$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

Process and apparatus for the automatic non-contact surface inspection of cylindrical parts 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01N-021/88
출원번호 US-0404239 (1989-09-07)
우선권정보 DE-3831401 (1988-09-15)
발명자 / 주소
  • Karafa Nandor (Wuppertal DEX) Liebers Lutz (Essen DEX)
출원인 / 주소
  • Alfred Teves GmbH (Frankfurt Am Main DEX 03)
인용정보 피인용 횟수 : 34  인용 특허 : 7

초록 ▼

A process and an apparatus for its realization are provided for an automatic non-contact surface inspection of cylindrical parts. The parts under inspection are imparted a rotary motion about their axis of symmetry and are exposed to largely parallel light whose diffused portion reflected by the sur

대표청구항 ▼

An apparatus for the automatic non-contact surface inspection of cylindrical parts comprising, in combination: a slewing mechanism (2) driven by an electric motor and accommodating said parts (1) to be inspected; at least one source of light (3, 4) to illuminate said part (1) to be inspected; at lea

이 특허에 인용된 특허 (7)

  1. Puffer Leroy G. (Vernon CT) Waters James P. (Ellington CT), Apparatus and method for monitoring the surface character of circular objects.
    상세보기
  2. Fukuchi Hiroyuke (Tokyo JPX) Nishiyama Masatoshi (Tokyo JPX) Sugawara Yukio (Tokyo JPX), Apparatus for detecting defects on bottle mouth with screw thread.
    상세보기
  3. Fukuchi Hiroyuki (Tokyo JPX), Apparatus for inspecting sidewall of bottle.
    상세보기
  4. Petrohilos Harry G. (Yellow Springs OH) Taylor Francis M. (Xenia OH), Light beam shape control in optical measuring apparatus.
    상세보기
  5. Buckson Gerald I. (Wilmington DE), Method and apparatus for optically inspecting cylindrical articles.
    상세보기
  6. Eichenberger Werner (Zrich CHX), Photoelectrical bobbin feeler.
    상세보기
  7. Harris David E. (Columbus OH) Watson Robert M. (Columbus OH) Redmyer John D. (Columbus OH), Reticle calibrated diameter gauge.
    상세보기

이 특허를 인용한 특허 (34)

