$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Apparatus for wet processing 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/306
  • C23F-001/00
  • B44C-001/22
  • C03C-015/00
출원번호 US-0625155 (1984-06-27)
우선권정보 JP-0117364 (1983-06-29)
발명자 / 주소
  • Ohkuma, Yuji
출원인 / 주소
  • Fujitsu Limited
대리인 / 주소
    Armstrong, Nikaido, Marmelstein & Kubovcik
인용정보 피인용 횟수 : 40  인용 특허 : 0

초록

An apparatus and system for wet processing a substrate, which can be used for chemical processing such as etching or washing a semiconductor substrate are disclosed. The apparatus has a processing chamber in which the substrate is wet processed. Processing liquid is injected into the processing cham

대표청구항

1. A wet processing apparatus for a planar substrate, said apparatus comprising a processing chamber, wherein said substrate is processed in said processing chamber, said processing chamber comprising a pedestal and a lid which covers said pedestal, said pedestal and lid defining said processing cha

이 특허를 인용한 특허 (40)

  1. Mller Hans (Steinhausen CHX), Adjustable housing assembly for sliding closure unit.
  2. Speh, Ulrich; Schneider, Jens; Meuris, Marc, Apparatus for treating substrates.
  3. Edward Jay Frankoski ; Jeffrey Donald Jones ; Robert Henry Katyl ; Lyn Braxton Ratcliff, Apparatus, and corresponding method, for chemically etching substrates.
  4. Ichinose Yusaku (Ome JPX) Imamura Hitoshi (Kofu JPX), Automatic wafer mounting device.
  5. Kang Jung-ho,KRX ; Lee Kwang-yul,KRX ; Maeng Dong-cho,KRX ; Hwang Jong-sub,KRX, Chemical bath having a uniform etchant overflow.
  6. Doan, Trung T., Chemical dispensing system for semiconductor wafer processing.
  7. Doan,Trung T., Chemical dispensing system for semiconductor wafer processing.
  8. Talieh Homayoun (San Jose CA), Chemical mechanical polishing apparatus with improved slurry distribution.
  9. Kassir,Salman M., Chuck for supporting wafers with a fluid.
  10. Hsieh, Hsiu-Chu; Horng, Jason; Hsia, Jason, Cleaning system for cleaning ink in a semiconductor wafer.
  11. Luscher, Paul E.; Carducci, James D.; Salimian, Siamak; Welch, Michael D., Configurable single substrate wet-dry integrated cluster cleaner.
  12. Luscher, Paul E; Carducci, James D; Salimian, Siamak, Configurable single substrate wet-dry integrated cluster cleaner.
  13. Matsuoka Fuminori (Kofu JPX), Developing apparatus.
  14. Stevens,Joseph J.; Lubomirsky,Dmitry; Pancham,Ian; Olgado,Donald J. K.; Grunes,Howard E.; Mok,Yeuk Fai Edwin, Electroless deposition apparatus.
  15. Himes Ricky A., Fluid delivery apparatus.
  16. Himes Ricky A., Fluid delivery method.
  17. Robinson Karl M. ; Stroupe Hugh, High-speed planarizing apparatus and method for chemical mechanical planarization of semiconductor wafers.
  18. Karl M. Robinson ; Hugh Stroupe, High-speed planarizing apparatus for chemical-mechanical planarization of semiconductor wafers.
  19. Lamb William E. (Bellaire TX) Kowaleski Jerome L. (Meadows TX) Haikl Vojtech (Houston TX) Bittancourt Alan R. (Rosenberg TX) Daugherty Harvey S. (Richmond TX), Immersion development and rinse machine and process.
  20. Ho, Henry; Pang, Lily L.; Nguyen, Anh N.; Lerner, Alexander N., Integrated bevel clean chamber.
  21. Yueh-liang Liu TW, Machine for etching the edge of a wafer and method of etching the edge of a wafer.
  22. Clark R. Scot ; Baird Stephen S. ; Hoffman Joe G., Manufacture of high precision electronic components with ultra-high purity liquids.
  23. Clark, R. Scot; Baird, Stephen S.; Hoffman, Joe G., Manufacture of high precision electronic components with ultra-high purity liquids.
  24. Doornveld Herman E. (Mettmenstetten CHX), Method and apparatus for applying a layer of photosensitive material to a semiconductor wafer.
  25. Kunze-Concewitz Horst,DEX, Method and device for cleaning and etching individual wafers using wet chemistry.
  26. Kruwinus Hans-Jurgen,DEX ; Kovacs Frederic,DEX, Method for rough-etching a semiconductor surface.
  27. Yates, Donald L., Method of reducing surface contamination in semiconductor wet-processing vessels.
  28. Hsieh, Hsiu-Chu; Horng, Jason; Hsia, Jason, Method of removing ink from a semiconductor wafer.
  29. Kassir, Salman M., Method of spin etching wafers with an alkali solution.
  30. Ritzdorf,Thomas L.; Eudy,Steve L.; Wilson,Gregory J.; McHugh,Paul R.; Weaver,Robert A.; Aegerter,Brian; Dundas,Curt; Peace,Steven L., Methods and apparatus for processing microelectronic workpieces using metrology.
  31. Martin Maynard, Muffle etch injector assembly.
  32. Trinh Tieu T., Nozzle and system for use in wafer cleaning procedures.
  33. Martin, Maynard, Semiconductor processing device.
  34. Martin, Maynard, Semiconductor processing device.
  35. Carlson Robert J. (Brooklyn Park MN) Grimm Michael D. (Minneapolis MN), Silicon wafer photoresist developer.
  36. Tanaka, Katsuhiko, Submerged conveyance structure for photosensitive material.
  37. Liu, Zhi (Lewis); Kashkoush, Ismail; Lee, Hanjoo, Systems and methods for drying a rotating substrate.
  38. 4733665 ; 19880300 ; Palmaz, Thin sheet handling system cross-reference to related applications.
  39. Ries, Kevin Lyall, Washer.
  40. Hung Ching-Chang Alex,SGX ; Fu Ta-Hsing,TWX, Wet processing apparatus.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로