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Radiographic sensitivity for detection of flaws and cracks 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-023/201
출원번호 US-0040019 (1987-04-20)
발명자 / 주소
  • Annis Martin (Cambridge MA) Bjorkholm Paul (Sharon MA)
출원인 / 주소
  • American Science and Engineering, Inc. (Cambridge MA 02)
인용정보 피인용 횟수 : 31  인용 특허 : 13

초록

A method of imaging for enhancing detection of cracks or flaws in an object using penetrating radiation is disclosed wherein a contrast medium is applied to an object before illumination and scatter radiation is detected from the object. This is achieved by employing a flying spot scanner and a back

대표청구항

A method of imaging for enhancing detection of cracks or flaws in an object using penetrating radiant energy comprising the steps of: (a) providing a beam of penetrating radiant energy and repeatedly sweeping said beam over a line in space, supporting an object for illumination by said beam and prov

이 특허에 인용된 특허 (13)

  1. Greenfield George B. (4855 Greenleaf Ave. Lincolnwood IL 60646), Apparatus and method for enhancing radiographs.
  2. Dubois ; deceased Jaques (late of Menlo Park CA) Zulliger Hans R. (Portola Valley CA), Art object analyzer.
  3. Macovski Albert (4100 Mackay Drive Palo Alto CA 94306), Cross-sectional X-ray emission imaging system.
  4. Honda Michitaka (Ootawara JPX) Kikuchi Katsuya (Tochigi JPX), Data processing apparatus for producing X-ray images with improved signal to noise ratio.
  5. Mistretta Charles A. (Madison WI) Kelcz Frederick (Madison WI), Differential X-ray method and apparatus.
  6. Van Hoye Michael (5564 Vista del Rio Anaheim CA 92807), Fluorescent penetrant crack detection.
  7. Bupp James R. (Endwell NY) Maier Lawrence R. (Johnson City NY), Method of detecting and analyzing damage in printed circuit boards.
  8. Caputo Anthony J. (Knoxville TN) Costanzo Dante A. (Oak Ridge TN) Lackey ; Jr. Walter J. (Oak Ridge TN) Layton Frank L. (Clinton TN) Stinton David P. (Knoxville TN), Method of evaluating the integrity of the outer carbon layer of triso-coated reactor fuel particles.
  9. Cohen Mark E. (San Diego CA) Whiting Carlton D. (San Diego CA), Method of identifying defective particle coatings.
  10. Berry Peter F. (Austin TX) Miller Wendell D. (Austin TX) Nethery ; Jr. John L. (Austin TX), Probe for an apparatus for analyzing metals by X-ray fluorescence.
  11. Lapinski Norman (Chicago IL) Sather Allen (Plainfield IL), Process for the detection of micro-cracks.
  12. Light Glenn M. (San Antonio TX), X-Ray fluorescence testing of laminate structures.
  13. Georges Jean-Pierre J. (Waukesha WI) Keyes Gary S. (Hartland WI) Wesbey William H. (New Berlin WI), X-ray image subtracting system.

이 특허를 인용한 특허 (31)

  1. Hossain Tim Z. ; Tiffin Donald A. ; Stanford Joel R., Apparatus and method for measuring the roughness of a target material surface based upon the scattering of incident X-ray photons.
  2. Nelson, James M.; Shepherd, William B., Backscatter imaging using Hadamard transform masking.
  3. Kaminski, Joseph W., Beam forming apparatus.
  4. Kaminski, Joseph W., Beam forming apparatus.
  5. Jarvi, Ari; Tykkylainen, Jarno; Morton, Edward James, Intelligent security management system.
  6. Abbott, David Henry; Sabo, Nicolas Kristopher, Methods for radiographic and CT inspection of additively manufactured workpieces.
  7. Ryge, Peter; Hughes, Ronald J.; Gray, Steven J., Multiple screen detection systems.
  8. Ryge, Peter; Hughes, Ronald; Kotowski, Andreas F., Multiple screen detection systems.
  9. Ryge, Peter; Hughes, Ronald; Kotowski, Andreas F., Multiple screen detection systems.
  10. Bowman, Elizabeth M.; Bowman, Danielle N.; Coad, Dennis L.; Buitekant, Alan; Radcliffe, Chris T., Nonaqueous radiopaque fluid and associated imaging system and method.
  11. Gray, Stephen; Hughes, Ronald, Personnel screening system.
  12. Gray, Stephen; Hughes, Ronald, Personnel screening system.
  13. Gray, Stephen; Hughes, Ronald; Ryge, Peter; Kotowski, Andreas F., Personnel screening system.
  14. Gray, Stephen; Hughes, Ronald; Ryge, Peter; Kotowski, Andreas F., Personnel screening system.
  15. Gray, Stephen; Hughes, Ronald; Smith, Jerel, Personnel screening system.
  16. Hughes, Ronald J., Personnel security screening system with enhanced privacy.
  17. Bjorkholm, Paul; Clayton, James E., Radiation sources and radiation scanning systems with improved uniformity of radiation intensity.
  18. Kotowski, Andreas; Hughes, Ronald J., Security system for screening people.
  19. Budd,Gerald W., Surface inspection technology for the detection of porosity and surface imperfections on machined metal surfaces.
  20. Penny, Robert David; Valentine, John D., System and method for three-dimensional imaging using scattering from annihilation coincidence photons.
  21. Penny, Robert David; Valentine, John D., System and method for three-dimensional imaging using scattering from annihilation coincidence photons.
  22. Penny, Robert David; Valentine, John D., System and method for three-dimensional imaging using scattering from annihilation coincidence photons.
  23. Hughes, Ronald J., Systems and methods for improving directed people screening.
  24. Hughes, Ronald J., Systems and methods for improving directed people screening.
  25. Morton, Edward James; Peyton, Anthony J., Ultra wide band detectors.
  26. Smith Steven W., X-ray backscatter imaging system including moving body tracking assembly.
  27. Kotowski,Andreas F.; Smith,Steven W., X-ray detector system having low Z material panel.
  28. Kotowski, Andreas F.; Smith, Steven W., X-ray imaging system with active detector.
  29. Bjorkholm Paul J., X-ray inspection apparatus.
  30. Annis Martin ; Adler Richard J. ; Richter-Sand Robert J., X-ray inspection system detector with plastic scintillating material.
  31. Bendahan, Joseph, X-ray-based system and methods for inspecting a person's shoes for aviation security threats.
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