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An optical measuring apparatus for measuring force or pressure, having at least one light source, at least one optical fiber for passing light from and to a sensor, and one detector system. The sensor includes a material having pressure- and force-dependent photo luminescence properties, the signal

An optical measuring apparatus for measuring force or pressure, having at least one light source, at least one optical fiber for passing light from and to a sensor, and one detector system. The sensor includes a material having pressure- and force-dependent photo luminescence properties, the signal received in the detector system being dependent on the pressure or the force applied to the sensor.

대표청구항 ▼

1. An optical measuring apparatus for measuring a force, comprising at least one light source, an optical fiber system comprising at least one optical fiber for conducting at least one frequency of light from and to a sensing means, and a detector system, wherein said sensing means comprises a mater

1. An optical measuring apparatus for measuring a force, comprising at least one light source, an optical fiber system comprising at least one optical fiber for conducting at least one frequency of light from and to a sensing means, and a detector system, wherein said sensing means comprises a material having force-dependent photo-luminescent properties, such that a wavelength shift of the entire spectrum of the emitted photo-luminescent light from said sensing means is produced within at least two different wavelength ranges as a function of the force applied to said sensing means, said optical fiber system directing said photo-luminescent light from said sensing means to said detector system, and said detector system including means for detecting said photo-luminescent light within said at least two different wavelength ranges. 2. An optical measuring apparatus according to claim 1, wherein the detector system includes means for detecting light, for example excitation light from the said light source, reflected from the said sensing means. 3. An optical measuring apparatus according to claim 1, wherein said at least one light source comprises a lightemitting diode. 4. An optical measuring apparatus according to claim 1, wherein said at least one light source comprises a Schottky diode. 5. An optical measuring apparatus according to claim 1, wherein said at least one light source comprises a semiconductor laser. 6. An optical measuring apparatus according to claim 1, wherein said detector system includes at least two photo-detectors for receiving said photo-luminescent light from said sensing means. 7. An optical measuring apparatus according to claim 6, wherein said photo-detectors have non-identical spectral responses. 8. An optical measuring apparatus according to claim 6, wherein at least one of said photo-detectors is provided with an optical filter. 9. An optical measuring apparatus according to claim 6, wherein said optical fiber system is arranged to direct photo-luminescent light directly towards the photo-detectors. 10. An optical measuring apparatus according to claim 6, wherein optical lens means is arranged to focus optical signals from said optical fiber system on to said photo-detectors. 11. An optical measuring apparatus according to claim 6, wherein a partially transparent mirror is positioned so that one of said photo-detectors receives optical signals from said optical fiber system which pass through said mirror and the other of said photo-detectors receives optical signals from said optical fiber system which are reflected from said mirror. 12. An optical measuring apparatus according to claim 6, wherein interference means is provided for dividing said photo-luminescent light from said optical fiber system into partial signals within different wavelength ranges, the different partial signals being directed towards different ones of said photo-detectors. 13. An optical measuring apparatus according to claim 6, wherein said optical fiber system has at least two optical fiber end portions facing towards said detector system, each of said end portions being arranged adjacent a different one of said photo-detectors. 14. An optical measuring apparatus according to claim 1, wherein said detector system comprises a detector in the form of a demultiplexed structure having p-n junctions. 15. An optical measuring apparatus according to claim 6, wherein electrical signals from said photo-detectors are subsequently processed in function-generating means. 16. An optical measuring apparatus according to claim 15, wherein said function-generating means comprises a quotient-forming means. 17. An optical measuring apparatus according to claim 1, wherein said sensing means comprises a first material intended to be subjected to the force to be measured, and a second material. 18. An optical measuring apparatus according to claim 17, wherein said first material has different light absorption properties from said second material. 19. An optical measuring apparatus according to claim 17, wherein said first material has different luminescence properties from said second material. 20. An optical measuring apparatus according to claim 17, wherein two light sources are provided which are arranged to transmit light, along a common portion of said optical fiber system, to said sensing means, one of said first and second materials serving as an optical filter in the ray path to the other of the said first and second materials to enable light, emanating from said two light sources, to be absorbed to a different extent in each of said first and second materials. 21. An optical measuring apparatus according to claim 6, wherein one of said photo-detectors has a transmission response which is substantially linear relative to the photon-energy of the photo-luminescent light detected thereby. 22. An optical measuring apparatus according to claim 6, wherein one of said photo-detectors is provided with an optical filter, said one photo-detector and said optical filter having a transmission response which is substantially linear relative to the photon energy of the photo-luminescent light detected thereby. 23. An optical measuring apparatus according to claim 1, wherein an optical filter is arranged relative to said sensing means so that the photo-luminescent light emitted from said sensing means is arranged to pass through said optical filter, said optical filter having a transmission response which is temperature-dependent in at least substantially the same manner as that of said sensing means. 24. An optical measuring apparatus according to claim 23, wherein said sensing means comprises a first material which is the same material as that of said optical filter. 25. An optical measuring apparatus according to claim 23, wherein said at least one frequency of light comprises a first frequency and a second frequency and wherein there is provided means for transmitting said second frequency of light through said sensing means, said second frequency of light being transparent to said second frequency of light which is intended to be used for compensation of measuring errors. 26. An optical measuring apparatus according to claim 1, wherein said sensing means comprises at least one semiconductor material. 27. An optical measuring apparatus according to claim 26, wherein said at least one semiconductor material is selected from the group consisting of AlP, AlAs, GaP, GaAs, InP, InAs, In 1-x Al x P, In 1-x Ga x P, Ga 1-x Al x P, In 1-x Al x As, In 1-x Ga x As, Ga 1-x Al x As, InAs 1-y P y, GaAs 1-y P y, x and y being between 0 and 1, ZnTe, ZnSe, ZnS, ZnO, CdTe, CdSe and CdS. 28. An optical measuring apparatus according to claim 26, wherein said at least one semiconductor material comprises GaP doped with Zn and O 2 . 29. An optical measuring apparatus according to claim 26, wherein said at least one semiconductor material comprises GaP doped with Ce and O 2 . 30. An optical measuring apparatus according to claim 26, wherein said at least one semiconductor material comprises GaP doped with N 2 . 31. An optical measuring apparatus according to claim 26, wherein said at least one semiconductor material comprises ZnSe doped with Cu. 32. An optical measuring apparatus according to claim 26, wherein said at least one semiconductor material comprises ZnSe doped with Mn. 33. An optical measuring apparatus according to claim 26, wherein said at least one semiconductor material comprises Al x Ga 1-x As doped with Ge. 34. An optical measuring apparatus according to claim 26, wherein said at least one semiconductor material comprises Al x Ga 1-x As doped with Si.