$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Method of fabricating a chip interposer 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01R-004/00
출원번호 US-0639988 (1984-08-13)
발명자 / 주소
  • Geldermans Pieter (Poughkeepsie NY) Mathad Gangadhara S. (Poughkeepsie NY)
출원인 / 주소
  • International Business Machines Corporation (Armonk NY 02)
인용정보 피인용 횟수 : 52  인용 특허 : 9

초록

Disclosed is a method of fabricating a multichip interposer comprising an insulating support with thin film fine line metallization on one side thereof. A layer of masking material is adhered to in other side and selective areas of the masking material are removed in a desired pattern to expose area

대표청구항

A method of fabricating an interposer for connecting a plurality of semiconductor chips to a substrate, comprising, in sequence, the steps of: providing an insulating support having a thin film fine line metallization formed on its top surface before the top surface is interrupted by holes interferi

이 특허에 인용된 특허 (9)

  1. Bajorek Christopher H. (Goldens Bridge NY) Chance Dudley A. (Danbury CT) Ho Chung W. (Chappaqua NY), Capacitive chip carrier and multilayer ceramic capacitors.
  2. Honn ; James J. ; Stuby ; Kenneth P., Electrical package for LSI devices and assembly process therefor.
  3. Dougherty William E. (Wappingers Falls NY) Greer Stuart E. (Poughkeepsie NY), Multi-layer dielectric planar structure having an internal conductor pattern characterized with opposite terminations di.
  4. Wolf Stanley (Sunset Beach CA) Atwood Warren C. (Los Angeles CA), Polyimide inter-metal dielectric process.
  5. Johnson Daniel D. (Yorklyn DE) Fritz Herbert L. (Englishtown NJ), Process for forming conductive through-holes through a dielectric layer.
  6. Nair Krishna K. (Binghamton NY) Snyder Keith A. (Vestal NY), Process for making multilayer integrated circuit substrate.
  7. Powell Jimmie L. (Wappingers Falls NY) Standley Charles L. (Hopewell Junction NY) Suierveld John (San Jose CA), Process for the controlled etching of tapered vias in borosilicate glass dielectrics.
  8. Weitze Artur (Munich DT) Sapunarow Michail (Munich DT), Process for the production of a multi-chip wiring arrangement.
  9. Bartlett Charles J. (Madison NJ) Rhodes Ronald J. (South Plainfield NJ) Rust Ray D. (Berkeley Heights NJ), Treating multilayer printed wiring boards.

이 특허를 인용한 특허 (52)

