$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Monolithic CMOS digital temperature measurement circuit 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01K-007/00
출원번호 US-0889492 (1978-03-22)
발명자 / 주소
  • Lipp Robert J. (15881 Rose Ave. Los Gatos CA 95030)
인용정보 피인용 횟수 : 55  인용 특허 : 1

초록

A monolithic integrated complementary metal oxide semiconductor (CMOS) circuit senses internal junction temperature and converts it to a binary coded decimal output signal. The circuit compares a temperature dependent junction voltage with a bandgap reference voltage controlled by a very stable ampl

대표청구항

A single low power monolithic silicon chip integrated circuit for continuously sensing temperature phenomena and for providing a digital output corresponding to sensed temperature, said circuit including in electrical interconnection: temperature sensor transistor means in said chip for providing an

이 특허에 인용된 특허 (1)

  1. Ahmed ; Adel Abdel Aziz, Self-starting amplifier circuit.

이 특허를 인용한 특허 (55)

  1. Gauthier, Claude; Amick, Brian; Gold, Spencer; Trivedi, Pradeep; Ooi, Lynn, Adjustment and calibration system for post-fabrication treatment of on-chip temperature sensor.
  2. Aslan,Mehmet; Ng,Chungwai Benedict; Tam,Eric; Ren,Qing Feng; D'Aquino,Dan, Apparatus and method for calibration of a temperature sensor.
  3. Can Sumer, Bandgap reference voltage circuit with PTAT current source.
  4. Aslan,Mehmet; Branch,John W., Beta variation cancellation in temperature sensors.
  5. Okayasu, Toshiyuki, CMOS integrated circuit and timing signal generator using same.
  6. Toshiyuki Okayasu JP, CMOS integrated circuit and timing signal generator using same.
  7. Gold, Spencer; Gauthier, Claude R.; House, Kenneth; Zarrineh, Kamran, Controller for monitoring temperature.
  8. Currie Thomas P. (St. Paul MN) Zbinden Terry B. (Maple Grove MN), Cooling system monitor assembly and method.
  9. Mukherjee, Sugato, DRAM temperature management system.
  10. Mukherjee, Sugato, DRAM temperature measurement system.
  11. Mukherjee,Sugato, DRAM temperature measurement system.
  12. Pinkham Clinton L. (New Hartford NY), Digital thermometer.
  13. Hegyi Dennis J. (1512 Morton Ave. Ann Arbor MI 48104), Diode thermometer.
  14. Mukherjee, Sugato, Dram temperature measurement system.
  15. Kinsley, Tom, Electronic apparatus having IC temperature control.
  16. Kinsley, Tom, Electronic apparatus having IC temperature control.
  17. Bowden, Scott J.; Douglas, Jonathan P., Failsafe mechanism for preventing an integrated circuit from overheating.
  18. Gauthier, Claude; Gold, Spencer; Liu, Dean; Zarrineh, Kamran; Amick, Brian; Trivedi, Pradeep, Increasing power supply noise rejection using linear voltage regulators in an on-chip temperature sensor.
  19. Cummins, Timothy, Integrated CMOS porous sensor.
  20. Cummins, Timothy, Integrated CMOS porous sensor having sensor electrodes formed with the interconnect conductors of a MOS circuit.
  21. Cummins, Timothy, Integrated MOS gas or humidity sensor having a wireless transceiver.
  22. Cheng, Zhibin; Kaplun, Aleksandr, Integrated circuit temperature measurement methods and apparatuses.
  23. Tesi,Davide; Zampieri,Ugo, Integrated digital temperature sensor.
  24. Gold, Spencer M.; Gauthier, Claude R.; Amick, Brian W.; Zarrineh, Kamran; Boyle, Steven R., Integrated temperature sensor.
  25. Garavan,Patrick J., Method and circuit for the provision of accurately scaled currents.
