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Apparatus for objectively grading centering condition of a stamp 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G06K-009/32
출원번호 US-0408684 (1989-09-18)
발명자 / 주소
  • Purdum Jack (7650 Rutherglen Way Indianapolis IN 46254)
인용정보 피인용 횟수 : 31  인용 특허 : 8

초록

A philatelic stamp grading invention includes image digitizing hardware for creating a two-dimensional array of data bytes corresponding to the digitized image of the stamp. A computer executes a program which analyzes the stamp image data and determines the minimum border width of each side of the

대표청구항

A method for determining the centering condition of a vignette surrounded by a rectangular border having perforation markings at the outermost edges of said border, said method comprising the steps of: (a) digitizing an image of said vignette and said border to produce a pixel data file; (b) analyzi

이 특허에 인용된 특허 (8)

  1. Kurose Morisumi (Yokohama JPX), Document image processing system.
  2. Sueda Tetsuo (Chofu JPX) Ando Toshinori (Yokohama JPX), Document sheet size or position recognition device.
  3. Bolza-Schnemann Claus A. (Wrzburg DEX), Edge location measuring head.
  4. Grosvernier Claude-Arnold (Hauterive CHX), Method and apparatus for checking the width and parallelism of margins following centering of a print with respect to a.
  5. Offt Alan M. (Clifton Park NY) Jackson ; Jr. Robert L. (Schenectady NY) Kraft Russell P. (Averill Park NY) Wagner John F. (Guilderland NY), Method and apparatus for determining the position of a feature of an object.
  6. Ototake Taro (Kanagawa JPX) Ishizeki Tatsumi (Saitama JPX), Method and apparatus for measuring positions on the surface of a flat object.
  7. Terui Hiroshi (Kawasaki JPX), Pattern detecting method and apparatus.
  8. Hamashima Muneki (Tokyo JPX) Kato Kinya (Tokyo JPX), Pattern position detection apparatus using laser beam.

이 특허를 인용한 특허 (31)

  1. Kass, Stephen Brent; Korbel, Edward; Barbakow, Daniel R.; Cook, Robert Alan; Blauzvern, Hayden; Shao, Megan; Teng, Ben; Thaker, Avi, Computerized technical authentication and grading system for collectible objects.
  2. Kass, Stephen Brent; Thaker, Avi; Korbel, Edward; Barbakow, Daniel R.; Cook, Robert Alan; Maxwell, Scot; Aplin, Kate; Blauzvern, Hayden; Shao, Megan; Teng, Ben, Computerized technical authentication and grading system for collectible objects.
  3. Hussain, Khalid, Customized item cover.
  4. Hussain, Khalid, Digital cancellation mark.
  5. Sternberg,Stanley; Dargel,William; Lennington,John W; Voiles,Thomas, Digital media recognition apparatus and methods.
  6. Sternberg, Stanley R.; Dargel, William; Lennington, John W.; Voiles, Thomas, Image recognition methods.
  7. Harrington,Steven J.; Gloger,Paul B.; Omega,Noel S.; Orlov,Leonid; Wenn, II,John C.; Manchala,Daniel W.; Jhong,Yoon J.; Seo,Youngseok, Method for determining overall effectiveness of a document.
  8. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., Method for measuring and quantizing document quality.
  9. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., Method for measuring and quantizing document quality.
  10. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., Method for measuring and quantizing document quality.
  11. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., Method for measuring and quantizing document quality.
  12. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., Method for measuring and quantizing document quality.
  13. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., Method for measuring and quantizing document quality.
  14. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., Method for measuring and quantizing document quality.
  15. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., Method for measuring and quantizing document quality.
  16. Harrington, Steven J.; Gloger, Paul B.; Omega, Noel S.; Orlov, Leonid; Wenn, II, John C.; Manchala, Daniel W.; Jhong, Yoon J.; Seo, Youngseok, Multi-versioned documents and method for creation and use thereof.
  17. Harrington, Steven J., System and method for interactive document layout.
  18. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  19. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  20. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  21. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  22. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  23. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  24. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  25. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  26. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  27. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  28. Harrington,Steven J.; Naveda,Jose Fernando; Jones,Rhys Price; Sarr,Nathan; Thakkar,Nishant Atul; Roetling,Paul G., System and method for measuring and quantizing document quality.
  29. Purvis,Lisa S.; Harrington,Steven J.; Rolleston,Robert J.; Ellefson,Jean M., System and method for proofing individual documents of variable information document runs using document quality measurements.
  30. Purvis,Lisa S.; Harrington,Steven J.; Rolleston,Robert J.; Ellefson,Jean M., System and method for proofing individual documents of variable information document runs using document quality measurements.
  31. Li, Shen-Chun; Chen, Yung-Chieh; Hsu, Shou-Kuo, System and method for structuring data in a storage device.
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