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Method for erosion detection of a sputtering target and target arrangement 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • C23C-014/34
출원번호 US-0324210 (1989-03-15)
우선권정보 CH-0000207 (1986-12-23)
발명자 / 주소
  • Wegmann Urs (Balzers LIX)
출원인 / 주소
  • Balzers Aktiengesellschaft (Balzers LIX 03)
인용정보 피인용 횟수 : 22  인용 특허 : 6

초록

A device to detect erosion of a target surface of sputtering sources in cathode sputtering layouts which has a target with at least one sensor at a predetermined position which is unchanged during the cathode sputtering process, directly detects the eroding of the target at a predetermined location.

대표청구항

A method for detecting a predetermined depth of erosion within a target of a sputtering source for cathode sputtering process, comprising the steps of: monitoring a physical value, which physical value is steadily changing as a function of depth or erosion within said target using a sensor outputtin

이 특허에 인용된 특허 (6)

  1. Holland Leslie (Crowley GB2), Control of deposition of thin films.
  2. Turner Frederick T. (Sunnyvale CA), Deposition rate regulation by computer control of sputtering systems.
  3. Meckel Benjamin B. (Del Mar CA) Bromley Emily I. (Del Mar CA), Magnetron sputtering of magnetic materials.
  4. Wilmanns Ingo G. (Gelsdorf DEX), Method and apparatus for regulating evaporating rate and layer build up in the production of thin layers.
  5. Landau Richard F. (Morgan Hill CA), Method for operating a magnetron sputtering apparatus.
  6. Gillery F. Howard (Allison Park PA), Method of and apparatus for control of reactive sputtering deposition.

이 특허를 인용한 특허 (22)

  1. Szczyrbowski Joachim,DEX ; Teschner Gotz,DEX, Apparatus for coating a substrate by chemical vapor deposition.
  2. Jaso, Mark A.; Gilton, Terry L., Apparatus, method and system for monitoring chamber parameters associated with a deposition process.
  3. Fischer, Markus; Karcher, Wolfram; Jeansannetas, Barbara, Backing plate for a sputter target, sputter target, and sputter device.
  4. Jaso, Mark A., Device for measuring the profile of a metal film sputter deposition target, and system and method employing same.
  5. Miller, Steven A.; Gaydos, Mark; Shekhter, Leonid N.; Gulsoy, Gokce, Dynamic dehydriding of refractory metal powders.
  6. Miller, Steven A.; Kumar, Prabhat; Wu, Richard; Sun, Shuwei; Zimmermann, Stefan; Schmidt-Park, Olaf, Fine grained, non banded, refractory metal sputtering targets with a uniformly random crystallographic orientation, method for making such film, and thin film based devices and products made therefrom.
  7. Ivanov,Eugene Y.; Smathers,David B.; Wickersham, Jr.,Charles E.; Poole,John E., High purity sputter targets with target end-of-life indication and method of manufacture.
  8. Dary, Francois-Charles; Gaydos, Mark; Loewenthal, William; Miller, Steven A.; Rozak, Gary; Volchko, Scott Jeffrey; Zimmermann, Stefan; Stawovy, Michael Thomas, Large-area sputtering targets.
  9. Chang,Hui Wen; Chao,Chang Hui; Wu,Hong Yi, Method and system for target lifetime.
  10. Wickersham, Jr.,Charles E.; Workman,David P., Method of forming a sputtering target assembly and assembly made therefrom.
  11. Miller, Steven A.; Shekhter, Leonid N.; Zimmermann, Stefan, Methods of joining metallic protective layers.
  12. Loewenthal, William; Miller, Steven Alfred, Methods of manufacturing large-area sputtering targets.
  13. Volchko, Scott Jeffrey; Loewenthal, William; Zimmermann, Stefan; Gaydos, Mark; Miller, Steven Alfred, Methods of manufacturing large-area sputtering targets using interlocking joints.
  14. Volchko, Scott Jeffrey; Loewenthal, William; Zimmermann, Stefan; Gaydos, Mark; Miller, Steven Alfred, Methods of manufacturing large-area sputtering targets using interlocking joints.
  15. Hsiao, Yi-Li; Hwang, Jerry; Sheu, Jyh-Cherng; Sheu, Lawrance; Wang, Jean; Yu, Chen-Hua, PVD target with end of service life detection capability.
  16. Hsiao, Yi-Li; Yu, Chen-Hua; Wang, Jean; Sheu, Lawrance, PVD target with end of service life detection capability.
  17. Hsiao, Yi-Li; Yu, Chen-Hua; Wang, Jean; Sheu, Lawrance, PVD target with end of service life detection capability.
  18. Scheible, Kathleen; Flanigan, Michael Allen; Yoshidome, Goichi; Allen, Adolph Miller; Pavloff, Cristopher M., Process kit and target for substrate processing chamber.
  19. Allen, Adolph Miller; Yoon, Ki Hwan; Guo, Ted; Yang, Hong S.; Yu, Sang-Ho, Sputtering target having increased life and sputtering uniformity.
  20. Ritchie, Alan Alexander; Young, Donny; Hong, Ilyoung (Richard); Scheible, Kathleen A.; Kelkar, Umesh, Target for sputtering chamber.
  21. Wollenberg Norbert,DEX, Target for the sputtering cathode of a vacuum coating apparatus and method for its manufacture.
  22. Lee Seh Kwang,KRX ; Egermeier John, Target misalignment detector.
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