  1. Belanger,Paul, Apparatus and method for inspecting containers.
    상세보기
  2. Spalding, John D., Calibration device for use in an optical part measuring system.
    상세보기
  3. Spalding, John D., Calibration device for use in an optical part measuring system.
    상세보기
  4. Kujacznski, Nathan Andrew-Paul; St. Onge, James W.; Nygaard, Michael G., High speed method and system for inspecting a stream of parts.
    상세보기
  5. Kujacznski, Nathan Andrew-Paul; St. Onge, James W.; Nygaard, Michael G., High speed method and system for inspecting a stream of parts at a pair of inspection stations.
    상세보기
  6. Fleming, Christopher C.; Nygaard, Michael G., High-resolution imaging and processing method and system for determining a geometric dimension of a part.
    상세보기
  7. Fleming, Christopher C.; Nygaard, Michael G., High-resolution imaging and processing method and system for increasing the range of a geometric dimension of a part that can be determined.
    상세보기
  8. Kujacznski, Nathan Andrew-Paul; Nygaard, Michael G., High-speed, high-resolution, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts.
    상세보기
  9. Nygaard, Michael G., High-speed, triangulation-based, 3-D method and system for inspecting manufactured parts and sorting the inspected parts.
    상세보기
  10. Nygaard, Michael G.; Nygaard, Gregory M.; Nygaard, George M.; Spalding, John D., Method and system for automatically inspecting parts and for automatically generating calibration data for use in inspecting parts.
    상세보기
  11. Nygaard, Gregory M.; Strickland, David A., Method and system for centering and aligning manufactured parts of various sizes at an optical measurement station.
    상세보기
  12. Nygaard, Michael G.; St. Onge, James W.; Kujacznski, Nathan Andrew-Paul; Poletti, Laura L., Method and system for inspecting a manufactured part at an inspection station.
    상세보기
  13. Nygaard, Michael G., Method and system for inspecting parts utilizing triangulation.
    상세보기
  14. Nygaard, Michael G.; Poletti, Laura L., Method and system for optically inspecting a manufactured part at a single inspection station having a measurement axis.
    상세보기
  15. Offenborn, Robert Joseph; Alexander, Christopher Michael; Nygaard, Gregory Martin; Nygaard, Michael George, Method and system for optically inspecting headed manufactured parts.
    상세보기
  16. Offenborn, Robert Joseph; Alexander, Christopher Michael; Nygaard, Gregory Martin; Nygaard, Michael George, Method and system for optically inspecting headed manufactured parts.
    상세보기
  17. Nygaard, Michael G., Method and system for optically inspecting manufactured rounds of ammunition or cylindrical components of the rounds to obtain rounds which exhibit superior accuracy when fired.
    상세보기
  18. Nygaard, Michael G., Method and system for optically inspecting outer peripheral surfaces of parts.
    상세보기
  19. Nygaard, Michael G., Method and system for optically inspecting parts.
    상세보기
  20. Nygaard, Michael G., Method and system for optically inspecting parts.
    상세보기
  21. Nygaard, Michael G.; Kujacznski, Nathan Andrew-Paul, Method and system for optically inspecting parts.
    상세보기
  22. Nygaard, Michael G.; Nygaard, Gregory M.; Nygaard, George M.; Spalding, John D., Method and system for optically inspecting parts.
    상세보기
  23. Walstra, Eric M., Method and system for optically inspecting parts.
    상세보기
  24. Nygaard, Michael G., Method and system for optically inspecting the ends of a manufactured part at a single inspection station having a measurement axis.
    상세보기
  25. Spalding, John D., Method for estimating thread parameters of a part.
    상세보기
  26. Spalding, John D.; Walstra, Eric M., Method for precisely measuring position of a part to be inspected at a part inspection station.
    상세보기
  27. Nygaard, Michael G.; Kujacznski, Nathan Andrew-Paul, Non-contact method and system for inspecting a manufactured part at an inspection station having a measurement axis.
    상세보기
  28. Spalding, John D.; Bourget, Paul L.; Brunt, Jr., Harold W., Optical modules and method of precisely assembling same.
    상세보기
  29. Crowther, David, Profile inspection system for threaded and axial components.
    상세보기
  30. Andreacchi, Anthony S.; Chen, Yung-Ming; Currlin, Arnoldo M.; Garcia, Antonio; Van Sciver, Jason; Glenn, Bryan D., System and method for coating a stent.
    상세보기
  31. Lee, Brett J.; McLean, Jacob A.; Nygaard, Michael G., System for indirectly measuring a geometric dimension related to an opening in an apertured exterior surface of a part based on direct measurements of the part when fixtured at a measurement station.
    상세보기
  32. Cameron, Ian; Maw, Andrew David Coppin; Zhang, Hong; Wloka, Calden; Watterodt, Sidney; Park, Sang joon; Andreacchi, Anthony S.; Chen, Yung-Ming; Currlin, Arnoldo M.; Garcia, Antonio; Van Sciver, Jason; Glenn, Bryan D., Systems and methods for inspection of stents.
    상세보기
  33. Cameron, Ian; Maw, Andrew David Coppin; Zhang, Hong; Wloka, Calden; Watterodt, Sidney; Park, Sang joon; Andreacchi, Anthony S.; Chen, Yung-Ming; Currlin, Arnoldo M.; Garcia, Antonio; Van Sciver, Jason; Glenn, Bryan D., Systems and methods for the inspection of cylinders.
    상세보기
  34. Sheppard, Scott Steven; Lambdin, James Richard, Technologies for identifying defects.
    상세보기

관련 콘텐츠

섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로