초록 ▼

Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by

Methods are provided for reducing the number of projected patterns required to make two- or three-dimensional surface measurements on a sub-class of surfaces comprising relatively smooth surfaces. By including apriori knowledge about the surface to be measured, pattern ambiguities can be resolved by processing rather than by additional projected patterns.

대표청구항 ▼

A method for unambiguously identifying the location of a point within the view of a two- or three-dimensional measurement sensor with a single projected pattern comprising the steps of: projecting a binary pattern having unique codes over any span of N segments out of a total of as many as 2N segmen

A method for unambiguously identifying the location of a point within the view of a two- or three-dimensional measurement sensor with a single projected pattern comprising the steps of: projecting a binary pattern having unique codes over any span of N segments out of a total of as many as 2N segments onto a surface to be measured, so that said segments form uniquely identifiable local patterns; recording reflected radiation with a detector and generating a recorded signal; analyzing the recorded signal and providing, a digital representation thereof; and identifying the location of the point in the pattern by comparing the digital representation with a known reference pattern digital representation.