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Method and apparatus for inspection of substrates 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/86
출원번호 US-0316004 (1989-02-27)
발명자 / 주소
  • Amir Israel (Ewing NJ) Higgins Frank P. (Ewing NJ)
출원인 / 주소
  • AT&T Bell Laboratories (Murray Hill NJ 02)
인용정보 피인용 횟수 : 28  인용 특허 : 12

초록

Inspection of a circuit board (10) to detect missing and misaligned active and passive surface-mounted components (12) and (14), respectively, is accomplished by first illuminating the board with top light to enhance the image of the passive components. The circuit board is then displaced, relative

대표청구항

A method of fabricating a substrate comprising the steps of: placing at least one of a first type and at least one of a second type of component, having electrically conductive members, on a substrate so that each of the components has its conductive members in registration with corresponding metall

이 특허에 인용된 특허 (12)

  1. Suzuki Etsuji (Tokyo JPX) Uno Shinichi (Kawasaki JPX) Chiyoda Kiyomu (Ayase JPX) Nakanoya Mitsugi (Yokohama JPX), Apparatus and method for examining printed circuit board provided with electronic parts.
  2. Kosmowski, Wojciech; Eddy, Richard; O'Neill, Martin, Apparatus for determining the parameters of figures on a surface.
  3. Kurtz Robert L. (10109 Bluff Dr. Huntsville AL 35803) Hurd William A. (2107 Shannonhouse Rd. Huntsville AL 35803), Automatic circuit board tester.
  4. Erdman Rodney V. (Princeton MN), Automatic printed circuit board imaging system.
  5. Copeland Robert K. (Pennington NJ) Dimaggio Richard J. (Trenton NJ), Automatic printed circuit dimensioning, routing and inspecting apparatus.
  6. Yamamura Tatsuo (Hino JPX), Characteristic extracting apparatus.
  7. Sick ; Erwin ; Walter ; Arthur ; Fetzer ; Gunter, Electrooptical scanning device.
  8. Yoshida Hajime (Chofu JPX), Image data masking apparatus.
  9. Harada Osamu (Atsugi JPX) Kojima Akio (Hadano JPX) Ikeda Souhei (Ayase JPX) Watanabe Yoshihisa (Hadano JPX) Tsuji Yoshihisa (Hadano JPX), Inspection device for inspecting projections on the surface of parts.
  10. Requa Stanley C. (Dallas TX) Van Tyne Richard Gayle (Richardson TX), Page width optical character processing method and system.
  11. Miyagawa, Michiaki; Ohki, Kouichi; Takaya, Matsuhiko; Fujihara, Naoto; Yamada, Tadayuki, Pattern discriminator.
  12. MacFarlane James W. (Chelmsford MA) Smyth Bruce E. (Waltham MA), System for printed circuit board defect detection.

이 특허를 인용한 특허 (28)

  1. Eric P. Rudd ; David Fishbaine, Apparatus and method for estimating background tilt and offset.
  2. Rudd Eric P. ; Fishbaine David, Apparatus and method for estimating background tilt and offset.
  3. Fisher, William D.; Martins, Henrique A. S.; Webb, Peter G., Apparatus for deposition and inspection of chemical and biological fluids.
  4. Vaez-Iravani, Mehdi; Rzepiela, Jeffrey Alan; Treadwell, Carl; Zeng, Andrew; Fiordalice, Robert, Defect detection system.
  5. Vaez-Iravani, Mehdi; Rzepiela, Jeffrey Alan; Treadwell, Carl; Zeng, Andrew; Fiordalice, Robert, Defect detection system.
  6. Tullis, Barclay J.; Allen, Ross R.; Picciotto, Carl; Gao, Jun, Identification of recording media.
  7. Vaez Iravani,Mehdi, Inspection system for integrated applications.
  8. Rudd Eric P. ; Fishbaine David ; Haugen Paul R. ; Kranz David M., Method and apparatus for three dimensional imaging using multi-phased structured light.
  9. Gelphman Janet L., Method and apparatus to observe the geometry of relative motion.
  10. Ohmer, Herve, Method for mapping geometrical features with opto-electronic arrays.
  11. Shortt, David; Biellak, Stephen; Belyaev, Alexander, Methods and systems for inspection of a wafer.
  12. Hsu, Shih Ping; Shih, Chao Wen, Methods for repairing circuit board having defective pre-soldering bump.
  13. Marxer,Norbert; Gross,Kenneth P.; Altendorfer,Hubert; Kren,George, Process and assembly for non-destructive surface inspections.
  14. Basler Norbert,DEX ; Fiedler Jorg,DEX ; Hayes Bryan,DEX ; Hermann Frank,DEX, Process and device for the optical testing of a surface.
  15. Mehdi Vaez-Iravani ; Stanley Stokowski ; Guoheng Zhao, Sample inspection system.
  16. Vaez Iravani,Mehdi; Stokowski,Stanley; Zhao,Guoheng, Sample inspection system.
  17. Vaez Iravani,Mehdi; Stokowski,Stanley; Zhao,Guoheng, Sample inspection system.
  18. Vaez Iravani,Mehdi; Stokowski,Stanley; Zhao,Guoheng, Sample inspection system.
  19. Vaez-Iravani Mehdi ; Stokowski Stanley ; Zhao Guoheng, Sample inspection system.
  20. Vaez-Iravani, Mehdi; Stokowski, Stanley; Zhao, Guoheng, Sample inspection system.
  21. Vaez-Iravani, Mehdi; Stokowski, Stanley; Zhao, Guoheng, Sample inspection system.
  22. Vaez-Iravani, Mehdi; Stokowski, Stanley; Zhao, Guoheng, Sample inspection system.
  23. Vaez-Iravani, Mehdi; Stokowski, Stanley; Zhao, Guoheng, Sample inspection system.
  24. Krishnan, Shankar; Pohlhammer, Christopher M.; Green, Michael P., Substrate thickness determination.
  25. Galuga Marta A. ; Glaspy ; Jr. Jay A., System for handling defects produced during the automated assembly of palletized elements.
  26. Biellak, Steve; Stokowski, Stanley E.; Vaez-Iravani, Mehdi, Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination.
  27. Biellak,Steve; Stokowski,Stanley E.; Vaez Iravani,Mehdi, Systems and methods for a wafer inspection system using multiple angles and multiple wavelength illumination.
  28. Almogy, Gilad; Mazaki, Hadar; Phillip, Zvi Howard; Reinhorn, Silviu; Goldberg, Boris; Some, Daniel I., Variable angle illumination wafer inspection system.
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