초록 ▼

A method and means for detecting the presence of infrared radiation and/or the presence of an optical dielectric transmitting element, such as a lens or window, is provided. By correlating the radiation wavelength with a visible detector wavelength and a specific dielectric element, the element can

A method and means for detecting the presence of infrared radiation and/or the presence of an optical dielectric transmitting element, such as a lens or window, is provided. By correlating the radiation wavelength with a visible detector wavelength and a specific dielectric element, the element can be identified or the alignment of a beam of radiation passing through the element can be established. In some cases the presence of a quiescent radiation device can be deduced from the identification of the dielectric element.

대표청구항 ▼

In a system for detecting the presence of polycrystalline nonlinear optical materials typically used as optical transmission elements in an infrared detection system in a military environment, the system for detecting comprising: means for irradiating said infrared detection system with a Q-switched

In a system for detecting the presence of polycrystalline nonlinear optical materials typically used as optical transmission elements in an infrared detection system in a military environment, the system for detecting comprising: means for irradiating said infrared detection system with a Q-switched laser beam in which said laser beam wavelengths are longer than visible spectrum wavelengths and in which nonlinear action of said optical transmission elements when irradiated with said Q-switched laser beam generates characteristic harmonic radiation in the visible spectrum; means for detecting said characteristic harmonic radiation reradiated from said infrared detection system; and means for identifying said polycrystalline nonlinear optical materials by including a bandpass filter means on the detecting means to pass only photons in a narrow band of visible wavelengths which identify the generated characteristic harmonic radiation of said optical materials normally used in said infrared detection systems and of the infrared radiation source of said detection systems.