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Temperature control instrument for electronic components under test 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-031/02
  • F28F-007/00
출원번호 US-0263232 (1988-10-27)
우선권정보 IE-0002886 (1987-10-28); IE-0000713 (1988-03-11)
발명자 / 주소
  • Burton David P. (Parteen IEX) Dillon Paul A. (Foxrock IEX) Stephenson Malcolm I. (Adare IEX)
출원인 / 주소
  • Irish Transformers Limited (Limerick IEX 03)
인용정보 피인용 횟수 : 82  인용 특허 : 8

초록

An instrument (1) for controlling the temperature of electronic components (20) under test creates a testing environment in an enclosure within which a component contacts directly the active face of a set of back-to-back Peltier cells (50). Heating and cooling of the component (20) under test is rea

대표청구항

A temperature control instrument for an electronic component under test comprising: a body; a testing enclosure in said body for the component; a socket means mounted within said testing enclosure for the reception of the component; a thermoelectric device for heating or cooling said enclosure, said

이 특허에 인용된 특허 (8)

  1. Henderson G. Douglas (Orlando FL), Apparatus for heating and cooling devices under test.
  2. Jenner Frank H. (Hertfordshire GBX) White Ricki E. (Bedfordshire GBX) Thompson Patrick C. (Hertfordshire GBX), Electrical interface arrangement.
  3. Demand Erhart E. (Boston MA), Electrical testing system including plastic window test chamber and method of using same.
  4. Santomango Anthony (West Peabody MA) Hatheway ; Jr. Nicholas N. (Newbury MA), Electronic burn-in system.
  5. Swiatosz Edmund (Maitland FL), Integrated circuit temperature gradient and moisture regulator.
  6. Eager George (Cambridge MA) Selverstone Pater (Cambridge MA), Temperature control for device under test.
  7. Flatley Robert (Ashland MA) Hobson David (Waltham MA), Test fixture for tab circuits and devices.
  8. Trachtenberg Leonard (512 Pleasant Valley Rd. West Orange NJ 07052) Trachtenberg Peter W. (P.O. Box 505 R.D. #2 Branchville NJ 07826), Vehicle thermoelectric cooling and heating food and drink appliance.

이 특허를 인용한 특허 (82)

