초록 ▼

The disclosed apparatus provides a point optical radiation source (i.e. point light source), at one or more distant points, the three-dimensional coordinates of which are to be measured relative to a known frame of reference. Each point light source emits light waves of a known wavelength which are

The disclosed apparatus provides a point optical radiation source (i.e. point light source), at one or more distant points, the three-dimensional coordinates of which are to be measured relative to a known frame of reference. Each point light source emits light waves of a known wavelength which are received by the front plate of a multiple-beam interferometer means having a known angle of light acceptance. With respect to the light waves transmitted by each point light source and received by the interferometer means, a set of non-localized multiple-beam interference fringes are created within the interferometer means. A photo-electric detection means is provided a known distance from the back plate of the multiple-beam interferometer means and is positioned so that the interferometer means and photo-electric detection means have a common optical center axis. The intersection of such optical center axis and the plane defined by the back plate of the interferometer means establishes the origin of the known frame of reference. The photo-electric detection means both detects the two-dimensional position of at least the innermost fringe of each set of interference fringes, and transmits the detected positional information to a processor means by electric signals. The processor means employs the electric signals to determine the coordinate values for the center point of each set of interference fringes relative to the common optical center axis, and determines the radius of the innermost fringe of each set of interference fringes. Such determinations allow the processor means to calculate the three-dimensional coordinates of the distant points relative to the known frame of reference.

대표청구항 ▼

An apparatus for simultaneously measuring one to three of the three-dimensional coordinates of one or more distant points, comprising: a means for providing a point optical radiation source at each said distant point; a multiple-beam interferometer means which receives optical radiation emitted from

An apparatus for simultaneously measuring one to three of the three-dimensional coordinates of one or more distant points, comprising: a means for providing a point optical radiation source at each said distant point; a multiple-beam interferometer means which receives optical radiation emitted from each said point optical radiation source, and which creates at least one interference fringe with respect to each said point optical radiation source due to the optical radiation received therefrom; a photo-electric detection means which detects at least a portion of said one interference fringe created with respect to each said point optical radiation source, and which transmits electric signals in response to each of the detected interference fringes; and processor means which receives said electric signals, and which employs the electric signals to determine one to three of the three-dimensional coordinates of each said distant point.