  1. Kazuo Miyajima JP; Shin Hasegawa JP; Yoshiaki Sawaki JP, Bus bar wiring board and method of producing the same.
  2. Alex Waizman IL; Chee-Yee Chung ; Bob Sankman, Chip package and method.
  3. Isaacs Phillip Duane ; Swain Miles Frank ; Mathison Connie Jean, Column grid array or ball grid array pad on via.
  4. Isaacs Phillip Duane ; Swain Miles Frank ; Mathison Connie Jean, Column grid array or ball grid array pad on via.
  5. Burdick, Jr.,William Edward; Rose,James Wilson; Tkaczyk,John Eric; Meirav,Oded; Arenson,Jerome Stephen; Hoffman,David Michael, Electronic packaging and method of making the same.
  6. Pasco Robert W. ; Reddy Srinivasa S. N. ; Vallabhaneni Rao V., Enhanced interconnection to ceramic substrates.
  7. Marrs Robert C., Integrated circuit chip to substrate interconnection.
  8. Marrs Robert C., Integrated circuit chip to substrate interconnection and method.
  9. Choi, A Leam; Lee, Kenny; Yoon, In Sang; Shin, HanGil, Integrated circuit packaging system with interposer interconnections and method of manufacture thereof.
  10. Osaki Takaaki (Tokyo JPX) Matsui Norio (Tokyo JPX) Sasaki Shinichi (Iruma JPX) Egawa Yutaka (Tokyo JPX), Interboard connection terminal and method of manufacturing the same.
  11. Akram Salman, Interconnect for testing semiconductor components and method of fabrication.
  12. Kline, Jerry D., Interposer for improved handling of semiconductor wafers and method of use of same.
  13. Bischoff Peter G. ; Stovall Ross W, Interposer with embedded circuitry and method for using the same to package microelectronic units.
  14. Bolken, Todd O.; Corisis, David J., Interposers having encapsulant fill control features.
  15. Kline, Jerry D., Matched set of integrated circuit chips selected from a multi wafer-interposer.
  16. Leedy, Glenn, Method and system for probing, testing, burn-in, repairing and programming of integrated circuits in a closed environment using a single apparatus.
  17. Kline, Jerry D., Method for constructing a wafer-interposer assembly.
  18. Kar-Roy, Arjun; Racanelli, Marco; Howard, David J., Method for fabricating a backside through-wafer via in a processed wafer and related structure.
  19. Akram,Salman; Farnworth,Warren M.; Wood,Alan G., Method for fabricating semiconductor components by forming conductive members using solder.
  20. Beatty Christopher C. (Ft. Collins CO), Method for forming tungsten structures in a semiconductor.
  21. Halahan, Patrick B., Method for manufacturing a structure comprising a substrate with a cavity and a semiconductor integrated circuit bonded to a contact pad located in the cavity.
  22. Kline, Jerry D., Method for manufacturing a wafer-interposer assembly.
  23. Dong Shin KR; Keon Yang Park KR; Young Hwan Shin KR; Byung Kook Sun KR; Jae Heun Joung KR, Method for manufacturing build-up multi-layer printed circuit board by using yag laser.
  24. Pierce,John L., Method for producing a wafer interposer for use in a wafer interposer assembly.
  25. Hanson David A., Method for reducing via inductance in an electronic assembly and article.
  26. Kline, Jerry D., Method for selecting components for a matched set from a wafer-interposer assembly.
  27. Iadanza, Joseph A., Method of connecting core I/O pins to backside chip I/O pads.
  28. Leedy Glenn J. (1061 E. Mountain Dr. Santa Barbara CA 93108), Method of making a flexible tester surface for testing integrated circuits.
  29. Leedy Glenn J. (1061 E. Mountain Dr. Santa Barbara CA 93108), Method of making and testing an integrated circuit.
  30. Osaka Takaaki (Tokyo JPX) Matsui Norio (Tokyo JPX) Susaki Shinichi (Iruma JPX) Egawa Yutaka (Tokyo JPX), Method of manufacturing an interboard connection terminal.
  31. Miyazawa, Hiroyuki, Method of producing wiring substrate.
  32. Leedy Glenn J. (Santa Barbara CA), Method of repairing an integrated circuit structure.
  33. Leedy Glenn J., Method of repairing defective traces in an integrated circuit structure.
  34. Narasimhan, Swaminathan; Bessho, Koji, Methods and systems for controlling data acquisition system noise.
  35. Juskey ; Jr. Frank J. (Coral Springs FL) Miles Barry M. (Plantation FL) Suppelsa Anthony B. (Coral Springs FL), Pad grid array for receiving a solder bumped chip carrier.
  36. Shen, Hong, Process for fabricating gallium arsenide devices with copper contact layer.
  37. Layher Francis W. (Tuscon AZ) Fulinara Napoleon (San Diego CA), Refurbishing of prior used laminated ceramic packages.
  38. Asai, Shuji; Hidaka, Tadachika; Kurosawa, Naoto; Oikawa, Hirokazu; Niwa, Takaki, Semiconductor apparatus.
  39. Kazuyoshi Furusawa JP, Semiconductor device.
  40. Akram, Salman; Farnworth, Warren M.; Wood, Alan G., Semiconductor package having interconnect with conductive members.
  41. Halahan, Patrick B., Structures having a substrate with a cavity and having an integrated circuit bonded to a contact pad located in the cavity.
  42. Leedy, Glenn, System for probing, testing, burn-in, repairing and programming of integrated circuits.
  43. Anschel Morris (Wappingers Falls NY) Ormond Douglas W. (Wappingers Falls NY) Hayunga Carl P. (Poughkeepsie NY), Thin film metallization process for improved metal to substrate adhesion.
  44. Gregg J. Armezzani ; Kishor V. Desai ; Jeffrey S. Perkins ; John J. Pessarchick, Use of blind vias for soldered interconnections between substrates and printed wiring boards.
  45. Koyama Linda J. (Sunnyvale CA) Thomas Mammen (San Jose CA) Levinson Harry J. (San Jose CA), Via in a planarized dielectric and process for producing same.
  46. Pierce, John L., Wafer interposer assembly.
  47. Kline, Jerry D., Wafer level interposer.
  48. Caletka, David Vincent; Park, Seungbae; Sathe, Sanjeev Balwant, Wafer scale thin film package.
  49. Caletka,David Vincent; Park,Seungbae; Sathe,Sanjeev Balwant, Wafer scale thin film package.
  50. Kline, Jerry D., Wafer-interposer assembly.
  51. Pierce, John L., Wafer-interposer using a ceramic substrate.
  52. Higashiguchi Yutaka,JPX ; Inagaki Mitsuo,JPX ; Totani Makoto,JPX ; Teshima Yasuhiro,JPX ; Iimura Hiroshi,JPX, Wiring substrate and semiconductor device.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로