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Dry etch process for forming champagne profiles, and dry etch apparatus 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • H01L-021/312
  • B44C-001/22
  • C03C-015/00
  • C03C-025/06
출원번호 US-0472327 (1990-01-30)
발명자 / 주소
  • Kurasaki Howard S. (San Jose CA) Westlund Barbara F. (Saratoga CA) Nulty James E. (San Jose CA) Vowles E. John (Deering NH)
출원인 / 주소
  • General Signal Corporation (Stamford CT 02)
인용정보 피인용 횟수 : 47  인용 특허 : 2

초록

A two-step process for forming champagne profiles on semiconductor wafers that provide, when metallized, good reliability, microcracking-free contacts and vias is disclosed. Dry etch apparatus having electrodes in a triode configuration, two plasma forming regions, and a pressure control system oper

대표청구항

A process for fabricating champagne profiles in a layer previously applied to a substrate by the steps comprising: controllably producing a first plasma bearing charged and neutral species in a reaction vessel and in such a manner that the first plasma is electrically and physically isolated from th

이 특허에 인용된 특허 (2)

  1. Fior Gianni O. (Albany CA), Plasma etch isotropy control.
  2. Otsubo Toru (Fujisawa JPX) Yamaguchi Yasuhiro (Chigasaki JPX) Takeuchi ; deceased Takahiko (late of Tokyo JPX by Kinichi Takeuchi ; legal representative), Plasma processing apparatus.

이 특허를 인용한 특허 (47)

