초록 ▼

A process and apparatus is disclosed for characterizing an ensemble of microparticles and monitoring their response to environmental factors such as chemically and biologically active agents. The apparatus permits the very accurate measurement of light or radiation intensity scattered by the micropa

A process and apparatus is disclosed for characterizing an ensemble of microparticles and monitoring their response to environmental factors such as chemically and biologically active agents. The apparatus permits the very accurate measurement of light or radiation intensity scattered by the microparticles at two well-defined scattering angles with respect to the direction of the incident beam. This is achieved by measuring the scattered radiation at two sets of scattering angles each subtending the two defined angles, processing the detected intensities with a computer means to remove spurious data arising from artifacts in the scattering ensemble, and then functionally averaging the so-processed intensities of each set to yield a mean value for the scattered intensity at each of the two defined angles. Monitoring these two values before and after the addition of an environmental factor permits the calculation of a quantitative ensemble response to said environment. Applications include the quantitative determination of bacterial response to antimicrobials, determination of antigen or antibody concentrations in various fluids, detection of chemical residues in foods and other materials, identification or characterization of unknown particles ensembles by comparison with known scattering values, and detection of bactiurea. Appropriate processes and protocols are disclosed.

대표청구항 ▼

1. A process for characterizing an ensemble of microparticles comprising the steps of: A. preparing a sample of said particles; B. illuminating said particles with a beam of radiation from a radiation source; C. measuring over a fixed period of time the intensities of radiation scattered by sai

