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Emissivity error correcting method for radiation thermometer 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01J-005/00
출원번호 US-0849160 (1986-04-07)
발명자 / 주소
  • Brouwer Nicholaas L. (Allegheny Township
  • Allegheny County PA) Urbanic John M. (Churchill Borough PA) Anderson Albert R. (White Valley PA)
출원인 / 주소
  • Aluminum Company of America (Pittsburgh PA 02)
인용정보 피인용 횟수 : 33  인용 특허 : 1

초록

A method of more accurately measuring the true surface temperature of metal alloy objects without contacting the same. The surfaces of the objects have unknown emissivities that change and that are less than unity. The method includes the step of providing objects having surfaces that radiate infrar

대표청구항

A method of measuring the surface temperature of heated metal objects having changing unknown emissivities that are less than unity, the method comprising the steps of: providing an object having a heated surface radiating infrared energy therefrom; determining true surface temperature of the object

이 특허에 인용된 특허 (1)

  1. Anderson, Alan S., Temperature measuring apparatus.

이 특허를 인용한 특허 (33)

  1. Yam Mark ; Hunter Aaron M., Apparatus and method for measuring substrate temperature.
  2. Rudolph Ralph G. (Center Valley PA), Apparatus and method for measuring temperature and/or emissivity of steel strip during a coating process.
  3. Jennings Dean, Apparatus and methods for measuring substrate temperature.
  4. Stein Alexander (Secaucus NJ), Apparatus for remote measurement of temperatures.
  5. Adams Bruce ; Hunter Aaron ; Rubinchik Alex ; Yam Mark ; O'Brien Paul A., Apparatus for substrate temperature measurement using a reflecting cavity and detector.
  6. Bevan,Edward James; Briggs,Max Michael; DiDomenico,John; Gedridge, Jr.,Robert W., Compact emissivity and temperature measuring infrared detector.
  7. Koltunov, Yoseph; Maximov, Alexander; Meltin, Igor; Allon, Motti; Guttman, Glen; Kershenbaum, Arik, Detection and recognition of objects by multispectral sensing.
  8. Salem,Leslie; Zeiler,Eitan; Govrin,Omri, Emissivity-independent silicon surface temperature measurement.
  9. Bonne,Ulrich; Cole,Barrett E.; Wood,Roland A.; Dudebout,Rudolph; Nwadiogbu,Emmanuel, High temperature pyrometer.
  10. Pompei Francesco, Infrared thermocouple improvements.
  11. Hsieh, Chih-Wei, Infrared thermometer.
  12. Buchert Janusz Michal (180 Cabrini Blvd. ; #79 New York NY 10033), Instrument and method for non-invasive monitoring of human tissue analyte by measuring the body\s infrared radiation.
  13. Ng Daniel (3622 Lynnfield Rd. Shaker Heights OH 44122), Method and apparatus for emissivity independent self-calibrating of a multiwavelength pyrometer.
  14. Peuse Bruce W. ; Miner Gary E. ; Yam Mark ; Hunter Aaron ; Knoot Peter ; Mershon Jason, Method and apparatus for measuring substrate temperatures.
  15. Arima Jiro (Osaka JPX) Tsujimura Hiroji (Osaka JPX) Narita Tomonori (Tokyo JPX) Takebuchi Hiroki (Kawasaki JPX), Method for measuring surface temperature of semiconductor wafer substrate, and heat-treating apparatus.
  16. Peuse Bruce W. ; Miner Gary E. ; Yam Mark, Method of calibrating a temperature measurement system.
  17. Twerdochlib, Michael, Method of measuring in situ differential emissivity and temperature.
  18. Twerdochlib, Michael, Method of measuring in situ differential emissivity and temperature.
  19. Canfield Eric L., Radiometric temperature measurement based on empirical measurements and linear functions.
  20. Burns David H,CAX ; Series Frederic,CAX, Substrate temperature measurement by infrared spectroscopy.
  21. Wolf Kurt (Wildbad DEX) Andre Wolfram (Wildbad DEX), System for measuring temperature of a filled vessel on a hot plate.
  22. Felice Ralph A., Temperature determining device and process.
  23. Yano, Kenji; Iwata, Misao; Hashimoto, Miyuki; Kitagawa, Kuniyuki; Arai, Norio, Temperature distribution measuring method and apparatus.
  24. Katzir Abraham,ILX ; Eyal Ophir,ILX ; Scharf Vered,ILX, Temperature measurement by active photothermal radiometry.
  25. Sakami, Mohamed; Lopez, Fulton Jose; Zhang, Hongmei; Mani, Shobhana; Zirin, Robert Michael; Storey, James Michael; Avagliano, Aaton John; Syck, David Howard, Temperature measurement device that estimates and compensates for incident radiation.
  26. Aderhold Wolfgang ; Mayur Abhilash J. ; Knoot Peter A., Tuning a substrate temperature measurement system.
  27. Tominaga,Hideki; Ohkubo,Kunihiko; Kondo,Yasushi, Two-color radiation thermometer.
  28. Canfield Eric L. ; Cheslock Edward P. ; Woolford John R., Tympanic thermometer disposable probe cover with further stretching prevention structure.
  29. Cheslock Edward P. ; Canfield Eric L. ; Harris Richard K., Tympanic thermometer probe cover.
  30. Cheslock Edward P. ; Canfield Eric L. ; Harris Richard K., Tympanic thermometer probe cover.
  31. Cheslock Edward P. ; Canfield Eric L. ; Harris Richard K., Tympanic thermometer probe cover.
  32. Canfield Eric L. ; Cheslock Edward P., Tympanic thermometer with modular sensing probe.
  33. Canfield Eric L. ; Cheslock Edward P., Tympanic thermometer with modular sensing probe.
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