  1. Donohoe Kevin G., Apparatus and method for improving uniformity in batch processing of semiconductor wafers.
  2. Donohoe Kevin G., Apparatus and method for improving uniformity in batch processing of semiconductor wafers.
  3. Chen, Chen-An; Gelatos, Avgerinos; Yang, Michael X.; Xi, Ming; Hytros, Mark M., Apparatus and method for plasma assisted deposition.
  4. Berkoh, Daniel K.; Woodard, Elena B.; Scott, Dean G., Apparatus and methods for shielding a plasma etcher electrode.
  5. Ueda, Masahisa; Kurimoto, Takashi; Ishikawa, Michio; Suu, Koukou; Yogo, Toshiya, Ashing apparatus.
  6. Mohammad Kamarehi ; Gerald M. Cox, Downstream sapphire elbow joint for remote plasma generator.
  7. Tabara Suguru,JPX, Dry etching suppressing formation of notch.
  8. Maraschin Robert ; Shufflebotham Paul Kevin ; Barnes Michael Scott, Electrostatic clamp with lip seal for clamping substrates.
  9. Grewal Virinder S. (Fishkill NY) Laux Volker B. (Munich DEX), Etch chamber having three independently controlled electrodes.
  10. Muller K. Paul ; Ranade Rajiv M. ; Schmitz Stefan, Formation of a bottle shaped trench.
  11. Benjamin Neil ; Hylbert Jon ; Mangano Stefano, High flow vacuum chamber including equipment modules such as a plasma generating source, vacuum pumping arrangement and.
  12. Tzu, Gwo-Chuan; Umotoy, Salvador P., Lid assembly for a processing system to facilitate sequential deposition techniques.
  13. Shufflebotham Paul Kevin ; Barnes Michael Scott, Low voltage electrostatic clamp for substrates such as dielectric substrates.
  14. Klippert ; II Walter E ; Kadavanich Vikorn Martin,DEX, Method and apparatus for improving accuracy of plasma etching process.
  15. Klippert II Walter E ; Kadavanich Vikorn Martin,DEX, Method and apparatus for improving accuracy of plasma etching process.
  16. Hong Soonil ; Ryu Choon Kun ; Nault Michael P. ; Singh Kaushal K. ; Lam Anthony ; Rana Virendra V. S. ; Conners Andrew, Method and apparatus for improving gap-fill capability using chemical and physical etchbacks.
  17. Hong Soonil ; Ryu Choon Kun ; Nault Michael P. ; Singh Kaushal K. ; Lam Anthony ; Rana Virendra V. S. ; Conners Andrew, Method and apparatus for improving gap-fill capability using chemical and physical etchbacks.
  18. Gessner, Thomas; Bertz, Andreas; Schubert, Reinhard; Werner, Thomas; Hentsch, Wolfgang; Fendler, Reinhard; Koehler, Lutz, Method and apparatus for structuring components made of a material composed of silicon oxide.
  19. Lukins Ronald E. (Whittier CA) Bell ; III Daniel R. (Riverside CA), Method and system for enhancing the surface of a material for cleaning, material removal or as preparation for adhesive.
  20. Khajehnouri Keyvan ; Nguyen Thomas D. ; Mueller George, Method for etching silicon dioxide using fluorocarbon gas chemistry.
  21. Donohoe, Kevin G., Method for improving uniformity in batch processing of semiconductor wafers.
  22. Giordani, Sara, Method of etching a shaped cavity.
  23. Kwak Noh Jung,KRX ; Kim Choon Hwan,KRX, Method of forming a contact hole of a semiconductor device.
  24. Zhu Helen ; Lindquist Roger F., Method of plasma etching dielectric materials.
  25. Li,Si Yi; Zhu,Helen H.; Sadjadi,S. M. Reza; Tietz,James V.; Helmer,Bryan A., Method of plasma etching low-k dielectric materials.
  26. Ni, Tuqiang; Jiang, Weinan; Chiang, Conan; Lin, Frank Y.; Lee, Chris; Lee, Dai N., Method of plasma etching organic antireflective coating.
  27. Naik Mehul ; Broydo Samuel, Method of producing an interconnect structure for an integrated circuit.
  28. Naik, Mehul; Broydo, Samuel, Method of producing an interconnect structure for an integrated circuit.
  29. Winniczek Jaroslaw W. ; Dassapa M. J. Francois Chandrasekar ; Hudson Eric A. ; Wiepking Mark, Methods and apparatus for determining an etch endpoint in a plasma processing system.
  30. Winniczek, Jaroslaw W.; Dassapa, M. J. Francois Chandrasekar; Hudson, Eric A.; Wiepking, Mark, Methods and apparatus for determining an etch endpoint in a plasma processing system.
  31. Berkoh, Daniel Kwadwo Amponsah; Woodard, Elena Becerra; Scott, Dean G., Methods for etching through-wafer vias in a wafer.
  32. Berkoh, Daniel Kwadwo Amponsah; Woodard, Elena Becerra; Scott, Dean G., Methods for shielding a plasma etcher electrode.
  33. Berkoh, Daniel Kwadwo Amponsah; Woodard, Elena Becerra; Scott, Dean G., Methods of measuring electrical characteristics during plasma etching.
  34. Kamarehi Mohammad ; Cox Gerald M., Microwave choke for remote plasma generator.
  35. Cheng David ; Chang Mei, Passive shield for CVD wafer processing which provides frontside edge exclusion and prevents backside depositions.
  36. Kenney, Mark D., Perimeter seal for backside cooling of substrates.
  37. Ni, Tuqiang; Li, Lumin, Plasma etching of dielectric layer with etch profile control.
  38. Keil, Douglas; Bowers, Jim; Wagganer, Eric; Annapragada, Rao; Le, Tri, Plasma etching of organic antireflective coating.
  39. Eppler, Aaron; Srinivasan, Mukund; Chebi, Robert, Process for etching dielectric films with improved resist and/or etch profile characteristics.
  40. Mohammad Kamarehi ; Gerald M. Cox, Remote plasma generator with sliding short tuner.
  41. Mohammad Kamarehi ; Gerald M. Cox, Remote plasma mixer.
  42. Kiehlbauch, Mark; Taylor, Ted, Selective etch chemistries for forming high aspect ratio features and associated structures.
  43. Kiehlbauch, Mark; Taylor, Ted Lyle, Selective etch chemistries for forming high aspect ratio features and associated structures.
  44. Matsui, Takayuki; Nagano, Hajime, Semiconductor manufacturing apparatus and manufacturing method of semiconductor device.
  45. Maher Joseph A. ; Vowles E. John ; Napoli Joseph D. ; Zafiropoulo Arthur W. ; Miller Mark W., System for processing substrates.
  46. Turgut Sahin ; Salvador Umotoy ; Avi Tepman ; Ronald Lloyd Rose, Temperature controlled gas distribution plate.
  47. Benjamin Neil ; Hylbert Jon ; Mangano Stefano, Universal vacuum chamber including equipment modules such as a plasma generating source, vacuum pumping arrangement and.
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