[특허]Vacuum pick and place mechanism for integrated circuit test handler

[미국특허] Vacuum pick and place mechanism for integrated circuit test handler 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	B65H-005/08
출원번호	US-0050923 (1987-05-15)
발명자 / 주소	Cedrone Nicholas J. (Wellesley Hills MA)
출원인 / 주소	Daymarc Corporation (Waltham MA 02)
인용정보	피인용 횟수 : 33 인용 특허 : 2

초록 ▼

In an automated high speed test handler for integrated circuits (IC\s) an articulated vacuum picker reciprocates to transfer IC\s successively from a staging area to a test site. Movable stops position and locate the IC at a test site. A sliding plate mounts the picker and carries cam surfaces to control the stops. A reciprocating placer mechanism carrying a multi-port vacuum manifold carries an IC being tested from the test site to a test plane displaced laterally from the flow path of the device. The picker is balanced to rotate under the weight of the IC being carried against mutually inclined lateral guide rails so that the mechanism is self-centering. These guide and locating mechanisms accurately position the IC so that there is no need for a physical steering of the IC\s as they approach the test plane or a separately actuated clamping of the device in the test plane. After testing, the device is stripped from the vacuum manifold as the device encounters a guide plate on the return stroke of the placer mechanism.

대표청구항 ▼

A mechanism for transporting at a high speed a succession of integrated circuits (IC\s) which are movable in a guide track section along a product flow path from a staging area to a test site that is displaced horizontally from a test plane along a first direction transverse to said flow path, comprising: lateral guide means extending from said staging area to said test site, a slide member movable in a reciprocating manner along said lateral guide means between a pick position at said staging area and a place position at said test site, a pick mounted on said slide member adapted to vacuum grip an IC at said staging area and carry it to said test site in coordination with a corresponding movement of said slide member, means for driving said slide member and pick between said pick and place positions, and means for driving said IC along said first direction between said place position and a test position, said pick gripping said IC sufficiently lightly to allow changes in orientation of the device with respect to the pick, said pick being mounted on said slide member for an articulated movement, and said lateral guide means being mutually inclined rails to self-center said IC as it moves from the staging area to the test site.

이 특허에 인용된 특허 (2) 인용/피인용 타임라인 분석

Jacoby Hans-Dieter (Werdorf DEX) Schmidt Peter (Huettenberg DEX), Device for automatically transporting disk shaped objects.
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Horn Charles (Dayton OH) Kelly Rickey L. (Dayton OH) Orendorf Thomas E. (Dayton OH) Kiger Terry L. (Dayton OH), System and apparatus for use in fabricating small tubular articles.
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이 특허를 인용한 특허 (33) 인용/피인용 타임라인 분석

Masuda Hisao (Itami JPX) Fujimoto Hitoshi (Itami JPX) Osaka Shuichi (Itami JPX), Apparatus for assembling semiconductor devices.
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Cram, Daniel P., Bladder based package control/singulation.
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Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
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Noble, Scott; Garcia, Edward; Polyakov, Evgeny; Truebenbach, Eric L.; Merrow, Brian S., Bulk feeding disk drives to disk drive testing systems.
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Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
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Truebenbach, Eric L., Bulk transfer of storage devices using manual loading.
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Martino, Peter, Damping vibrations within storage device testing systems.
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Merrow, Brian S.; Truebenbach, Eric L.; Smith, Marc Lesueur, Dependent temperature control within disk drive testing systems.
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Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
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Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
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Merrow, Brian S.; Garcia, Edward; Polyakov, Evgeny, Disk drive transport, clamping and testing.
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Arena, John Joseph; Suto, Anthony J., Electronic assembly test system.
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Merrow, Brian S., Enclosed operating area for disk drive testing systems.
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Merrow, Brian S., Enclosed operating area for storage device testing systems.
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Campbell, Philip; Wrinn, Joseph F., Engaging test slots.
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Merrow, Brian S.; Akers, Larry W., Heating storage devices in a testing system.
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Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
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Merrow, Brian S.; Akers, Larry W., Storage device temperature sensing.
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Merrow, Brian S., Storage device testing system cooling.
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Merrow, Brian S., Storage device testing system cooling.
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Merrow, Brian S.; Akers, Larry W., Storage device testing system with a conductive heating assembly.
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Merrow, Brian S., Temperature control within disk drive testing systems.
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Merrow, Brian S., Temperature control within disk drive testing systems.
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Merrow, Brian S., Temperature control within storage device testing systems.
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Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
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Merrow, Brian S.; Krikorian, Nicholas C., Test slot cooling system for a storage device testing system.
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Merrow, Brian S., Thermal control system for test slot of test rack for disk drive testing system with thermoelectric device and a cooling conduit.
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Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
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Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring disk drives within disk drive testing systems.
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Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
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Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
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Toscano, John; Polyakov, Evgeny; Garcia, Edward; Truebenbach, Eric L.; Merrow, Brian S.; Whitaker, Brian J., Transferring storage devices within storage device testing systems.
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Merrow, Brian S., Vibration isolation within disk drive testing systems.
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IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

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[미국특허] Vacuum pick and place mechanism for integrated circuit test handler 원문보기