초록 ▼

Reflectance apparatus is disclosed for obtaining measurement of nonspecular reflected light in which controlled light rays are directed by means of a lens and transmission path from a light source through a light trap to expose or illuminate a specimen and nonspecular reflected light is passed from

Reflectance apparatus is disclosed for obtaining measurement of nonspecular reflected light in which controlled light rays are directed by means of a lens and transmission path from a light source through a light trap to expose or illuminate a specimen and nonspecular reflected light is passed from the specimen through the light trap along a transmission path to one or more detectors where the nonspecular reflected light is measured.

대표청구항 ▼

Apparatus for measuring nonspecular reflected light which comprises a light source, means for supporting a specimen having a surface the reflectance of which is to be measured upon exposure to light emitted from said light source, and means for detecting light reflected from the surface of the speci

Apparatus for measuring nonspecular reflected light which comprises a light source, means for supporting a specimen having a surface the reflectance of which is to be measured upon exposure to light emitted from said light source, and means for detecting light reflected from the surface of the specimen, wherein the apparatus is characterized by: means defining a light illuminating transmission path in which the light source is located at one end thereof and the means for supporting the specimen having a surface the reflectance of which is to be measured is located at the opposite end thereof, said light illuminating transmission path containing a lens in front of said light source; a light trap positioned at the end of the light illuminating transmission path opposite said light source and in front of said means for supporting the specimen having a surface the reflectance of which is to be measured; and means defining a light detection transmission path in which said light trap is located at one end and means for detecting light reflected from a surface of a specimen the reflectance of which is to be measured is located at the opposite end of said light detection transmission path; wherein the combined effect of the lens and the light trap prevents specular reflected light from being transmitted through said light trap to said means for detecting light.