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Rotatable inspection table 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • F28F-005/00
출원번호 US-0383337 (1982-05-28)
발명자 / 주소
  • Demand Erhart E. (Boston MA)
출원인 / 주소
  • Temptronic Corporation (Newton MA 02)
인용정보 피인용 횟수 : 73  인용 특허 : 3

초록

An improved device for supporting and holding an object in place under temperature controlled conditions is described. The device comprises a shaft mounted for rotation about a rotation axis, and a top plate coupled to and rotatable with the shaft. The top plate comprises a top substantially planar

대표청구항

A device for supporting and holding an object in place, said device comprising, in combination: a shaft mounted for rotation about a rotation axis; a top plate coupled to and rotatable with said shaft and comprising a top substantially planar surface disposed normally to said axis, a bottom surface

이 특허에 인용된 특허 (3)

  1. Swiatosz Edmund (Maitland FL), Integrated circuit temperature gradient and moisture regulator.
  2. Jones Addison B. (La Mirada CA) Fewer William R. (West Covina CA), Method and apparatus for thermally stabilizing workpieces.
  3. daCosta Harry (Paradise Valley AZ) Howerton Hugh K. (Falls Church VA) Hughes William E. (Annandale VA) Monk Gaines W. (Alexandria VA), Workpiece holder.

이 특허를 인용한 특허 (73)

  1. Vazzoler, Michele, Apparatus and method of testing a substrate using a supporting nest and testing probes.
  2. Pedersen Bjorn O. (Chelmsford MA) Jost Jonathan A. (Rockport MA), Apparatus for controlling thermal transfer in a cyclic vacuum processing system.
  3. Dunklee, John, Chuck for holding a device under test.
  4. Dunklee, John, Chuck for holding a device under test.
  5. Dunklee, John, Chuck for holding a device under test.
  6. Dunklee,John, Chuck for holding a device under test.
  7. Dunklee,John, Chuck for holding a device under test.
  8. Dunklee,John, Chuck for holding a device under test.
  9. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  10. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  11. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  12. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  13. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  14. Lofy, John, Climate controlled seating assembly with sensors.
  15. Lofy, John, Condensation and humidity sensors for thermoelectric devices.
  16. Lofy, John D., Condensation and humidity sensors for thermoelectric devices.
  17. Brykalski, Michael J.; Terech, John; Petrovski, Dusko, Environmentally-conditioned bed.
  18. Brykalski, Michael J.; Terech, John; Petrovski, Dusko, Environmentally-conditioned bed.
  19. Ogle Daniel James, Flip fixture for assembling components to a heat sink.
  20. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  21. Dunklee,John; Norgden,Greg; Cowan,C. Eugene, Guarded tub enclosure.
  22. Koplow, Jeffrey P., Heat transfer assemblies, systems, and methods for conditioning a medium.
  23. Petrovski, Dusko, Heating and cooling systems for seating assemblies.
  24. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  25. McFadden,Bruce, Localizing a temperature of a device for testing.
  26. Lofy, John; Walsh, Ryan, Low-profile blowers and methods.
  27. Turner Norman L. (Gloucester MA), Method and apparatus for controlling thermal transfer in a cyclic vacuum processing system.
  28. Turner Norman L. (Gloucester MA), Method and apparatus for controlling thermal transfer in a cyclic vacuum processing system.
  29. Petrovski, Dusko; Zheng, Sihai; Maass, Michael, Method and system for controlling an operation of a thermoelectric device.
  30. Brykalski, Michael; Marquette, David, Moisture abatement in heating operation of climate controlled systems.
  31. Schaller, Jason; Vopat, Robert, Multi-cell rotary end effector mechanism with slip ring.
  32. Harris,Daniel L.; McCann,Peter R., Optical testing device.
  33. Kojima Hiroshi,JPX ; Tahara Yoshifumi,JPX ; Arai Izumi,JPX, Plasma processing method.
  34. Nordgren, Greg; Dunklee, John, Probe station.
  35. Nordgren, Greg; Dunklee, John, Probe station.
  36. Schwindt Randy (Portland OR), Probe station having conductive coating added to thermal chuck insulator.
  37. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  38. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  39. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  40. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  41. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  42. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  43. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  44. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  45. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  46. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  47. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  48. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  49. Lesher, Timothy E., Probe testing structure.
  50. Lesher,Timothy E., Probe testing structure.
  51. Dhindsa Rajinder, Solid state temperature controlled substrate holder.
  52. Dunklee,John, Switched suspended conductor and connection.
  53. Dunklee,John, Switched suspended conductor and connection.
  54. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  55. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  56. Andrews, Peter; Hess, David, System for testing semiconductors.
  57. Costello Simon ; Ryan Louis ; Pham Paul ; Motora Mircea, Test apparatus for electronic components.
  58. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  59. Rumbaugh,Scott, Thermal optical chuck.
  60. Rumbaugh,Scott, Thermal optical chuck.
  61. Petrovski, Dusko; Zheng, Sihai; Maass, Michael, Thermoelectric device controls and methods.
  62. Inaba, Masahiko; Clark, Jay Christopher; Comiskey, Brian, Thermoelectric device with internal sensor.
  63. Bell, Lon E., Thermoelectric heat exchanger.
  64. Steinman, Adam Joseph; Bunyak, Kenneth James; Orlando, Bruno Antonio, Vehicle headliner assembly for zonal comfort.
  65. Crow, Perry A.; Haake, Lawrence H., Veterinary table.
  66. Haake, Lawrence Henry; Eckwall, Robert Philip; Horner, Paul Waner, Veterinary table.
  67. Schroer, Joseph; Crow, Perry, Veterinary table assembly with rotatable table.
  68. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  69. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  70. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  71. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  72. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
  73. Hsiao Wen-Ting (San Jose CA) Everling Hubertus A. (San Jose CA), Wafer scale integrated circuit testing chuck.
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