  1. Turner, Jonathan E., Active power monitoring using externally located current sensors.
  2. Fredeman, John A.; Gardell, David L.; Knox, Marc D.; LaForce, Mark R., Actively controlled heat sink for convective burn-in oven.
  3. Mark K. Hilmoe, Apparatus and method for inverting an IC device.
  4. Johnson James E. ; Darcy Ronald J., Apparatus capable of high power dissipation during burn-in of a device under test.
  5. Malinoski, Mark F.; Jones, Thomas P.; Annis, Brian; Turner, Jonathan E., Apparatus, method and system of liquid-based, wide range, fast response temperature control of electric devices.
  6. Mark F. Malinoski ; Thomas P. Jones ; Brian Annis ; Jonathan E. Turner, Apparatus, method and system of liquid-based, wide range, fast response temperature control of electronic device.
  7. Johnson, James E.; Darcy, Ronald J., Burn-in board with adaptable heat sink device.
  8. Dunklee, John, Chuck for holding a device under test.
  9. Dunklee, John, Chuck for holding a device under test.
  10. Dunklee, John, Chuck for holding a device under test.
  11. Dunklee,John, Chuck for holding a device under test.
  12. Dunklee,John, Chuck for holding a device under test.
  13. Dunklee,John, Chuck for holding a device under test.
  14. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
  15. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
  16. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
  17. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  18. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
  19. Hamilton, Harold E.; Conroy, Chad M., Cooling air flow control valve for burn-in system.
  20. Hamilton,Harold E.; Conroy,Chad M., Cooling air flow control valve for burn-in system.
  21. Liu, Yu-Ching; Yu, Chi-An; Li, Xi-Hang; Liu, Bing; Xu, Bo; Kang, Jie-Peng, Cooling device for cooling electronic components.
  22. Saito,Noboru; Takahashi,Hiroyuki; Igarashi,Noriyuki; Fukumoto,Keiichi; Nakamura,Hiroto; Watanabe,Yutaka; Shimada,Kenichi, Cooling fin connected to a cooling unit and a pusher of the testing apparatus.
  23. Smith Kenneth R., Fine pitch contact device employing a compliant conductive polymer bump.
  24. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
  25. Dunklee,John; Norgden,Greg; Cowan,C. Eugene, Guarded tub enclosure.
  26. Okamoto, Tomomi; Yamada, Hiroshi, Heat sink and electronic apparatus provided with heat sink.
  27. Okamoto, Tomomi; Yamada, Hiroshi; Ito, Ryuji; Higashi, Osamu, Heat sink for measuring temperature of electronic component.
  28. Kou Chih Hsien,TWX, Heat sink having an assembling device.
  29. Tustaniwskyj, Jerry Ihor; Babcock, James Wittman, Initial contact method of preventing an integrated circuit chip from being thermally destroyed, in a tester, due to a defective pressed joint.
  30. Ryu,Je hyoung; Kim,Tae gyu; Lee,Jun ho; Lee,Sung jin; Lee,Hong yong, Inspecting apparatus having a radiator to radiate heat from a semiconductor device.
  31. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
  32. Baker, III, Rex, Interruptible thermal bridge system.
  33. McFadden,Bruce, Localizing a temperature of a device for testing.
  34. Burward-Hoy Trevor, Method and apparatus for rapidly varying the operating temperature of a semiconductor device in a testing environment.
  35. Jean Luc Pelissier ; Thomas P. Jones ; Jonathan E. Turner ; Mark F. Malinoski, Method and apparatus for temperature control of a device during testing.
  36. Pelissier, Jean Luc, Method and apparatus for temperature control of a device during testing.
  37. Rennies Jos,BEX ; Noels Barts,BEX, Method and apparatus for temperature-controlled testing of integrated circuits.
  38. Gaasch, Thomas Francis; Trieu, Thanh, Method for controlling the temperature of an electronic component under test.
  39. Harris,Daniel L.; McCann,Peter R., Optical testing device.
  40. Hunt,Dean M.; Haga,Don, Optical testing of integrated circuits with temperature control.
  41. Sunohara, Masahiro; Higashi, Mitsutoshi, Probe device.
  42. Nordgren, Greg; Dunklee, John, Probe station.
  43. Schwindt Randy (Portland OR), Probe station having conductive coating added to thermal chuck insulator.
  44. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
  45. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  46. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
  47. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
  48. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  49. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
  50. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  51. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
  52. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
  53. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  54. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
  55. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
  56. Lesher, Timothy E., Probe testing structure.
  57. Lesher,Timothy E., Probe testing structure.
  58. Maxwell Martin M. ; Weinstein Dan, Setup for testing an integrated circuit in a semiconductor chip wherein the temperature of the semiconductor chip is controlled.
  59. Hamilton, Harold E.; Conroy, Chad M.; Bloch, Brian R., Shutters for burn-in-board connector openings.
  60. Dunklee,John, Switched suspended conductor and connection.
  61. Dunklee,John, Switched suspended conductor and connection.
  62. Yip,Tsunwai Gary; Nguyen,David, System for controlling the temperature of electronic devices.
  63. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  64. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
  65. Andrews, Peter; Hess, David, System for testing semiconductors.
  66. Gaasch, Thomas Francis; Trieu, Thanh, Temperature control device for an electronic component.
  67. Jones, Thomas P.; Turner, Jonathan E.; Malinoski, Mark F., Temperature control of electronic devices using power following feedback.
  68. Thomas P. Jones ; Jonathan E. Turner ; Mark F. Malinoski, Temperature control of electronic devices using power following feedback.
  69. Duchatelet Roland,BEX ; Hiligsmann Vincent,BEX ; Diels Roger,BEX, Temperature control system.
  70. Roland Duchatelet BE; Vincent Hiligsmann BE; Roger Diels BE, Temperature control system.
  71. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
  72. Scocchetti, Fabrizio, Test board with local thermal conditioning elements.
  73. Hong, Jun-Pyo, Test sockets having peltier elements, test equipment including the same and methods of testing semiconductor packages using the same.
  74. Schweiger,Dieter; W체rzinger,Mathias, Testing device with a contact for connecting to a contact of a semiconductor component.
  75. Rumbaugh,Scott, Thermal optical chuck.
  76. Rumbaugh,Scott, Thermal optical chuck.
  77. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
  78. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  79. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
  80. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
  81. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
  82. Hilmoe Mark K. ; Jones Thomas P. ; Annis Brian G. ; Malinoski Mark F., transportation and active temperature control of integrated circuits for test.
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