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Automatic photomask or reticle washing and cleaning system 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • B08B-003/02
출원번호 US-0011413 (1987-02-04)
우선권정보 JP-0211626 (1983-11-10); JP-0217434 (1983-11-18)
발명자 / 주소
  • Abe Nobutoshi (Kawasaki JPX) Imamura Kazunori (Tokyo JPX)
출원인 / 주소
  • Nippon Kogaku K. K. (Tokyo JPX 03)
인용정보 피인용 횟수 : 33  인용 특허 : 8

초록

Automatic photomask or reticle washing and cleaning system comprises a foreign particle inspecting unit for inspecting whether or not foreign particles are attached to the surfaces of substrates; a washing and cleaning unit for washing and cleaning the surfaces of substrates with a cleaning liquid,

대표청구항

A system for washing and cleaning the surfaces of a flat substrate horizontally encased in a case comprising: means for inspecting foreign particles attached to the surface of said flat substrate, said inspecting means including first holder means for holding said flat substrate in a horizontal stat

이 특허에 인용된 특허 (8)

  1. Dexter Jeffrey L. (North Dartmouth MA) Fairweather William E. (Mattapoisett MA) Shurtleff Harold R. (Buzzards Bay MA), Apparatus and method for cleaning wafers.
  2. Flint Alan G. (Los Gatos CA), Apparatus for handling and treating wafers.
  3. DiCicco Paolo S. (395 Laurel St. San Carlos CA 94070), Apparatus for processing articles in a series of process solution containers.
  4. Boys Donald R. (Cupertino CA) Graves Walter E. (San Jose CA), Disk or wafer handling and coating system.
  5. Manriquez Ralph F. (Saratoga CA), Integrated circuit wafer transport mechanism.
  6. Nagatomo Hiroto (Hinode JPX) Takagaki Tetsuya (Kodaira JPX) Seki Hisao (Hamura JPX) Terasaki Shirou (Kokubunjii JPX) Horimuki Hitoshi (Kofu JPX), Surface treatment device.
  7. Geren ; deceased Lorenzo D. (late of Houston TX by Henrietta C. Geren ; administratrix) Worden Raymond D. (Houston TX), Transfer apparatus.
  8. Hertel Richard J. (Bradford MA) MacIntosh Edward D. (Gloucester MA), Wafer transfer system.

이 특허를 인용한 특허 (33)

  1. Peng, Grant; Mui, David; Kon, Shih-Chung, Acoustic assisted single wafer wet clean for semiconductor wafer process.
  2. Chung Army,TWX ; Hong Hsi-Hsin,TWX ; Ku Chi-Fa,TWX, Apparatus for removing photo-resist.
  3. Inada Minoru,JPX ; Imajo Yasutaka,JPX ; Uchino Masahide,JPX, Cleaning method and cleaning apparatus.
  4. Michael Klaus (Gelnhausen-Haitz DEX) Petz Andreas (Bruchkbel DEX), Device for cleaning, testing and sorting of workpieces.
  5. Bhushan Rajiv ; Chang Ru ; Mohindra Raj ; Chiu Vincent ; Tran Dong T., Mandrel device and method for hard disks.
  6. Mohindra Raj ; Wong David C. ; Puri Suraj, Method and apparatus for cleaning wafers using multiple tanks.
  7. Mohindra Raj ; Wong David C. ; Puri Suraj, Method and apparatus for cleaning wafers using multiple tanks.
  8. Wu, Banqiu; Lee, Richard; Yalamanchili, M. Rao; Kumar, Ajay; Papanu, James S.; Jeon, Chung-Huan, Method and apparatus for mask pellicle adhesive residue cleaning.
  9. Chen, Kuo-Feng; Yu, Hsiu-Mei; Tseng, Charles; Lin, Ta-Yang, Method and apparatus for pretreating a substrate prior to electroplating.
  10. Suzuki, Masaaki, Method of cleaning substrate.
  11. Suzuki Masaaki,JPX, Method of cleaning substrate using ultraviolet radiation.
  12. Masaaki Suzuki JP, Method of washing substrate with UV radiation and ultrasonic cleaning.
  13. Kholodenko, Arnold; Mikhaylichenko, Katrina; Lin, Cheng-Yu (Sean); Wilcoxson, Mark; Ginzburg, Leon; Kawaguchi, Mark, Multi-stage substrate cleaning method and apparatus.
  14. Wagner, Christopher C., Optical processing of surfaces to determine cleanliness.
  15. Wagner, Christopher Carroll, Optical processing to control a washing apparatus.
  16. Simmons Mark A. (San Jose CA) Krusell Wilbur C. (San Jose CA), Process for brush cleaning.
  17. Tran,Hai, Reticle carrier apparatus and method that tilts reticle for drying.
  18. Matthew E. Williams, Reticle cleaning without damaging pellicle.
  19. Matthew E. Williams, Reticle cleaning without damaging pellicle.
  20. Matthew E. Williams, Reticle cleaning without damaging pellicle.
  21. Williams Matthew E., Reticle cleaning without damaging pellicle.
  22. Williams Matthew E., Reticle cleaning without damaging pellicle.
  23. Williams Matthew E., Reticle cleaning without damaging pellicle.
  24. Williams Matthew E., Reticle cleaning without damaging pellicle.
  25. Williams, Matthew E., Reticle cleaning without damaging pellicle.
  26. Williams, Matthew E., Reticle cleaning without damaging pellicle.
  27. Kaneko Satoshi,JPX ; Kamikawa Yuji,JPX ; Koguchi Akira,JPX ; Kuroda Osamu,JPX ; Kitahara Shigenori,JPX ; Nishida Tatsuya,JPX, Substrate transporting and processing system.
  28. Roberson ; Jr. Glenn A. (Hollister CA) Eglinton Robert B. (Montery CA), Vapor device and method for drying articles such as semiconductor wafers with substances such as isopropyl alcohol.
  29. Itzkowitz Herman, Wafer scrubbing device.
  30. Itzkowitz Herman (Montgomery PA), Wafer scrubbing device.
  31. Yatabe Yasuo (Tokyo JPX), Wafer transposing device.
  32. Yatabe Yasuo (Tokyo JPX), Wafer washing and drying apparatus.
  33. Suzuki, Masaaki, Washing apparatus with UV exposure and first and second ultrasonic cleaning vessels.
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