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Optical object locator 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/30
출원번호 US-0777011 (1977-03-14)
발명자 / 주소
  • Rossol
  • Lothar
  • Olsztyn
  • Joseph T.
  • Dewar
  • Robert
  • Holland
  • Steve n W.
출원인 / 주소
  • General Motors Corporation
대리인 / 주소
    Hill, Warren D.
인용정보 피인용 횟수 : 67  인용 특허 : 0

초록

In order to determine the position and orientation of an object on a conveyor, two planes of light intersect at a single transverse line on the conveyor surface, the planes of light each being at an acute angle to the conveyor. A linear diode array aligned with the single line of light on the convey

대표청구항

대표청구항이 없습니다.

이 특허를 인용한 특허 (67)

  1. Chmielewski ; Jr. Thomas A. (Southampton Township ; Bucks County PA) Tarzaiski Richard J. (Magnolia Borough ; Camden County NJ), Apparatus and method for determining a dimension of an object.
  2. Ben-Dove Shimshon,ILX ; Fridhendler Michael,ILX ; Lanzet Igal,ILX ; Kuperman Igor,ILX, Apparatus and method for optically measuring an object surface contour.
  3. Grammerstorff Michael (Aidlingen DEX) Pietruschka Hans (Rottenburg DEX), Apparatus for automatic optical property testing.
  4. Gagliano, Jeff, Apparatus for determining measurements of an object utilizing negative imaging.
  5. Gagliano, Jeff, Apparatus for determining measurements of an object utilizing negative imaging.
  6. Rhotert Bernhard (Laggenbeck DE), Apparatus for sorting objects.
  7. Chevillat Pierre (Adliswil CHX) Schindler Hans R. (Langnau CHX), Arrangement for determining the optimum scan angle for printed documents.
  8. Brenke, Manfred; Ihlefeldt, Jurgen; Kopineck, Hermann-Josef; Tappe, Wilhelm, Arrangement for determining the width of rolling mill products.
  9. Caussignac Jean-Marie (Le Perreux sur Marne FRX) Leroy Maurice (Sauteville les Rouen FRX), Article analyzer apparatus by silhouette projection.
  10. Wallace John M. (Kewaunee WI) Pitner Gerald A. (Appleton WI), Article orientation determining apparatus.
  11. Sager James L. (Boulder CO) Schmehl Michael R. (Aurora CO), Automated assembly and packaging system.
  12. Diez, Fernando Martinez; Herman, Keith Alan; Wang, Huijun; Ludewig, Howard W.; Robinson, Mathew Mark, Automated assembly and welding of structures.
  13. Diez, Fernando Martinez; Herman, Keith Alan; Wang, Huijun; Ludewig, Howard W.; Robinson, Mathew Mark, Automated assembly and welding of structures.
  14. Angell Mickey A. (Winston-Salem NC) Cearley Thomas W. (Clemmons NC) Lewis James C. (Albany GA) St. Onge Arthur R. (York PA) Szysh John A. (Mt. Joy PA) White Kenneth W. (Ithaca NY), Automated cargo loading system.
  15. Sager James L. (Boulder CO) Schmehl Michael R. (Aurora CO), Automated system for locating and transferring objects on a conveyor belt.
  16. Klemmer Robert A. (Wheeling IL) Wright Steven F. (Glen Ellyn IL), Component feeder apparatus and method for vision-controlled robotic placement system.
  17. Fyler Donald C. (Cambridge MA) Van Duyne Edward A. (Framingham MA) Kelly Michael G. (Arlington MA), Corner alignment system.
  18. Dörner, Reiner; Pottiez, Joachim, Device and method for aligning the position of plate-shaped parts.
  19. Nakazato Hiroshi (Ohme JPX) Matsumura Takashi (Yokohama JPX) Akamatsu Takahiro (Machida JPX) Fukui Kenji (Kawasaki JPX), Device for positioning a semi-conductor wafer.
  20. Wurz Albert ; Romaine John E. ; Martin David L., Dimensioning system.
  21. Wurz Albert ; Romaine John E. ; Martin David L., Dimensioning system.
  22. Pryor Timothy R. (Ontario CAX), Electro-optical inspection.
  23. Pryor Timothy R. (Tecumseh CAX), Electro-optical inspection.
  24. Smith Paul R. (Ortonville MI), Electro-optical method and apparatus for measuring the fit of adjacent surfaces.
  25. Harding Kevin G. (Ann Arbor MI), High accuracy structured light profiler.
  26. Blessing Hubert (Dallas TX) Croyle Gene F. (Plano TX), High resolution optical fiber array and article position determining system.
  27. Kara Gerald F. (Gravette AR) Sawyer William H. (Chester Springs PA), Inspection and measuring apparatus and method.
  28. Corby ; Jr. Nelson R. (Scotia NY), Integrated lighting and camera system.
  29. Bartko Robert J. (Shelby Township MI) Rosen Jack H. (Farmington Hills MI), Intelligent sensor method and apparatus for an optical wheel alignment machine.
  30. Bartko Robert J. ; Rosen Jack H., Intelligent sensor method and apparatus for an optical wheel alignment machine.
