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Minutiae pattern matcher 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/00
출원번호 US-0722308 (1976-09-10)
발명자 / 주소
  • Riganati John P. (Yorba Linda CA) Vitols Visvaldis A. (Orange CA)
출원인 / 주소
  • Rockwell International Corporation (El Segundo CA 02)
인용정보 피인용 횟수 : 72  인용 특허 : 2

초록

A system which, in one exemplary embodiment, comprises first means responsive to minutiae of first and second fingerprints for selectively generating a plurality of neighborhood comparison signals indicative of the closeness of match and coordinate displacements between minutiae neighborhoods of the

대표청구항

An automatic minutiae pattern matching system comprising: means responsive to minutiae of first and second patterns for selectively generating a plurality of sets of neighborhood comparison signals representative of the closeness of match and coordinate and orientation displacements between minutiae

이 특허에 인용된 특허 (2)

  1. Jordan Gene M. (Ann Arbor MI) Eisenhardt Robert G. (Ann Arbor MI) Douthat Dean Z. (Ann Arbor MI), Method of classifying fingerprints.
  2. Swonger Claron W. (Elma NY) Ryan Hollis F. (Cheektowaga NY) Stock Robert M. (Severna Park MD) Vossler Charles M. (Williamsville NY), Pattern recognition apparatus.

이 특허를 인용한 특허 (72)

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  35. Ferris Stephen (80 Campbell Ave. Troy NY 12180) Powers Robert L. (37 Mansion Dr. Topsfield MA 01983) Lindh Terry (428 E. Shore Rd. DeLanson NY 12053), Hyperladder fingerprint matcher.
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  70. Russo, Anthony P.; Oreifej, Omar, Systems and methods for point-based image alignment.
  71. Yang, Bian; Li, Guoqiang, Transformed representation for fingerprint data with high recognition accuracy.
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