$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Apparatus for detecting the position of a probe relative to a workpiece 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-007/14
  • G08B-023/00
  • G05D-000/00
출원번호 US-0259257 (1981-04-30)
발명자 / 주소
  • Juengel Richard O. (Romeo MI)
출원인 / 주소
  • The Valeron Corporation (Troy MI 02)
인용정보 피인용 횟수 : 93  인용 특허 : 2

초록

Apparatus for detecting the position of a probe relative to a workpiece, for example probe contact with the workpiece, is disclosed. The apparatus includes a transducer for converting probe contact to an electrical signal and a plurality of light emitting semiconductors for wirelessly transmitting a

대표청구항

Apparatus for detecting probe contact with a workpiece comprising: a probe contact surface; oscillator means operative to generate an alternating current signal at an output thereof; amplifier means having an input coupled to the oscillator means output, operative to provide an excitation signal pro

이 특허에 인용된 특허 (2)

  1. Gomi Yoshifumi (Shiojiri JPX) Ikeda Yoshito (Shiojiri JPX), Printing head for a wire-type dot printer.
  2. McMurtry David R. (Bristol GB2), Probes.

이 특허를 인용한 특허 (93)

  1. Dekrone Stephen A. (Chesapeake VA), AC transducers, methods and systems.
  2. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  3. Driggers John M. (Pittsburgh PA), Brazing apparatus having a dual function heating and eddy current probe coil.
  4. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  5. Dunklee, John, Chuck for holding a device under test.
  6. Dunklee, John, Chuck for holding a device under test.
  7. Dunklee, John, Chuck for holding a device under test.
  8. Dunklee,John, Chuck for holding a device under test.
  9. Dunklee,John, Chuck for holding a device under test.
  10. Dunklee,John, Chuck for holding a device under test.
  11. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  12. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  13. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  14. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  15. Tanaka Yuzuru (Osaka JPX), Contact detector for a machine tool.
  16. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  17. Strid, Eric; Campbell, Richard, Differential signal probing system.
  18. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  19. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  20. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  21. McCann,Peter R.; Martin,John T., Fiber optic wafer probe.
  22. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  23. Juengel Richard O. (Romeo MI), Industrial identification transponder.
  24. McFadden,Bruce, Localizing a temperature of a device for testing.
  25. Matthew A Stoodley GB, Locating arm for a probe on a coordinate positioning machine.
  26. Clark Earl S. (Coventry RI), Measurement system with remote display.
  27. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  28. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  29. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  30. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  31. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  32. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  33. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  34. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  35. Juengel Richard O. (Romeo MI), Method and apparatus for performing workpiece inspection with a probe.
  36. Juengel Richard O. (Romeo MI), Method and apparatus for testing the operability of a probe.
  37. Lin, Tung-Lung; Liu, Chih-Tsung; Chan, Sen-Chih, Method for phase matching by detecting magnetic flux.
  38. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  39. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  40. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  41. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  42. Juengel Richard O. (Romeo MI), Optical data system having flash/receiver head for energizing/receiving information from a battery operated transmitter.
  43. Manns Paul A. (Rochester MI) Juengel Richard O. (Romeo MI), Probe.
  44. Cusack, Robert F., Probe adjustment tool and method of using same.
  45. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  46. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  47. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  48. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  49. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  50. Schwindt,Randy, Probe holder for testing of a test device.
  51. Nordgren, Greg; Dunklee, John, Probe station.
  52. Nordgren, Greg; Dunklee, John, Probe station.
  53. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  54. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  55. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  56. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  57. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  58. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  59. Lesher, Timothy E., Probe testing structure.
  60. Cusack Robert F. (Grosse Pointe MI), Probe with stylus adjustment.
  61. Juengel Richard O. (Romeo MI), Prober with optical transmission scheme.
  62. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  63. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  64. Inaba Hajimu (Tokyo JPX) Sakakibara Shinsuke (Tokyo JPX) Nihei Ryo (Tokyo JPX), Robot control system.
  65. Inaba, Hajimu; Sakakibara, Shinsuke; Nihei, Ryo, Robot control system.
  66. Wise James A. (1055 Goodman Ranch Rd. Garberville CA 95440), Robotic sensor.
  67. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  68. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  69. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  70. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  71. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  72. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  73. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  74. Dunklee,John, Switched suspended conductor and connection.
  75. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  76. Andrews, Peter; Hess, David, System for testing semiconductors.
  77. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  78. Campbell, Richard, Test structure and probe for differential signals.
  79. Campbell,Richard, Test structure and probe for differential signals.
  80. Rumbaugh,Scott, Thermal optical chuck.
  81. Cusack Robert F. (Grosse Pointe MI), Touch probe.
  82. Kroetsch Charles F. (Warren MI), Touch probe having nonconductive contact carriers.
  83. Kroetsch, Charles F., Touch probe having nonconductive contact carriers.
  84. Juengel Richard O. (Romeo MI), Touch probe using microwave transmission.
  85. Shepard G. Dudley (Exeter NH) Smith I. Stuart (Chelmsford MA) Christensen Stephen R. (Nashua NH) Lu Richard (Lowell MA), Vibratory interference sensor.
  86. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  87. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  88. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  89. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  90. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  91. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  92. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
  93. Campbell, Richard, Wideband active-passive differential signal probe.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로