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Optical analysis method and apparatus having programmable rapid random wavelength access 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01J-003/42
  • G01N-021/35
출원번호 US-0856289 (1986-04-28)
발명자 / 주소
  • Kemeny Gabor J. (Manhattan KS) Wetzel David L. (Manhattan KS)
출원인 / 주소
  • Bran+Luebbe GmbH (Norderstedt DEX 03)
인용정보 피인용 횟수 : 36  인용 특허 : 14

초록

The optical reflectance or transmittance concentration analyzer includes an acousto-optical tunable filter (AOTF). The AOTF is tuned by a computer controlled digital-to-analog converter through a tunable sweep oscillator. Tuned beams can be selected according to their direction of propagation or acc

대표청구항

An apparatus for providing rapid random wavelength access for optical analysis of a sample comprising, (a) a light source, (b) an acousto-optic tunable filter positioned to accept light from the light source and provide emerging tuned output beams, (c) means to select a predetermined number of tuned

이 특허에 인용된 특허 (14)

  1. Saito Koetsu (Kawasaki JA) Yano Tsutomu (Kawasaki JA) Watanabe Akinori (Kawasaki JA), Acousto-optic filter.
  2. Yano Tsutomu (Kawasaki JA) Nabeta Yasumasa (Tokyo JA) Saito Koetsu (Kawasaki JA) Watanabe Akinori (Komae JA 4), Acousto-optic filter.
  3. Yano Tsutomu (Kawasaki JA) Watanabe Akinori (Kawasaki JA), Acousto-optic filter.
  4. Gottlieb Milton (Churchill PA) Wachtel Anselm (Penn Hills PA), Acousto-optic tunable filter.
  5. Rosenthal Robert D. (Gaithersburg MD) Rosenthal Scott B. (Gaithersburg MD), Apparatus for near infrared quantitative analysis.
  6. Rosenthal Robert D. (Gaithersburg MD), Apparatus for near infrared quantitative analysis with temperature variation correction.
  7. Landa, Isaac J.; Shideler, Ronald, Apparatus for optically analyzing a sample.
  8. Landa Isaac J. (Wheaton MD), Holographic diffraction grating system for rapid scan spectral analysis.
  9. Judge John F. X. (Yorktown Heights NY) Lipshutz Victor G. (Tarrytown NY), Infrared analyzer.
  10. Chang I-Cheng (Sunnyvale CA), Noncollinear tunable acousto-optic filter.
  11. Johnson ; Jr. ; Robert Lincoln, Optical analysis system having rotating filters.
  12. Landa Isaac J. (Wheaton MD), Rapid scan spectral analysis system utilizing higher order spectral reflections of holographic diffraction gratings.
  13. Nelson Robert L. (Orrville OH) Ryan Frederick M. (Loyalhanna Township ; Westmoreland County PA), System for remote chemical analysis.
  14. Chang I-Cheng (Sunnyvale CA), Transverse tunable acousto-optic filter.

이 특허를 인용한 특허 (36)

