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[미국특허] Method and apparatus for automatic abnormal events monitor in operating plants 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G21C-017/00
출원번호 US-0578558 (1975-05-19)
발명자 / 주소
  • Pekrul Paul J. (Canoga Park CA) Thiele Alfred W. (Woodland Hills CA)
출원인 / 주소
  • Rockwell International Corporation (El Segundo CA 02)
인용정보 피인용 횟수 : 149  인용 특허 : 0

초록 ▼

An apparatus and method for automatically monitoring dynamic signals, such as from vibration sensors, in an operating industrial or other plant to identify abnormal events, draw conclusions as to their severity, and indicate action to be taken, utilizing a computer to control the scanning of one or

대표청구항 ▼

In an operating plant having significant background noise in time dependent fluctuating signals derived from sensors placed at selected points for continually monitoring the operating conditions of system components, a method for scanning in real-time separate signal conditioning channels, one for e

이 특허를 인용한 특허 (149) 인용/피인용 타임라인 분석

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AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

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