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Surface mensuration sensor 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/24
출원번호 US-0769442 (1985-08-26)
발명자 / 주소
  • Addleman David A. (Pacific Grove CA) Addleman Lloyd A. (Big Sur CA)
출원인 / 주소
  • Cyberware Laboratory, Inc. (Pacific Grove CA 02)
인용정보 피인용 횟수 : 184  인용 특허 : 0

초록

The invention is an apparatus having an improved arrangement of sensing and illumination elements for high speed, non-contact, three-dimensional mensuration of a surface. The surface is illuminated by a single plane of light producing a contour line. The line is viewed from two or more vantage point

대표청구항

An electro-optical apparatus for use as a data input for apparatus performing high-speed non-contacting mensuration of three-dimensional surfaces comprising: a means for providing a plane of light intersecting said surface and producing a contour line; a means for moving said surface relative to sai

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