton NJ 08540), Method for rendering non-platable semiconductor substrates platable.
  25. Feldstein Nathan (Princeton NJ), Method for rendering non-platable substrates platable.
  26. Feldstein Nathan (Princeton NJ), Method for rendering non-platable surfaces platable.
  27. Brasch William (Commack NY), Method of improving the adhesion of electroless metal deposits employing colloidal copper activator.
  28. Ishibashi, Yusuke; Konno, Yuya; Watanabe, Yujiro; Yasui, Toyoaki; Tanaka, Kazunari; Kawahara, Kosei; Fuchigami, Yohei; Nishina, Toshio, Method of manufacturing rotary machine, method of plating rotary machine, and rotary machine.
  29. Ehrbar Jean-Paul (La Chaux-de-Fonds CHX) Ganguillet Claude (Neuchatel CHX), Method of preparation of a substrate made of plastic material for its subsequent metallization.
  30. Mallory ; Jr. Glenn O. (Los Angeles CA), Method of preparing substrate surface for electroless plating and products produced thereby.
  31. Mayer, Steven T.; Porter, David W., Modulated metal removal using localized wet etching.
  32. Acosta Raul E. (White Plains NY) Horkans Wilma J. (Ossining NY) Mukherjee Ruby (San Jose CA) Olsen Judith D. (Goldens Bridge NY), Prevention of mechanical and electronic failures in heat-treated structures.
  33. Braun Camille (Saint Nizier du Moucherotte FRX) Danroc Jol (Grenoble FRX) Francois Bernard (Montbonnot FRX) Michel Jean (Biviers FRX), Process for treating a metal oxide powder.
  34. Mayer, Steven T.; Porter, David W., Reduced isotropic etchant material consumption and waste generation.
  35. Mayer, Steven T.; Porter, David W., Reduced isotropic etchant material consumption and waste generation.
  36. Mayer, Steven T.; Rea, Mark L.; Hill, Richard S.; Kepten, Avishai; Stowell, R. Marshall; Webb, Eric G., Topography reduction and control by selective accelerator removal.
  37. Frick John P. (Dallas TX), Use of electroless nickel coating to prevent galling of threaded tubular joints.
  38. Mayer, Steven T.; Webb, Eric G.; Porter, David W., Wet etching methods for copper removal and planarization in semiconductor processing.
  39. Mayer, Steven T.; Webb, Eric; Porter, David W., Wet etching methods for copper removal and planarization in semiconductor processing.
  40. Mayer, Steven T.; Webb, Eric; Porter, David W., Wet etching methods for copper removal and planarization in semiconductor processing.
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