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Planar interconnect for integrated circuits 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B05D-003/06
  • B05D-005/12
  • B44C-001/22
  • G03C-015/00
출원번호 US-0505046 (1983-06-16)
발명자 / 주소
  • Wu Andrew L. (Shrewsbury MA)
출원인 / 주소
  • Digital Equipment Corporation (Maynard MA 02)
인용정보 피인용 횟수 : 48  인용 특허 : 9

초록

An integrated circuit having a plurality of devices on a substrate is disclosed, wherein a plurality of metallization layers, separated by a plurality of insulating layers, are used to interconnect the devices. Each metallization layer is recessed in an upper portion of a corresponding dielectric la

대표청구항

A method of forming a planar conductor-insulator layer on a surface of an integrated circuit chip comprising the steps of: (a) forming an insulating layer on the surface of the integrated circuit chip, (b) forming a recess in the insulating layer, (c) depositing a layer of conductive material on th

이 특허에 인용된 특허 (9)

  1. Gwozdz, Peter S., Method for interconnecting metallic layers.
  2. Nakane Hisashi (Kawasaki JPX) Nakayama Muneo (Tokyo JPX) Hashimoto Akira (Yokohama JPX) Nishimura Toshihiro (Kawasaki JPX), Method for pattern-wise etching of a metallic coating film.
  3. Gleason Robert T. (Burlington VT) Linde Harold G. (Richmond VT), Method of forming an RIE etch barrier by in situ conversion of a silicon containing alkyl polyamide/polyimide.
  4. Shibata Hiroshi (Kanagawa JPX), Pattern forming method.
  5. Maa Jer-shen (Somerset County NJ), Patterning of submicrometer metal silicide structures.
  6. Logan Joseph S. (Poughkeepsie NY) Mauer ; IV John L. (Sherman CT) Rothman Laura B. (Sherman CT) Schwartz Geraldine C. (Poughkeepsie NY) Standley Charles L. (Wappingers Falls NY), Planar multi-level metal process with built-in etch stop.
  7. Zielinski Laura B. (Plantsville CT), Process for forming passivated metal interconnection system with a planar surface.
  8. Bergeron Steven F. (Jericho VT) Duncan Bernard F. (Westford VT), Two step plasma etching.
  9. Stocker Hans J. (Summit NJ), Two-step anisotropic etching process for patterning a layer without penetrating through an underlying thinner layer.

이 특허를 인용한 특허 (48)

