$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Test system and method using artificial intelligence control 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/28
출원번호 US-0906104 (1986-09-09)
발명자 / 주소
  • Hogan
  • Jr. Thomas J. (Enumclaw WA) Kasprick Jon J. (Federal Way WA) Anderson Donald R. (Auburn WA) Kersh Douglas W. (Seattle WA)
출원인 / 주소
  • The Boeing Company (Seattle WA 02)
인용정보 피인용 횟수 : 41  인용 특허 : 18

초록

A testing arrangement in which an AI system is interfaced directly to an automatic test system (ATS) such that from the point of view of the ATS, the actions of the AI system are indistinguishable from the actions of an intelligent human operator. A testing apparatus comprises an automatic test syst

대표청구항

An apparatus for testing an electronic unit under test (UUT), comprising: (a) an automatic test system comprising an automatic test equipment (ATE) controller, at least one test instrument connectable to the ATE controller and to the UUT, and storage means for storing a functional test procedure (FT

이 특허에 인용된 특허 (18)

  1. Robinson C. Sylvester (Federal Way WA), Apparatus and method for automatically testing a multiple node electrical circuit.
  2. Das Pawan K. (74-153 Country Club Rd. Fatontown NJ 07724), Automated analog circuit test system.
  3. Pike Harold L. (R.R. No. 2 ; Box 134 Castle Rock CO 80104) Thomas G. Lamar (368 W. Powers Ave. ; Apt. 201 Littleton CO 80120) Ketchum Ronald L. (3555 S. Pennsylvania Englewood CO 80110) Evans John F., Automatic electronic test equipment and method.
  4. Neal, Thomas M., Automatic test program list generation using programmed digital computer.
  5. Lloyd Raymond A. (Laurel MD) Charles Larry L. (Fallston MD) Susie William F. (Cockeysville MD) Tate ; Jr. Allen W. (Odenton MD) Reeder James R. (Timonium MD), Automatic test system utilizing interchangeable test devices.
  6. Blyth Geoffrey C. (Broxbourne GB2), Automatic test systems.
  7. Sollman Larry C. (Bloomington IN), Automation initialization of reconfigurable on-line automatic test system.
  8. Scott Marshall H. (Woodinville WA) Polstra John D. (Seattle WA), Computer assisted fault isolation in circuit board testing.
  9. Kemper Christian T. (Winter Park FL) Bellows James C. (Seminole FL) Kleinosky Pamela J. (Philadelphia PA), Diagnostic apparatus.
  10. Tashiro Tsutomu (Sagamihara JPX) Haruna Koichi (Yokohama JPX) Komoda Norihis (Kawasaki JPX), Facilities control method.
  11. Barratt David J. (Rotherham GB2) Russell John P. (Sheffield GB2), Fault finding in an industrial installation by means of a computer.
  12. Suzuki Soichi (Yokohama JPX) Aihara Mitsuo (Kamakura JPX) Fujii Mitsuo (Kawasaki JPX), IC device and a system for testing the same.
  13. Petrich Dennis M. (Minnetonka MN) Amick Christopher G. (Mahtomedi MN) Gruenenwald Stanley L. (Blaine MN), Integrated circuit test apparatus test head.
  14. Thompson Timothy F. (Pittsburgh PA) Wojcik Robert M. (Greensburg PA), Methods and apparatus for system fault diagnosis and control.
  15. Borrelli ; Ronald N., Programmable tester method and apparatus.
  16. Kemper Christian T. (Winter Park FL) Lowenfeld Simon (Monroeville PA) Fox Mark S. (Pittsburgh PA), Rule based diagnostic system with dynamic alteration capability.
  17. Sagnard Francois-Regis (Paris FRX) Ruelle Claude (Linas FRX), System for the automatic testing of printed circuits.
  18. Bhaskar Kasi S. (Edmonds WA) Carlson Alden J. (Bothell WA) Couper Alastair N. (Honolulu HI) Lambert Dennis L. (Bothell WA) Scott Marshall H. (Woodinville WA), Test apparatus for electronic assemblies employing a microprocessor.

이 특허를 인용한 특허 (41)

