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Programmable signal analyzer 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06F-015/31
출원번호 US-0300254 (1981-09-08)
발명자 / 주소
  • Star Albert A. (Dix Hills NY) Weick John M. (Centerport NY)
출원인 / 주소
  • Grumman Aerospace Corporation (Bethpage NY 02)
인용정보 피인용 횟수 : 28  인용 특허 : 11

초록

A programmable multi-channel signal analyzer capable of automatically evaluating and displaying various parameters of complex analog waveforms is disclosed. A non-real time sampling technique which makes use of the repetitive nature of the input analog signal is utilized to achieve the desired high

대표청구항

A remotely programmable multi-channel signal analyzer for automatically evaluating and displaying selected parameters of analog input signals comprising: a. a plurality of signal channels wherein each of said plurality of signal channels is configured to process automatically one analog input signal

이 특허에 인용된 특허 (11)

  1. Wu ; Paul S. ; Tandon ; Jagdish C., Analog to digital wave shaping system.
  2. Lloyd Raymond A. (Laurel MD) Charles Larry L. (Fallston MD) Susie William F. (Cockeysville MD) Tate ; Jr. Allen W. (Odenton MD) Reeder James R. (Timonium MD), Automatic test system utilizing interchangeable test devices.
  3. Dlugos Daniel F. (Huntington CT) Manduley Flavio M. (Seymour CT), Clocked digital counting system.
  4. Muir ; Andrew Redvers ; Vergato ; Joseph Anthony, Electrical output peak detecting apparatus.
  5. Kristof Paul J. (Fort Atkinson WI) Rose Frederick A. (Fort Atkinson WI), Floating point registers for programmed digital instruments.
  6. Nickel Walter (Walnut Creek CA) Tarczy-Hornoch Zoltan (Berkeley CA), Method of automatically calibrating a microprocessor controlled digital multimeter.
  7. Lloyd Raymond A. (Laurel MD) Eckert Derek B. (Cockeysville MD) Stagg ; Jr. Theodore B. (Jarrettsville MD), Multi-processor automatic test system.
  8. Thomas Paul Dana (Lafayette CA) Burton Dale Leroy (Houston TX), Multifunctional circuit analyzer.
  9. Rose ; Frederick A. ; Nord ; Russell H. ; Lidicker ; Roger E., Programmed calculating input signal module for waveform measuring and analyzing instrument.
  10. Chapman Ronald Howard (Wheaton IL), Sampled signal detector.
  11. Rose ; Frederick A., Waveform measuring instrument with resident programmed processor for controlled waveform display and waveform data redu.

이 특허를 인용한 특허 (28)

  1. Sinderson Richard L. (Pearland TX) Salazar George A. (Friendswood TX) Haddick ; Jr. Clyde M. (Friendship TX) Spahn Caroll J. (Houston TX) Venkatesh Chikkabelarangala N. (Friendswood TX), Adaptive data acquisition multiplexing system and method.
  2. Ficarra, Louis J., Automatic diagnostic for detection of interference in wireless communication system.
  3. Bates Alexander J. (Cambridge MA GB2) Wells John R. (Belmont MA) Shapiro Ronald A. (Edgecomb ME) Tenney Richard L. (Belmont MA), Data logging device with separated data memory unit having internal power source and transducer interface unit for conne.
  4. Hansen Victor L. (Beaverton OR) Balakrishnan Shiv K. (Aloha OR), Digital bandpass oscilloscope.
  5. Inbar Michael (Santa Barbara CA), Digital peak detecting means for a pulse train of electrical signals having a frequency within a known frequency bandwid.
  6. Agoston Agoston (Beaverton OR), Equivalent time pseudorandom sampling system.
  7. Batson Brian E. (Lake Oswego OR), Equivalent time waveform data display.
  8. Gyles Colin (Boxford MA), High-speed precision equivalent time sampling A/D converter and method.
  9. Moore B. J. (Monte Sereno CA) Shoemaker William E. (Monte Sereno CA), Increased resolution logic analyzer using asynchronous sampling.
  10. Hollister Allen L. (Beaverton OR) Reuss Edward L. (Aloha OR), Level detecting waveform sampling system.
  11. Pauly,Andreas; Braunstorfinger,Thomas; Kernchen,Wolfgang; Desquiotz,Ren챕, Measuring device with functional units controllable via a block diagram.
  12. Kerth Donald A. (Austin TX) Sooch Navdeep S. (Austin TX), Method and apparatus for decreasing the interference and noise sensitivity of a ratiometric converter type of circuit.
  13. von der Embse U. A. (Los Angeles CA), Method and apparatus for determining communications link quality and receiver tracking performance.
  14. Jungerman, Roger Lee, Method and apparatus for displaying triggered waveform on an error performance analyzer.
  15. Madsen,Benny; Olgaard,Christian; Andersen,Carsten; Wang,Gary; Andersen,Thomas Toldborg; Petersen,Peter, Method and apparatus for generating reference transmission signal for use in testing communications receivers.
  16. Piety Kenneth R. ; Robinson James C. ; Nelson Thomas E., Parallel processing in a vibration analyzer.
  17. Dobyns, Kenneth P.; Veith, Kristie L., Pre-trigger and post-trigger acquisition for no dead time acquisition system.
  18. Lane Leslie A. (Santa Clara CA) Lybeck Lynn V. (Moss Beach CA) Perloff David S. (Sunnyvale CA) Kumagi Shoji (Santa Clara CA), Process control interface system for managing measurement data.
  19. Messaros David W. (Wallingford PA) Cook Robert E. (West Chester PA) Medykiewicz Ronald A. (West Chester PA), Remote diagnostic tool.
  20. Halbert Joel M. (Tucson AZ) Koen Myron J. (Tucson AZ), Sampling waveform digitizer for dynamic testing of high speed data conversion components.
  21. Williams Donald V. (Balmain AUX) Keeble John B. (Neutral Bay AUX) Oates John D. (Quakers Hill AUX) Campos Alejandro G. (North Rocks AUX), Scientific instrument emulator having a computer and an analog signal interface for real-time signal processing.
  22. Vistica Robert S. (Aloha OR), Signal identification method.
  23. Stubbs David D. (Portland OR), Signal viewing instrumentation control system.
  24. Drinkard, John J.; Cardona, Javier Onses; Dums, Christopher Alan, System and method for waveform processing.
  25. Inbar Michael (Santa Barbara CA), System for measuring selected parameters of electrical signals and method.
  26. Neuder David L. (Colorado Springs CO) Zellmer Joel A. (Colorado Springs CO), Timing or logic state analyzer with automatic qualified inferential marking and post processing of captured trace data.
  27. Barr ; IV John T. (Santa Rosa CA), Vector network analyzer with integral processor.
  28. Cannon Wayne G. (Forestville CA) Neering Michael J. (Santa Rosa CA), Vector network analyzer with integral processor.
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