[특허]Three-dimensional vision system

Three-dimensional vision system 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G06K-009/00
출원번호	US-0714455 (1985-03-21)
우선권정보	JP-0056199 (1984-03-26)
발명자 / 주소	Hata Seiji (Fujisawa JPX) Okada Takushi (Yokohama JPX) Ariga Makoto (Yokohama JPX) Okabe Takafumi (Yokohama JPX)
출원인 / 주소	Hitachi, Ltd. (Tokyo JPX 03)
인용정보	피인용 횟수 : 31 인용 특허 : 0

초록 ▼

The present invention consists in a three-dimensional vision system comprising a three-dimensional vision sensor which projects slit-like light on an object to-be-handled and which reads out a resulting slit image, an image input portion which controls the slit-like light to be lit up and put out and also controls the read-out of the slit image and which performs extraction processing of differential signals as to image signals read out, and an image processor which performs required controls concerning said image input portion and which processes image data of said image input portion; an image with the projected slit-like light and an image without it being sequentially sampled on an identical scanning line of the read-out image so as to obtain the differential image between them, thereby to extract a light segmentation line based on the projected slit-like light.

대표청구항 ▼

A three-dimensional vision system, comprising: three-dimensional vision means for projecting slit-like light onto an object to-be-handled over each of a plurality of scanning lines and for reading image signals representing both a resulting slit image of the object while the slit-like light is projected over one of said plurality of scanning lines and a background image of the object along the same one of said plurality of scanning lines while no slit-like light is projected, an image input portion which controls illumination of the slit-like light to cause said vision means to sequentially project said slit-like light over each of said plurality of scanning lines, and also controls the reading of image signals representing both the slit-image and the background image along each of said scanning lines, and which performs extraction processing for each one of said plurality of scanning lines to obtain differential signals from the image signals representing a resulting slit image of the object along a scanning line and the image signals representing the background image of the object along the same scanning line to obtain said differential signals for each one of said scanning lines from the image signals read out, and means including means for extracting a position corresponding to a maximum value among said differential signals occurring along each of said scanning lines, for extracting a light segmentation line from each one of said differential signals, whereby an image processor can recognize a three-dimensional shape of the object on the basis of a plurality of said light segmentation lines extracted from said differential signals and the positions corresponding to the maximum value of each of one of said differential signals.

이 특허를 인용한 특허 (31)

