[특허]Process control system prover

[미국특허] Process control system prover 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G06F-011/00 G06F-015/20
출원번호	US-0222280 (1981-01-02)
발명자 / 주소	Tivy Vincent V. (Chagrin Falls OH)
출원인 / 주소	Loveland Controls Company (Loveland CO 02)
인용정보	피인용 횟수 : 15 인용 특허 : 10

초록 ▼

An automated process control prover system for (1) performing tasks, including tests, at the circuit loop termination on a termination base located between interconnected control room instrumentation and field equipment, (2) for performing tasks, including tests, to the circuit loop terminations at the control room instrumentation and field equipment locations and (3) for calibration of the field equipment. The prover system includes an improved termination base for allowing selective access to a predetermined number of the circuit loop terminations, a multiplexer for providing the selective access to one of the circuit loop terminations, and a computer for performing the tasks at the termination base. The prover system further includes a portable calibrator for interconnection to the circuit loop terminations at the control room instrumentation and at the field equipment locations which provides a calibration condition to a selected piece of field equipment, wire identification and two-way communication with the multiplexer located at the termination base.

대표청구항 ▼

A prover system for a plurality of control room instruments, a plurality of remotely located field equipment, said field equipment including measuring devices, actuators, and controllers, and a termination base; each of said field equipment being connected over a loop to terminals at said termination base, each of said control room instruments being connected over a loop to terminals at said termination base, said field equipment terminals and said control room instrumentation terminals being interconnected with each other at said termination base so that an electrical circuit is established between a given piece of field equipment and an associated control room instrument, said prover system comprising: means connected to a predetermined number of control room instrumentation and field equipment loops at said termination base for outputting connections to the control room instrumentation terminals and to the field equipment terminals of each of said predetermined number of loops, first means removably mating said output means for providing an electrical connection for each of said predetermined number of loops so that the control room instrumentation terminals and the field equipment terminals are interconnected to preserve said electrical circuits when said first mating means engages said output means, said electrical circuits being disconnected when said first mating means is removed, second means removably mating said output means for extending the electrical connections from said control room instrumentation terminals and said field equipment terminals for each of said predetermined number of loops when said second mating means engages said output means, means receptive of said extended electrical connections for selectively providing access to one of said predetermined number of control room instrumentation and field equipment loops, means interconnected with said providing means for selectively applying at least one measurement test to said one loop, and means interconnected with said providing means and said applying means for controlling said selective provision of access to said one loop and for controlling the application of said at least one measurement test.

이 특허에 인용된 특허 (10) 인용/피인용 타임라인 분석

Pike Harold L. (R.R. No. 2 ; Box 134 Castle Rock CO 80104) Thomas G. Lamar (368 W. Powers Ave. ; Apt. 201 Littleton CO 80120) Ketchum Ronald L. (3555 S. Pennsylvania Englewood CO 80110) Evans John F., Automatic electronic test equipment and method.
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Tawfik David A. (Ft. Lee NJ) Bollard Robert (Wayne NJ) Porawski Donald J. (Cedar Grove NJ), Digital control system including built in test equipment.
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Cleversey Gerald W. (Topsfield MA) Duncan Robert J. (Magnolia MA) Medidge ; Jr. George H. (North Andover MA) Fleming Jean A. (South Hamilton MA), Electrical component testing system for component insertion machine.
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Rockwell Kenneth N. (Yorba Linda CA), High speed parallel scanning means for testing or monitoring the assembly of multiwire harnesses.
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Lillig John E. (Diamond Bar CA), Measuring system incorporating self-testing probe circuit and method for checking signal levels at test points within th.
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Favin David L. (Little Silver NJ) Lynn Peter F. (Little Silver NJ) Snyder Paul J. (Linden NJ), Multitone frequency response and envelope delay distortion tests.
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Niemaszyk ; Casimer ; Rothenberg ; Peter, Portable circuit tester.
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Masters Harvey M. (Ellicott City MD), Programmable test point selector circuit.
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Borrelli Ronald N. (Moraga CA) Raymond Douglas W. (Berkeley CA), Programmable tester.
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Lowell William P. (Shoreview MN) Jagunich Douglas M. (New Brighton MN), Remote controlled test interface unit.
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이 특허를 인용한 특허 (15) 인용/피인용 타임라인 분석

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Warrior Jogesh (Shoreview MN), Dual master implied token communication system.
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Brown Gregory C. (Minnetonka MN) Cucci Gerald R. (Minneapolis MN), Frequency feedback on a current loop of a current-to-pressure converter.
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Goetzinger Charles E. (Bloomington MN) Borgeson Dale W. (Minneapolis MN), Low power process measurement transmitter.
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Larry K. Brown ; Brent H. Larson ; Harry A. Burns, Maintenance interface device for a use in a process control network.
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Littrell,Nathan Bowman, Methods and apparatus for providing alarm notification.
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Chan Wai-Yip T. (Hsin Chu City TWX), Multiplexing communication card and scanning method for run-in testing.
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Ives,Fred H.; Platt,David L., Portable calibration unit for test equipment.
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Huisenga,Garrie; Longsdorf,Randy, Process device with loop override.
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Huisenga,Garrie D.; Longsdorf,Randy J., Process device with quiescent current diagnostics.
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Wehrs, David L.; LeCuyer, Gregory J.; Lo, Jessica; McCoy, Steven J.; Westfield, Brian L., Process variable transmitter with two-wire process control loop diagnostics.
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Wang, Rongtai, Sigma-delta analog to digital converter for capacitive pressure sensor and process transmitter.
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Adachi, Toshiaki, Test apparatus.
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IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

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[미국특허] Process control system prover 원문보기

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[미국특허] Process control system prover 원문보기

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이 특허에 인용된 특허 (10) 인용/피인용 타임라인 분석

이 특허를 인용한 특허 (15) 인용/피인용 타임라인 분석

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