1. A process for characterizing an ensemble of microparticles comprising the steps of: A. preparing a sample of said particles; B. illuminating said particles with a beam of radiation from a radiation source; C. measuring over a fixed period of time the intensities of radiation scattered by said particles at two sets of discrete scattering angles with respect to the direction of the incident beam, each set of angles substending a range about each of two given angular directions; D. examining the variations of scattered intensity at each angular location with smaller intervals of such fixed time period and eliminating those values corresponding to large fluctuations from the mean value calculated during said fixed time period; E. calculating the means scattered intensity value at each angular location member of each of the two sets of angular directions; F. forming at least a first mathematical average scattered intensity of each set by combining the individual mean intensities of each element of the set yielding two characterizing values; G. comparing said two characterizing values with two reference values to yield two values characterizing the particle ensemble. 2. A process for identifying an unknown particle ensemble by performing the measurements of claim 1 and comparing the two characterizing values so obtained with a set of known characterizing values to yield a most probable identification. 3. The process of claim 1 where the intensities are measured by detectors lying in a plane. 4. The process of claim 1 where the incident radiation is produced by a laser at visible or infrared optical wavelengths. 5. The process of claim 1 where said first mathematical average scattered intensity V of each set containing n intensity values is of the form ##EQU## where W is a first weighting function of the intensity I i measured at angular location θ i and f i is a first weighting factor associated with said measured value I i . 6. The process of claim 5 where W corresponds to the logarithmic operation. 7. A process for characterizing an ensemble of microparticles comprising the process of claim 5 repeated N additional times using N additional weighting functions W k, k=1 to N, and corresponding weighting factor sets f i to yield N additional V-values for each of the two angle sets; said first and N additional V-values providing a set of 2(N+1) characterizing values. 8. A process for detecting the presence of specific microparticles within a sample comprising the steps of: A. preparing a sample to be tested; B. performing the measurement of claim 1 to yield two values characterizing the sample; C. comparing said values with the expected values corresponding to those of the microparticles to be detected; D. deducing that said microparticles exist in the sample as said sample has produced the two values characteristic of said particles to be detected. 9. The process of claim 8 where the sample is a urine specimen and the microparticles are bacteria or yeasts. 10. A process for measuring the response of a microparticle ensemble to its environment comprising the steps of: A. preparing a sample of said microparticles; B. illuminating said particles with a beam of radiation from a radiation source; C. measuring over a fixed period of time the intensities of radiation scattered by said particles at two sets of discrete scattering angles with respect to the direction of the incident beam, each set of angles subtending a range about each of two given angular directions; D. examining the variations of scattered intensity at each angular location within smaller intervals of such fixed time period and eliminating those values corresponding to large fluctuations from the mean value calculated during said fixed time period; E. calculating the mean scattered intensity value at each angular location member of each of the two sets of angular directions; F. forming a mathematical average scattered intensity of each set by combining the individual mean intensities of each element of the set yielding two characterizing values; G. exposing for a fixed period of time the sample of said microparticles to the test environment; H. repeating steps B through F to yield two averaged values characterizing the microparticle ensemble after exposure to the test environment after the fixed period of time; I. calculating a response of the microparticles to their environment by forming a functional combination of the two values obtained from step F with the two values obtained from step M. 11. The process of claim 10 where the scattered intensities are measured by detectors lying in a plane. 12. A process for measuring the presence of a particular environmental factor capable of changing the two characterizing values of a set of test microparticles comprising the steps of: A. preparing a test sample that could contain the environmental factor sought; B. preparing a control sample known to be free of the environmental factor sought; C. Adding to each of the samples of steps A and B an equal aliquot of microparticles known to be responsive to the environmental factor sought: D. performing the measurement of claim 8 to yield the response of the microparticles to the test and control environments of steps A and B, respectively; E. comparing the responses so obtained to deduce that (i) if the responses are the same, the test sample did not contain a sufficient amount of environmental factor sought to yield a response difference, or (ii) if the responses are different, the test sample did contain a sufficient amount of environmental factor sought to yield a response difference. 13. The process of claim 12 where the environmental factor is a toxicant or chemical agent. 14. The process of claim 12 where the microparticles are bacteria; 15. The process of claim 12 where test sample is prepared from an exudate of a food specimen suspected of containing a chemical agent. 16. The process of claim 10 where the incident radiation is produced by a laser at visible or infrared optical wavelengths. 17. The process of claim 10 where said mathematical average scattered intensity V of each set containing n intensity values is of the form ##EQU## where W is a function of the intensity I i measured at angular location i and f i is a weighting factor associated with said measured value I i . 18. The process of claim 10 where the response, R, of the microparticles to their environment is calculated from an expression of the form ##EQU##R=a(V 10 -V 1t )+b(V 20 -V 2t )+c(m o -m t ), where a, b, and c are constants, V 10 and V 20 are the two characterizing values calculated at time zero before exposure of the said microparticle ensemble to the environment, V 1t and V 2t are the two characterizing values calculated after the ensemble has been exposed to the environment for at time ti, m 0 =(V 20 -V 10 )/ΔΘ, m t =(V 2t -V 1t )/ΔΘ, ΔΘ=Θ 2 -Θ 1, and Θ 1 and Θ 2 are the two angular locations about which the scattered intensities are measured. 19. The process of claim 10 where the microparticles are bacteria and the environment is an antimicrobial. 20. The process of claim 19 whereby the measurements are performed over a range of time intervals such that the two characterizing values of the sample evolve in time to yield the characterizing properties of the microparticles whose detection is sought. 21. The process of claim 20 where the evolving particles are bacteria or yeasts and the sample is blood or urine. 22. The process of claim 10 where the microparticles are antigens and the environment is a solution of specific antibodies. 23. An apparatus to determine two scattering values characteristic of a microparticle ensemble comprising: A. means to produce a collimated beam of radiation; B. means to hold a sample in this beam, said sample containing the microparticle ensemble; C. means to detect and collect radiation at two sets of angular locations each subtending a specific angle measured with respect to the direction of the incident beam; D. means to control the period of time during which scattered radiation is detected by said detectors; E. means to convert said detected values into digital representations and means to store said digital representations; F. means to analyse said stored digital values and suppress those values arising from spurious elements/noise of said microparticles ensemble; G. means to obtain an average scattered intensity value for each angular location of each of said detectors; H. means to calculate a weighted and averaged sum of all stored and processed digital values for each set yielding a single characterizing value for each of said two sets, said two values characteristic of detected, and weighted, and averaged scattered intensities at each of the two said principal angular locations. 24. The apparatus of claim 23 where the collimated beam of radiation is from a laser at visible or infrared wavelengths. 25. The apparatus of claim 23 where the means to collect radiation all lie in a plane. 26. The apparatus of claim 25 where the radiation is vertically polarized with respect to the plane containing said means to collect radiation. 27. The apparatus of claim 23 where the means of D, F, G and H is a computer. 28. The apparatus of claim 23 where the means to collect radiation are placed on a circular arc about the scattering ensemble of particles equidistant therefrom. 29. The apparatus of claim 23 where the collection means have a mask limiting thereby the radiation incident on each. 30. The apparatus of claim 28 where the masks at smaller scattering angles are smaller than those at larger scattering angles. 31. The apparatus of claim 23 wherein the means to collect and detect radiation includes optical fibers. 32. The apparatus of claim 23 wherein the means to collect and detect radiation includes a multianode microchannel array tube. 33. The apparatus of claim 23 wherein the means to collect and detect radiation includes photodiodes. 34. The apparatus of claim 23 wherein the means to collect and detect radiation includes photomultiplier tubes.