  31. Nosler John C. (2587 Floral Hill Dr. Eugene OR 97403), Linear array signal processing circuitry for locating the midpoint of a source of light.
  32. Iadipaolo Rene M. (Southfield MI) Tkaczyk Richard J. (Plymouth MI), Machine vision method and apparatus.
  33. Mahon,James; Butler,Padraig; Milroy,John; Godden,Kevin; Abdollahi,Mohsen; Conlon,Peter, Machine vision system for measuring heights of items.
  34. Matsumoto Fumio (Tokyo JPX), Method and apparatus for detecting photographic image information.
  35. Lukander Ronald,FIX ITX 02201, Method and apparatus for measuring the dimensions of three-dimensional objects such as chips used in pulp manufacture.
  36. Tradt Hans-Richard (Friedberg DEX) Schillmeier Hans (Kaufbeuern DEX), Method and apparatus for mounting windshields on vehicles.
  37. Ratcliff, Raymond F., Method and apparatus for sharing information using a handheld device.
  38. Semmelrock, Albin; Diener, Bernhard; Beer, Erhard; Heckel, Gerald; Kollmuss, Manuel; Osterhammer, Martin, Method and device for handling individual intermediate layers.
  39. Saison, Philippe; Bruneau, Thomas; Menegazzi, Franck; Clauss, Yves; Desertot, Didier, Method and device for transferring cutouts for packaging boxes.
  40. Day Chia P. (Troy MI) Krause Kenneth W. (Rochester MI) Whitcomb Louis L. (Troy MI) Horn Berthold K. P. (Concord MA), Method and system for automatically determining the position and attitude of an object.
  41. Clark, Bryan Kevin, Method and system for determining dimensions of optically recognizable features.
  42. Nakamura Taizo,JPX, Method and system for measuring an inner diameter of a hole formed in an object.
  43. Kaltenbach, Thomas, Method for the automatic parameterization of measuring systems.
  44. Montone Liber J. (Reading PA) Yokitis Joseph E. (Sinking Spring PA), Methods of and apparatus for measuring surface areas.
  45. Koerner Arthur ; Hanson James, Non-contact method and apparatus for determining camber and caster of a vehicle wheel.
  46. Barry Robert F. (Monroeville PA) Kang Samuel (Monroeville PA), Object locating system.
  47. Tsikos Constantine J. (West Berlin NJ) Rosenfeld Jerome P. (Collingswood Township ; Camden County NJ), Object location apparatus.
  48. Mundy David J. (San Diego CA), Optical probe with overlapping detection fields.
  49. Mundy David J. (San Diego CA), Optical probe with overlapping detection fields.
  50. Moran Raymond D. (Springdale PA), Optical system for determining peripheral characterization and dimensions of a sheet.
  51. Abernathy Frederick H. (Auburndale MA), Pattern recognition and orientation system.
  52. Moran Raymond D. (Springdale PA), Position sensor.
  53. Doemens Guenter (Holzkirchen DEX), Process and an apparatus for automatically recognizing the position of semiconductor elements.
  54. Addleman David A. (Pacific Grove CA) Addleman Lloyd A. (Big Sur CA), Rapid three-dimensional surface digitizer.
  55. Ross Joseph (Salonga NY) Stern Howard (Greenlawn NY), Robot cell safety system.
  56. Kishi Hajimu (Hino JPX) Sakakibara Shinsuke (Komae JPX) Karakama Tatsuo (Hachioji JPX), Robot control system.
  57. Pearce Craig S. (Windsor CAX) Pearce Clayton V. (Windsor MI CAX) Utz Carl (Novi MI), Robotic automobile assembly.
  58. Pryor Timothy R. (Tecumseh CAX), Sensing location of an object with line image projection and rotation.
  59. Nakagawa Yasuo (Yokohama JPX) Makihira Hiroshi (Yokohama JPX) Ikeda Souhei (Hadano JPX) Ezaki Satoru (Hadano JPX) Harada Osamu (Odawara JPX), Shape detecting apparatus.
  60. Chiang, Gilbert; Tremblay, Robert, System and method for determining a displaced substrate with a vision system.
  61. Wilkinson Blair E. (El Toro CA), System for automatically inspecting a flat workpiece for holes.
  62. Hisano Atushi (Nagaokakyo JPX), System for detecting orientation of articles.
  63. Wurz, Albert; Romaine, John E.; Martin, David L., System for dimensioning objects using at least one light beam offset relative to a perpendicular from an object supporting surface.
  64. Yuan Joseph S. (Toronto CAX) MacDonald Richard A. (West Hill CAX) Keung Felix H. N. (Willowdale CAX), Telerobotic tracker.
  65. Rugab David A. (Butler PA) Ortmann Michael E. (Kittanning PA) Thomas Alan E. (Millville NJ), Tracking system.
  66. Carner ; Jr. Don C. (132 Eagle Rock Ave. Channel Islands CA 93035), Umbra/penumbra detector.
  67. Norton-Wayne Leonard (London GB2), Workpiece identification apparatus.
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