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Method for testing DC motors 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01P-003/42
  • G06F-015/332
출원번호 US-0707709 (1985-03-04)
발명자 / 주소
  • Strunk Timothy L. (Lexington KY) Westerman Glenn S. (Lexington KY)
출원인 / 주소
  • International Business Machines Corporation (Armonk NY 02)
인용정보 피인용 횟수 : 111  인용 특허 : 0

초록

Disclosed is a DC parameter motor tester based on current time response, which tester does not require coupling of the motor (14) to some mechanical device or measuring other noise sensitive parameters taken from only a few discrete data points. As is disclosed, the steady state speed of the motor i

대표청구항

A method for testing a direct current motor based upon current time response comprising the steps of: generating a voltage test waveform having steady state components at a plurality of levels, one of said levels being in the order of magnitude of a rated voltage of said direct current motor, said v

이 특허를 인용한 특허 (111)

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
  2. Keeler Randall W. (Troy OH) King James L. (Troy OH), Apparatus and method for testing electrically controlled motor.
  3. Mitchell,Lawrence Hardy; Mitchell,Stuart Glen, Brushless servo motor tester.
  4. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
  5. Dunklee, John, Chuck for holding a device under test.
  6. Dunklee, John, Chuck for holding a device under test.
  7. Dunklee, John, Chuck for holding a device under test.
  8. Dunklee,John, Chuck for holding a device under test.
  9. Dunklee,John, Chuck for holding a device under test.
  10. Dunklee,John, Chuck for holding a device under test.
  11. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  12. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  13. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  14. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  15. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  16. Rak Thomas A. (Marietta GA) Whitaker T. Mark (Hiram GA), DC motor operated valve remote monitoring system.
  17. Hendrix Donald E. (Oak Ridge TN) Smith Stephen F. (Knoxville TN), Demodulation circuit for AC motor current spectral analysis.
  18. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
  19. Strid, Eric; Campbell, Richard, Differential signal probing system.
  20. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
  21. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
  22. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
  23. Liang, Feng; Huang, Henry Heping; Degner, Michael W., Electrical machine drive system and method.
  24. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  25. Dunklee,John; Norgden,Greg; Cowan,C. Eugene, Guarded tub enclosure.
  26. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  27. McFadden,Bruce, Localizing a temperature of a device for testing.
  28. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  29. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
  30. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
  31. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
  32. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  33. Smith,Kenneth; Gleason,Reed, Membrane probing system.
  34. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
  35. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
  36. Aghili, Farhad, Method and apparatus for high velocity ripple suppression of brushless DC motors having limited drive/amplifier bandwidth.
  37. Raichle, Kurt, Method and apparatus for testing a motor.
  38. Schuchmann, Russell P., Method and apparatus of detecting disturbances in a centrifugal pump.
  39. Micke,Marc; Sievert,Holger; Hachtel,Juergen; Hertlein,Guenther, Method and device for measuring the rotational speed of a pulse-activated electric motor based on a frequency of current ripples.
  40. Gerlach, Tobias, Method for correcting the determination of the rotational position of a commutated DC motor drive shaft.
  41. Gerlach,Tobias, Method for determining the frequency of the current ripple in the armature current of a commutated DC motor.
  42. Pan, Yann-Guang; Huang, Jieh-Yee; Kuo, Li-Te; Wang, Shyh-Jier, Method for determining whether a rotor is good in magnetic induction by measuring the EMF of a motor.
  43. Kessler Erwin,DEX ; Schulter Wolfgang,DEX, Method for establishing the rotational speed of mechanically commutated d.c. motors.
  44. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
  45. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
  46. Romano, Paschal J., Method of detecting a malfunction of an encoder for a vehicle drive system.
  47. Tsai, Ching-Hsiung; Chen, Po-Ming, Method of instant estimation of a load motor inertia.
  48. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
  49. Grosjean,Dennis Francis, Motor based condition monitoring.
  50. Haynes Howard D. (Kingston TN) Eissenberg David M. (Oak Ridge TN), Motor current signature analysis method for diagnosing motor operated devices.
  51. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
  52. Harris,Daniel L.; McCann,Peter R., Optical testing device.
  53. Bartusiak Raymond Donald ; Nicholson Douglas Hugh,GB6, Plant parameter detection by monitoring of power spectral densities.
  54. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  55. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
  56. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
  57. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
  58. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
  59. Schwindt,Randy, Probe holder for testing of a test device.
  60. Nordgren, Greg; Dunklee, John, Probe station.
  61. Nordgren, Greg; Dunklee, John, Probe station.
  62. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  63. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  64. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  65. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  66. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  67. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  68. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  69. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  70. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  71. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  72. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  73. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  74. Lesher, Timothy E., Probe testing structure.
  75. Lesher,Timothy E., Probe testing structure.
  76. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
  77. Mourad Kamal,ITX ; Castellar Luciano,ITX, Process and device for detecting the speed of rotation of a DC electric motor controlled by a PWM control signal.
  78. Bonduel, Pascal; Levine, Jean, Processes and devices for monitoring the rotation of DC electric motors.
  79. Doughty, Samuel P. S., Quiet load for motor testing.
  80. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
  81. Fisher, James Allan, Reverse inertial load test.
  82. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
  83. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
  84. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  85. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
  86. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  87. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
  88. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
  89. Dunklee,John, Switched suspended conductor and connection.
  90. Dunklee,John, Switched suspended conductor and connection.
  91. Walters, James E., System and method of electric motor fault detection.
  92. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  93. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  94. Andrews, Peter; Hess, David, System for testing semiconductors.
  95. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  96. Campbell, Richard, Test structure and probe for differential signals.
  97. Campbell,Richard, Test structure and probe for differential signals.
  98. Hurst Stewart Andrew,GBX ; Ainsworth Anthony John,GBX ; Bolton John Anthony,GBX, Testing and speed control of electric motors in vehicles having electronically controlled braking systems.
  99. Fu, Zhenxing; Heller, Marcus, Testing inverter driven electric motor shut-off path.
  100. Rumbaugh,Scott, Thermal optical chuck.
  101. Rumbaugh,Scott, Thermal optical chuck.
  102. Koski, John Alexander, Verification of operational capability of a tape drive.
  103. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
  104. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  105. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
  106. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  107. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  108. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  109. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  110. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
  111. Campbell, Richard, Wideband active-passive differential signal probe.
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