  1. English Roe E. (Euless TX) Kilgore Michael A. (McKinney TX) Crone Jerry A. (Kaufman TX), Automated diagnostic system.
  2. McEnroe Martin P. (Columbia MD) Hilderbrand Laura L. (Columbia MD), Automated system testability assessment method.
  3. Herzberg Garry G. (Renton WA) Reynolds Robert C. (Seattle WA), Automated test apparatus for aircraft flight controls.
  4. Lee,Yung Chien, Automated test method.
  5. Rogers Steven W. (Conway AR) Dale ; Jr. James L. (Conway AR) Casby Alan D. (Conway AR) de Bellefeuille Jean O. W. (Maumelle AR), Automotive service equipment expert system.
  6. Dunkle, Mark Vandevert, Communications interface database for electronic diagnostic apparatus.
  7. Wegerich, Stephan W., Complex signal decomposition and modeling.
  8. Wegerich, Stephan W., Complex signal decomposition and modeling.
  9. Wegerich,Stephan W., Complex signal decomposition and modeling.
  10. Shah,Rasiklal Punjalal; Rajiv,Vrinda; Osborn,Mark David; Graichen,Catherine Mary; Joshi,Amey Sudhakar; Sambasivan,Sreevidya; Chen,Jieqian Cathy; Waldron,Ernest Joseph, Complex system serviceability design evaluation method and apparatus.
  11. Ayyagari, Deepak, Connection management in a centralized communication system.
  12. Ames Arnold A. ; Gooden Charles H. ; Krakauskas Donald P. ; George Vinod, Data communication analysis and simulation tool.
  13. Hori Satoshi (Amagasaki JPX) Omori Teruyo (Amagasaki JPX) Sakagami Makoto (Nagoya JPX), Fault diagnosis device.
  14. Wegerich, Stephan W.; Pipke, R. Matthew; Wolosewicz, Andre, Generalized lensing angular similarity operator.
  15. Wegerich, Stephan W., Inferential signal generator for instrumented equipment and processes.
  16. Wegerich, Stephan W., Inferential signal generator for instrumented equipment and processes.
  17. Herzog, James P., Kernel-based method for detecting boiler tube leaks.
  18. Peter A. Kiss ; Robert S. Daniel, III ; Jeffrey S. Yalowitz, Knowledge management system for performing dynamic distributed problem solving.
  19. Nguyen Phuc Luong,CAX ; Goldman Avrum,CAX ; Graham Peter H.,CAX ; McCormick R. Ian,CAX, Maintenance and warranty control system for aircraft.
  20. Nguyen Phuc Luong,CAX ; Goldman Avrum,CAX ; Graham Peter H.,CAX ; McCormick R. Ian,CAX, Maintenance and warranty control system for aircraft.
  21. Pereira, Ashley A.; Javed, Muhammad Ashraf; Lam, Chun Ho; Yuen, Chung-Yan, Method and apparatus for system monitoring and maintenance.
  22. Stark William D. (Ithaca NY) Prestas Gregory C. (Candor NY), Method for calculating adaptive inference test figure of merit.
  23. Dam, Hien Duy, Methods and systems for automated data mapping and analysis.
  24. Prednis, Leonard J.; Proctor, Michael L.; Sugarman, Alan D., Modular automated avionics test system.
  25. Kessler Brian Robert (Lagrangeville NY) Horton ; III Edward Everett (Westford VT), Process for identifying defective interconnection net end points in boundary scan testable circuit devices.
  26. Atkinson, David E.; Grady, Matthew S.; LaCroix, Donald L.; Lutton, II, David B.; Pepper, Bradley D.; Steel, Randolph P., Real-time rule engine for adaptive testing of integrated circuits.
  27. Atkinson, David E.; Grady, Matthew S.; LaCroix, Donald L.; Lutton, II, David B.; Pepper, Bradley D.; Steel, Randolph P., Real-time rule engine for adaptive testing of integrated circuits.
  28. Gillenwater, Russel L.; Brisky, Philip J.; Keels, Kenneth G., Real-time test controller.
  29. Russell L. Gillenwater ; Philip J. Brisky ; Kenneth G. Keels, Real-time test controller.
  30. Hines, J. Wesley, Robust distance measures for on-line monitoring.
  31. Wegerich, Stephan W.; Wilks, Alan D.; Nelligan, John D., Signal differentiation system using improved non-linear operator.
  32. Bortcosh Raouf W. ; Briney Lester S. ; Hastings Steven D. ; Hennessey Timothy J. ; Hoe-Richardson Peter ; Hussong Richard A. ; Kane Edward S. ; Kelley George E., System and method for diagnosing computer faults.
  33. Patel Tracy L., System and method for managing data for an equipment calibration laboratory.
  34. Yalowitz Jeffrey S. ; Daniel ; III Robert S. ; Pullum Laura L. ; Kiss Peter A., System and method for providing highly-reliable coordination of intelligent agents in a distributed computing system.
  35. Denis P. Gunderson ; Todd B. Brouwer ; Launa B. Molsberry, System and method for simulating air mode and ground mode of an airplane.
  36. del Rosario, Francis E.; Li, Jie; Sater, Antoine G.; Ye, Hong, Test architecture based on intelligent test sequence.
  37. Archie Kent C. (Warrenville IL) Fonorow Owen R. (Plainfield IL) McGould Mary C. (Wheaton IL) McLear ; III Robert E. (Warrenville IL) Read Edward C. (Bolingbrook IL) Schaefer ; III Edwin M. (North Aur, Test automation system.
  38. Kobrosly Walid M. (Round Rock TX), Test planning and execution models for generating non-redundant test modules for testing a computer system.
  39. Stark William D. (Ithaca NY) Prestas Gregory C. (Candor NY), Unpredictable fault detection using adaptive inference testing techniques.
  40. Pence Donald Dean ; Raley Jay Francis, Variegated manufacturing process test method and apparatus.
  41. Deng, Youping; Keener, Christopher D.; Wang, Jinsong, Yield/quality improvement using calculated failure rate derived from multiple component level parameters.
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로