초록 ▼

An infrared microscope is disclosed which provides illumination for reflectance by the sample. This illumination follows a path through the objective toward the sample, and again, after reflection, through the objective toward the detector. The reflectance illumination is directed toward the objecti

An infrared microscope is disclosed which provides illumination for reflectance by the sample. This illumination follows a path through the objective toward the sample, and again, after reflection, through the objective toward the detector. The reflectance illumination is directed toward the objective and sample by a fully reflective mirror, which injects approximately half of the interferometer beam into the microscope, and permits substantially all of the reflected beam to reach the detector.

대표청구항 ▼

In an optical instrument having a sample supported in the instrument, a fully-reflecting objective, means for observing visible radiation at the sample location, a detector of infrared radiation, and means for causing a post-interferometer infrared radiation beam to enter the instrument, an infrared

In an optical instrument having a sample supported in the instrument, a fully-reflecting objective, means for observing visible radiation at the sample location, a detector of infrared radiation, and means for causing a post-interferometer infrared radiation beam to enter the instrument, an infrared optical system combining transmission mode and reflectance mode functions, comprising: transmission mode means for directing the post-interferometer radiation beam into and completely through the objective from one direction for transmission illumination of the sample; reflectance mode means for directing the post-interferometer infrared radiation beam into and completely through the objective from the opposite direction for reflectance illumination of the sample; the reflectance mode means including a beamsplitter which (a) incorporates a fully reflecting mirror, (b) is located at a distance from the objective, and (c) causes approximately half of the interferometer infrared radiation beam to pass through the objective to be reflected by the sample; and means for directing substantially an entire sample-reflected radiation to the detector.