  26. Van Phan,Nghia; Rosno,Patrick Lee; Strom,James David, Method and reference circuit for bias current switching for implementing an integrated temperature sensor.
  27. Gold,Spencer M.; Gauthier,Claude R.; Boyle,Steven R.; House,Kenneth A.; Siegel,Joseph, Method and system for monitoring and profiling an integrated circuit die temperature.
  28. Asam, Wilhelm; Fazekas, Josef; Martin, Andreas; Smeets, David; Hagen, Jochen Von, Method for detecting the reliability of integrated semiconductor components at high temperatures.
  29. Hsieh, Steven H. C.; Chan, Siuki, Methods and circuits for measuring the thermal resistance of a packaged IC.
  30. Jeong, Chun-Seok; Kim, Yong-Ki, On die thermal sensor of semiconductor memory device.
  31. Piorun, Michael D.; Volk, Andrew; Senthilkumar, Chinnugounder; Fulton, Robert; Donofrio, David D.; Simoni, Steve S., On die voltage regulator.
  32. Piorun,Michael D.; Volk,Andrew; Senthilkumar,Chinnugounder; Fulton,Robert; Donofrio,David D.; Simoni,Steve S., On die voltage regulator.
  33. Gauthier, Claude R.; Yee, Gin S., On-die thermal monitoring technique.
  34. Kinsley, Tom, Power sink for IC temperature control.
  35. Shi, Lei, Power supply circuit for motherboard.
  36. Bakker,Gregory, Power-up and power-down circuit for system-on-a-chip integrated circuit.
  37. Fiscus, Timothy E., Proportional to temperature voltage generator.
  38. Fiscus, Timothy E., Proportional to temperature voltage generator.
  39. Gauthier, Claude; Amick, Brian; Gold, Spencer; Liu, Dean; Zarrineh, Kamran; Trivedi, Pradeep, Quantifying a difference between nodal voltages.
  40. Cummins, Timothy, Sensor device having MOS circuits, a gas or humidity sensor and a temperature sensor.
  41. Peng, Yung-Chow; Chang, Ching-Ho; Huang, Jui-Cheng, Small area high performance cell-based thermal diode.
  42. Gardner, Marco A.; Doorenbos, Jerry L., Systems and methods for PWM clocking in a temperature measurement circuit.
  43. Kaneko Noboru (Tokyo JPX), Temperature detecting device.
  44. Namiki Masayuki (Tokyo JPX) Kamiya Masaaki (Tokyo JPX) Kojima Yoshikazu (Tokyo JPX) Tanaka Kojiro (Tokyo JPX), Temperature detecting device.
  45. Wu, Patrick Bian; Wang, Xingyi; Zhou, Lingli; Han, Fuqiang; Qi, Shehu; Luo, Yuanming, Temperature measurement and calibration circuit, passive radio frequency identification tag and method for measuring temperature.
  46. Faour, Fouad A.; Greiner, Brandon Gregory, Temperature measurement of an integrated circuit.
  47. Liepold, Carl F; Aykroyd, Craig M; McLin, Jonathan Daniel, Temperature sensing circuit.
  48. Curry Stephen M. ; Bolan Michael L. ; Deierling Kevin E. ; Payne ; II William Lee ; Kurkowski Hal, Temperature sensing systems and methods.
  49. Schrödinger, Karl; Stimma, Jaro Robert, Temperature sensor and method for operating a temperature sensor.
  50. Sohn, Young Chul, Temperature sensor and semiconductor memory device using the same.
  51. Mizuta, Masaru, Temperature sensor circuit having trimming function.
  52. Lee Thomas H. ; Johnson Mark G. ; Crowley Matthew P., Temperature sensor integral with microprocessor and methods of using same.
  53. Yoshida, Munehiro; Boerstler, David William, Thermal sensing circuit using bandgap voltage reference generators without trimming circuitry.
  54. Aslan, Mehmet; Henderson, Richard; Ng, Chung Wai Benedict, Three-terminal dual-diode system for fully differential remote temperature sensors.
  55. Gold, Spencer M.; House, Kenneth; Gauthier, Claude R., Two-pin thermal sensor calibration interface.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로