  1. Yamazaki Shunpei,JPX ; Mase Akira,JPX ; Hiroki Masaaki,JPX ; Takemura Yasuhiko,JPX ; Zhang Hongyong,JPX ; Uochi Hideki,JPX, Active matrix display device.
  2. Vathulya, Vickram; Sowlati, Tirdad, Combined transistor-capacitor structure in deep sub-micron CMOS for power amplifiers.
  3. Yoshikawa Susumu (Yokohama JPX) Sawada Shizuo (Yokohama JPX), Contact portion of semiconductor integrated circuit device.
  4. Cohen Stephan Alan (Wappingers Falls NY) Edelstein Daniel Charles (New Rochelle NY) Grill Alfred (White Plains NY) Paraszczak Jurij Rostyslav (Pleasantville NY) Patel Vishnubhai Vitthalbhai (Yorktown, Diamond-like carbon for use in VLSI and ULSI interconnect systems.
  5. Cohen Stephan Alan (Wappingers Falls NY) Edelstein Daniel Charles (New Rochelle NY) Grill Alfred (White Plains NY) Paraszczak Jurij Rostyslav (Pleasantville NY) Patel Vishnubhai Vitthalbhai (Yorktown, Diamond-like carbon for use in VLSI and ULSI interconnect systems.
  6. Yerman Alexander J. (Scotia NY) Neugebauer Constantine A. (Schenectady NY), Fabrication of large power semiconductor composite by wafer interconnection of individual devices.
  7. Tang Wen-Hsiang,TWX ; Wang Yi-Fei,TWX ; Hung Chih-Shen,TWX ; Huang Cheng-Hao,TWX, Film scheme to solve high aspect ratio metal etch masking layer selectivity and improve photo I-line PR resolution capability in quarter-micron technology.
  8. Thomas Michael E. (Cupertino CA) Chinn Jeffrey D. (Foster City CA), High performance interconnect system for an integrated circuit.
  9. Sedberry Donald C. (Gwynedd PA), High-density circuit and method of its manufacture.
  10. Sedberry Donald C. (Gwynedd PA), High-density circuit and method of its manufacture.
  11. Volfson David (Worcester MA) Senturia Stephen D. (Boston MA), High-density, multi-level interconnects, flex circuits, and tape for TAB.
  12. Anthofer, Anton; Hubner, Holger, Integrated circuit arrangement with a number of structural elements and method for the production thereof.
  13. Pintchovski Faivel (Austin TX) Tobin Philip J. (Austin TX), Method for making a w/tin contact.
  14. Dennison Charles H. ; Blalock Guy T., Method for making electrical contact with an active area through sub-micron contact openings and a semiconductor device.
  15. Dennison, Charles H.; Blalock, Guy T., Method for making electrical contact with an active area through sub-micron contact openings and a semiconductor device.
  16. Iwase Taira (Kawasaki JPX) Ariizumi Shoji (Tokyo JPX) Masuoka Fujio (Yokohama JPX), Method of manufacturing a read only semiconductor memory device.
  17. Sato Yasuhisa (Isehara JPX) Motoyama Takushi (Kawasaki JPX), Method of manufacturing a semiconductor integrated circuit having an interconnection wire embedded in a protective layer.
  18. Hata William Y., Method of producing stepped wall interconnects and gates.
  19. Higuchi Takayoshi (Sendai JPX), Miniaturization of a contact hole in a semiconductor device.
  20. Ming-Shiou Shieh TW; Hsiao-Sheng Chin TW, Planarization method on a damascene structure.
  21. Smith Gregory C. ; Bonifield Thomas D., Planarized selective tungsten metallization system.
  22. He, Zeng-Yi; Sui, Xiao-Ming; Wang, Jian; Shen, Si-Jie, Power MOSFET device with tungsten spacer in contact hole and method.
  23. Fujii Tetsuo (Toyohashi JPX), Semiconductor device.
  24. Tahara, Iwao; Mihara, Ichiro; Aoki, Yutaka, Semiconductor device.
  25. Matsunaga,Noriaki, Semiconductor device and a method of manufacturing the semiconductor device.
  26. Yamada Masaki,JPX ; Anand Minakshisundaran Balasubramanian,JPX ; Shibata Hideki,JPX, Semiconductor device and method for manufacturing the same.
  27. Lin, Yaojian; Chen, Kang; Fang, Jianmin; Feng, Xia, Semiconductor device and method of forming RDL over contact pad with high alignment tolerance or reduced interconnect pitch.
  28. Aoki, Yutaki; Mihara, Ichiro; Wakabayashi, Takeshi; Watanabe, Katsumi, Semiconductor device having a barrier layer.
  29. Aoki, Yutaka, Semiconductor device having a chip size package including a passive element.
  30. Aoki, Yutaka; Mihara, Ichiro; Wakabayashi, Takeshi; Watanabe, Katsumi, Semiconductor device having a thin-film circuit element provided above an integrated circuit.
  31. Aoki, Yutaka; Mihara, Ichiro; Wakabayashi, Takeshi; Watanabe, Katsumi, Semiconductor device having a thin-film circuit element provided above an integrated circuit.
  32. Satoh Shinichi (Hyogo JPX) Hirayama Makoto (Hyogo JPX) Nagatomo Masao (Hyogo JPX) Ogoh Ikuo (Hyogo JPX) Ohno Yoshikazu (Hyogo JPX) Fujinaga Masato (Hyogo JPX), Semiconductor device having interconnection layers of T-shape cross section.
  33. Matsumoto Hiroshi (Hyogo JPX), Semiconductor device in which wiring layer is formed below bonding pad.
  34. Hayashi Yoshihiro,JPX ; Tanabe Nobuhiro,JPX ; Takeuchi Tsuneo,JPX ; Saito Shinobu,JPX, Semiconductor device with conductive plugs.
  35. Charles H. Dennison, Semiconductor electrical interconnection methods.
  36. Kawata Masato,JPX, Semiconductor memory device having a plurality of wiring layers.
  37. Wu, Cheng-Tsung; Lin, Shin-Cheng; Ho, Yu-Hao; Lin, Wen-Hsin, Semiconductor structure having conductive layer overlapping field oxide.
  38. Neidrich, Jason M.; Barron, Lance W., Spatial light modulator mirror metal having enhanced reflectivity.
  39. Young Peter L. (South Barrington IL) Cech Jay (Elmhurst IL) Li Kin (Lombard IL), Thin-film electrical connections for integrated circuits.
  40. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  41. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  42. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  43. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  44. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  45. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  46. Lin, Mou-Shiung, Top layers of metal for high performance IC's.
  47. Lin,Mou Shiung, Top layers of metal for high performance IC's.
  48. Chen Kun-Cho,TWX ; Jenq Jason,TWX, Wafer structure for securing bonding pads on integrated circuit chips and a method for fabricating the same.
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