초록 ▼

The process and the device enable the electrical powering of a circuit having a conductor (1) with high thermal inertia by means of a transistor (3) with low thermal inertia. According to the invention, the device comprises a current limiter circuit (4,5,7,11), a voltage detector circuit (8) and a c

The process and the device enable the electrical powering of a circuit having a conductor (1) with high thermal inertia by means of a transistor (3) with low thermal inertia. According to the invention, the device comprises a current limiter circuit (4,5,7,11), a voltage detector circuit (8) and a control microprocessor (6) which, according to a pre-established program, controls the flowing and stoppage of current in the power transistor (3) controlling the powering of the conductor (1) with high thermal inertia. Application to the control of lights in automobile vehicles.

대표청구항 ▼

A method for testing a lighting device having a high thermal inertia and a high temperature rise comprising the steps of: supplying electrical current to the lighting device and a transistor with low thermal inertia; dividing, in the initial phase, the current into pulses having a duration/spacing r

A method for testing a lighting device having a high thermal inertia and a high temperature rise comprising the steps of: supplying electrical current to the lighting device and a transistor with low thermal inertia; dividing, in the initial phase, the current into pulses having a duration/spacing ratio and an initial peak current for controlling the temperature of the transistor, to reach a predetermined stable operating value, the electrical current passing through the transistor however being sufficient to heat the lighting device at a speed at least equal to a value fixed in advance; comparing the voltage drop in the transistor with a check value, to detect a short-circuit in the lighting device; increasing, in the succeeding phases and with no detected short circuit, the duration/spacing ratio and the peak current of said current pulses so that the temperature of the transistor again approaches said operating value without exceeding it, thereby raising the speed of heating the lighting device; comparing the measured peak current with a check value for detecting a short-circuit in the lighting device after a time that is fixed in advance, and longer than the normal time necessary for the resistance of the lighting device with high thermal inertia to start limiting the peak current; and then indicating the presence of a short-circuit in the lighting device.