Amir Israel (Ewing NJ), 3D imaging of a substrate using perpendicular scanning directions.
상세보기
Blessing,Patrick, Apparatus and method for mounting or wiring semiconductor chips.
상세보기
Ikegawa Akihito,JPX, Electrostatic recording apparatus.
상세보기
Honda Motoharu (Shiga JPX), Image recognition apparatus capable of inspecting height and method for inspecting height by using two slit incident bea.
상세보기
Otani,Hitoshi; Kochi,Nobuo, Measuring apparatus.
상세보기
Gilliland Malcolm T., Method and apparatus for determining the configuration of a workpiece.
상세보기
Leonard,Patrick F.; Scarpine,Victor; Evans,Frank, Method and apparatus for evaluating integrated circuit packages having three dimensional features.
상세보기
Takagi Yuji (Yokohama JPX) Hata Seiji (Fujisawa JPX), Method and apparatus for measuring optical cutting beam with parallel beam referencing.
상세보기
Fraas, Karl-Christian; Kamsties, Klaus-Dieter; Lockau, Jurgen, Method and apparatus for system documentation.
상세보기
Imai, Shigeaki; Fujii, Eiro; Fujiwara, Koji; Sakagawa, Yoshiko; Nakagawa, Yoshiko; Matsuura, Kiri, Method for generating three-dimensional form data and apparatus therefor.
상세보기
Rockseisen Armin,DEX, Method for the contact-free measurement of the distance of an object according to the principle of laser triangulation.
상세보기
Moore, Scott E.; Olin, Brett, Non-contact deviation measurement system.
상세보기
Moore, Scott E.; Olin, Brett, Non-contact deviation measurement system.
상세보기
Moore,Scott E.; Olin,Brett, Non-contact deviation measurement system.
상세보기
Oda,Masaru; Tamura,Toshinari, Object taking-out apparatus.
상세보기
Smith,Melvyn Lionel; Smith,Lyndon; Carlsruh,Eve, Overhead dimensioning system and method.
상세보기
Leroux, Christophe, Process for gripping an object by means of a robot arm equipped with a camera.
상세보기
Mesher, Darel, Protective shroud for enveloping light from a light emitter for mapping of a railway track.
상세보기
Holmes, Quentin; Kortesoja, Paul; McCubbrey, David; Samson, Joseph; Wessling, Thomas; Witter, Lester; Rendleman, Robert; Blanchfield, John; Lowe, Gregory, Range-finding based image processing rail way servicing apparatus and method.
상세보기
Carlson, Jeffrey J.; Giles, Michael K.; Padilla, Denise D.; Davidson, Jr., Patrick A.; Novick, David K.; Wilson, Christopher W., Reduction of background clutter in structured lighting systems.
상세보기
Bani Hashemi,Ali, Remote center range finder.
상세보기
Nichani Sanjay ; Scola Joseph, Semiconductor device image inspection utilizing image subtraction and threshold imaging.
상세보기
Yamada, Tomoaki, Shape measuring device and shape measuring method.
상세보기
White Timothy P. ; LeBlanc Steven M., Surface marking system and method of viewing marking indicia.
상세보기
Lim, Teng Hun; Saxena, Kuldeep Kumar; Tan, Meng Whui, System and method for optically measuring a parameter of an object.
상세보기
Watanabe,Atsushi; Arimatsu,Taro, Teaching model generating device.
상세보기
Iijima, Katsumi; Okauchi, Shigeki; Matsugu, Masakazu; Sekine, Masayoshi; Yano, Kotaro; Kurahashi, Sunao; Katayama, Tatsushi; Mori, Katsuhiko; Ishikawa, Motohiro, Three-dimensional information processing apparatus and method.
상세보기
Katsumi Iijima JP; Shigeki Okauchi JP; Masakazu Matsugu JP; Masayoshi Sekine JP; Kotaro Yano JP; Sunao Kurahashi JP; Tatsushi Katayama JP; Katsuhiko Mori JP; Motohiro Ishikawa JP, Three-dimensional information processing apparatus and method.
상세보기
Fukumoto, Tadashi; Osaki, Shigeru; Ariizumi, Masahiro; Matsunaga, Norio; Abe, Yoshihisa, Three-dimensional shape-measuring system.
상세보기
Svetkoff Donald J. ; Rohrer Donald K. ; Kelley Robert W., Triangulation-based 3-D imaging and processing method and system.
상세보기
Brinjes, Jonathan Charles, User interface device.
상세보기

IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

내보내기 구분	파일저장 인쇄 메일전송
구성항목	기본정보 상세정보 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC 관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 공고번호, 공고일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표출원인, 출원인국적, 출원인주소, 발명자, 발명자E, 발명자코드, 발명자주소, 발명자 우편번호, 발명자국적, 대표IPC, IPC코드, 요약, 미국특허분류, 대리인주소, 대리인코드, 대리인(한글), 대리인(영문), 국제공개일자, 국제공개번호, 국제출원일자, 국제출원번호, 우선권, 우선권주장일, 우선권국가, 우선권출원번호, 원출원일자, 원출원번호, 지정국, Citing Patents, Cited Patents
저장형식	Text(ASCII format) Excel format PIAS분석(.xls)
메일정보	받는사람 (필수) @ 보내는사람 (선택) @ 제목 내용 KISTI 검색결과 이메일 서비스
안내	총 건의 자료가 검색되었습니다. 다운받으실 자료의 인덱스를 입력하세요. (1-10,000) 검색결과의 순서대로 최대 10,000건 까지 다운로드가 가능합니다. 데이타가 많을 경우 속도가 느려질 수 있습니다.(최대 2~3분 소요) 다운로드 파일은 UTF-8 형태로 저장됩니다. 파일의 내용이 제대로 보이지 않을실 때는 웹브라우저 상단의 보기 -> 인코딩 -> 자동선택 여부를 확인하십시오. ~ Text(ASCII format) Excel format

연합인증

Three-dimensional vision system 원문보기

초록 ▼

대표청구항 ▼

연구과제 타임라인

이 특허를 인용한 특허 (31)

관련 콘텐츠

특허 원문 보기

IPC 상위 출원인

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

선택된 텍스트

연합인증

Three-dimensional vision system 원문보기

초록 ▼

대표청구항 ▼

연구과제 타임라인

전체(0) 논문(0) 특허(0) 보고서(0)

전체(0) 논문(0) 특허(0) 보고서(0)

이 특허를 인용한 특허 (31)

관련 콘텐츠

특허 원문 보기

IPC 상위 출원인

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

선택된 텍스트