  1. Shakespeare, Tarja T.; Shakespeare, John F., Apparatus and method for camera-based color measurements.
  2. Shakespeare, John F.; Shakespeare, Tarja T., Apparatus and method for illuminator-independent color measurements.
  3. Shakespeare, Tarja T.; Shakespeare, John F., Apparatus and method for measuring and/or controlling ultraviolet-activated materials in a paper-making process.
  4. Taylor, II, Charles A.; Barlett, Darryl; Perry, Douglas; Clarke, Roy; Williams, Jason, Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing.
  5. Taylor, II, Charles A.; Barlett, Darryl; Perry, Douglas; Clarke, Roy; Williams, Jason, Apparatus and method for real time measurement of substrate temperatures for use in semiconductor growth and wafer processing.
  6. Shakespeare, Tarja T.; Shakespeare, John F., Apparatus, system, and method for print quality measurements using multiple adjustable sensors.
  7. Shakespeare, Tarja T.; Shakespeare, John F., Color sensor.
  8. Kemeny Gabor J. (Peekskill NY) Soryn Carl G. (Pound Ridge NY) Mark Howard (Suffern NY) Rachlis Robert E. (Chappaqua NY) Evans James (Stamford CT) Ashraf Aamir (Flushing NY), Dual beam acousto-optic tunable spectrometer.
  9. Asimopoulos George (201 Cherokee Dr. Blacksburg VA 24060), Dual beam spectrophotometer.
  10. McCaul Bruce W. (1370 Lincoln Ave. Palo Alto CA 94301) Doggett David E. (Sunnyvale CA), Gas spectroscopy.
  11. McCaul Bruce W. ; Doggett David E., Gas spectroscopy.
  12. Levin Kenneth H. ; Kerem Samuel ; Madorsky Vladimir, Handheld infrared spectrometer.
  13. Ciurczak, Emil W.; Bynum, Kevin C., Hemispherical detector.
  14. Kexin Xu JP; Keiichi Fukada JP, Light source apparatus and measurement method.
  15. Emi Ashibe JP, Measuring condition setting jig, measuring condition setting method and biological information measuring instrument.
  16. Barth, Jochen, Method and apparatus for determining the distance to an object emitting an IR signature.
  17. Brand Joel A. ; Monlux Garth A. ; Zmarzly Patrick ; Fetzer Gregory J. ; Halsted Benjamin C. ; Groff Kenneth W. ; Lee Jamine ; Goldstein Neil ; Richtsmeier Steven ; Bien Fritz, Method and apparatus for in situ gas concentration measurement.
  18. Rosenthal Robert D. (Gaithersburg MD), Method and apparatus for near-infrared quantitative analysis.
  19. Ashibe Emi,JPX, Method and apparatus for processing spectrum in spectral measurement.
  20. Arima Jiro (Osaka JPX) Tsujimura Hiroji (Osaka JPX) Narita Tomonori (Tokyo JPX) Takebuchi Hiroki (Kawasaki JPX), Method for measuring surface temperature of semiconductor wafer substrate, and heat-treating apparatus.
  21. Engelhardt, Johann; Hoffmann, Juergen, Method for scanning microscopy; and scanning microscope.
  22. DiMarzio Don ; Casagrande Louis Gregory ; Clarke James A. ; Silberstein Robert P., Method of spectral nondestructive evaluation.
  23. Steven L. Wright ; Thomas B. Brumback, Jr. ; William S. Niebur ; Roland Welle DE, Near infrared spectrometry for real time analysis of substances.
  24. Hall, Allen L.; Lundstedt, Alan P.; Tseng, Ching-Hui, On-site agricultural product analysis system and method of analyzing.
  25. Lundstedt,Alan P.; Hall,Allen L.; Tseng,Ching Hui, On-site analysis system with central processor and method of analyzing.
  26. Gazdzinski,Robert F., Optical communication apparatus and methods using pulses having modified propagation speeds.
  27. Huth-Fehre Thomas,DEX ; Kowol Frank,DEX ; Feldhoff Roger,DEX ; Kantimm Thomas,DEX, Process and device for recognizing organic substances.
  28. Robinson Mark R., Robust accurate non-invasive analyte monitor.
  29. Robinson Mark R., Robust accurate non-invasive analyte monitor.
  30. Haran,Frank M.; Beselt,Ronald E., Sensor and methods for measuring select components in moving sheet products.
  31. Demmer, David R.; Haslett, Thomas L.; Eichenholz, Jason M., Shaped input apertures to improve resolution in grating spectrometers.
  32. Norris Karl (Beltsville MD), Spectrophotometric instrument with rapid scanning distortion correction.
  33. Wachman Elliot S. ; Farkas Daniel L. ; Niu Wen-Hua, Subicron imaging system having an acousto-optic tunable filter.
  34. Shakespeare, Tarja T.; Shakespeare, John F., System and method for adjusting an on-line appearance sensor system.
  35. Shakespeare, Tarja T.; Shakespeare, John F., System and method for color measurements or other spectral measurements of a material.
  36. Thomas Edward V. ; Robinson Mark R. ; Haaland David M., Systematic wavelength selection for improved multivariate spectral analysis.
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