$\require{mediawiki-texvc}$

연합인증

연합인증 가입 기관의 연구자들은 소속기관의 인증정보(ID와 암호)를 이용해 다른 대학, 연구기관, 서비스 공급자의 다양한 온라인 자원과 연구 데이터를 이용할 수 있습니다.

이는 여행자가 자국에서 발행 받은 여권으로 세계 각국을 자유롭게 여행할 수 있는 것과 같습니다.

연합인증으로 이용이 가능한 서비스는 NTIS, DataON, Edison, Kafe, Webinar 등이 있습니다.

한번의 인증절차만으로 연합인증 가입 서비스에 추가 로그인 없이 이용이 가능합니다.

다만, 연합인증을 위해서는 최초 1회만 인증 절차가 필요합니다. (회원이 아닐 경우 회원 가입이 필요합니다.)

연합인증 절차는 다음과 같습니다.

최초이용시에는
ScienceON에 로그인 → 연합인증 서비스 접속 → 로그인 (본인 확인 또는 회원가입) → 서비스 이용

그 이후에는
ScienceON 로그인 → 연합인증 서비스 접속 → 서비스 이용

연합인증을 활용하시면 KISTI가 제공하는 다양한 서비스를 편리하게 이용하실 수 있습니다.

[미국특허] CAD driven microprobe integrated circuit tester 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01R-001/04
출원번호 US-0354268 (1989-05-19)
발명자 / 주소
  • Yih Christopher (Cupertino CA) Yang Tsen-Shau (Cupertino CA) Huang Kuang-Hua (Cupertino CA) Chou Ger-Chih (San Jose CA)
출원인 / 주소
  • Knights Technology, Inc. (Cupertino CA 02)
인용정보 피인용 횟수 : 102  인용 특허 : 11

초록 ▼

A system for testing integrated circuits is disclosed which uses a mechanical microprobe and the integrated circuit\s CAD database. The system is integrated with the CAD database in such a manner that after an initial alignment operation between the CAD database and the integrated circuit being test

대표청구항 ▼

A system for testing integrated circuits comprising: computer means for storing, accessing and displaying a database describing the integrated circuit being tested; microprobe means for injecting test signals into and receiving test signals from the integrated circuit; microprobe drive means compris

이 특허에 인용된 특허 (11) 인용/피인용 타임라인 분석

  1. Fulton Donald E. (Stoneham MA) Curtiss William P. (Winthrop MA) Leehey Jonathan R. (Malden MA), Adaptive induction motor controller.
    상세보기
  2. Frohlich Sigurd (Santa Barbara CA), Apparatus for automatically electrically testing printed circuit boards.
    상세보기
  3. Dixon Kenneth K. (Rancho Palos Verdes CA), Automatic component assembly machine and method relating thereto.
    상세보기
  4. Richardson Neil (Mountain View CA), Electron beam test probe system for analyzing integrated circuits.
    상세보기
  5. Crum Gerald W. (Elyria OH) Rooney Brian M. (Amherst OH), Manually programmable robot with power-assisted motion during programming.
    상세보기
  6. Stridsberg Lennart (Enskede SEX) Rodin Gunnar (Bromma SEX), Method and apparatus for calibrating a positioning system.
    상세보기
  7. Burr Robert P. (Matinicus ME) Keogh Raymond J. (Huntington NY) Morino Ronald (Sea Cliff NY) Crowell Jonathan C. (Brooklyn NY) Burr James B. (Centerport NY) Christophersen James C. (West Islip NY), Method and apparatus for testing of electrical interconnection networks.
    상세보기
  8. Epstein Daniel (Oceanside NY) Lieberman Robert (Bethpage NY), Opto-video inspection system.
    상세보기
  9. Benjamin Harry L. (1000 Brittany Hills Dr. Dayton OH 45459), Position sensing device.
    상세보기
  10. Touchton James J. (Boulder CO) Hill John P. (Broomfield CO), Resonance suppression method.
    상세보기
  11. Hendriks, Ferdinand; Taylor, Russell H., Robot precision probe positioner with guidance optics.
    상세보기

이 특허를 인용한 특허 (102) 인용/피인용 타임라인 분석

  1. Strid, Eric; Gleason, K. Reed, Active wafer probe.
    상세보기
  2. Strid,Eric; Gleason,K. Reed, Active wafer probe.
    상세보기
  3. Strid, Eric; Campbell, Richard, Calibration structures for differential signal probing.
    상세보기
  4. Dunklee, John, Chuck for holding a device under test.
    상세보기
  5. Dunklee, John, Chuck for holding a device under test.
    상세보기
  6. Dunklee, John, Chuck for holding a device under test.
    상세보기
  7. Dunklee,John, Chuck for holding a device under test.
    상세보기
  8. Dunklee,John, Chuck for holding a device under test.
    상세보기
  9. Dunklee,John, Chuck for holding a device under test.
    상세보기
  10. Stewart, Craig; Lord, Anthony; Spencer, Jeff; Burcham, Terry; McCann, Peter; Jones, Rod; Dunklee, John; Lesher, Tim; Newton, David, Chuck for holding a device under test.
    상세보기
  11. Stewart,Craig; Lord,Anthony; Spencer,Jeff; Burcham,Terry; McCann,Peter; Jones,Rod; Dunklee,John; Lesher,Tim; Newton,David, Chuck for holding a device under test.
    상세보기
  12. Andrews, Peter; Froemke, Brad; Dunklee, John, Chuck with integrated wafer support.
    상세보기
  13. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
    상세보기
  14. Andrews,Peter; Froemke,Brad; Dunklee,John, Chuck with integrated wafer support.
    상세보기
  15. Campbell, Richard; Strid, Eric W.; Andrews, Mike, Differential signal probe with integral balun.
    상세보기
  16. Strid, Eric; Campbell, Richard, Differential signal probing system.
    상세보기
  17. Campbell, Richard L.; Andrews, Michael, Differential waveguide probe.
    상세보기
  18. Burcham, Terry; McCann, Peter; Jones, Rod, Double sided probing structures.
    상세보기
  19. Burcham,Terry; McCann,Peter; Jones,Rod, Double sided probing structures.
    상세보기
  20. Dunklee, John; Norgden, Greg; Cowan, C. Eugene, Guarded tub enclosure.
    상세보기
  21. Dunklee,John; Norgden,Greg; Cowan,C. Eugene, Guarded tub enclosure.
    상세보기
  22. Andrews, Peter; Hess, David; New, Robert, Interface for testing semiconductors.
    상세보기
  23. Jensen, Lance Christopher, Layout data reduction for use with electronic design automation tools.
    상세보기
  24. McFadden,Bruce, Localizing a temperature of a device for testing.
    상세보기
  25. Gleason, K. Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
    상세보기
  26. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing method using improved contact.
    상세보기
  27. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing structure with laterally scrubbing contacts.
    상세보기
  28. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth; Lesher, Timothy; Koxxy, Martin, Membrane probing system.
    상세보기
  29. Smith,Kenneth; Gleason,Reed, Membrane probing system.
    상세보기
  30. Smith,Kenneth; Gleason,Reed, Membrane probing system.
    상세보기
  31. Tervo,Paul A.; Smith,Kenneth R.; Cowan,Clarence E.; Dauphinais,Mike P.; Koxxy,Martin J., Membrane probing system.
    상세보기
  32. Gleason, K. Reed; Smith, Kenneth R.; Bayne, Mike, Membrane probing system with local contact scrub.
    상세보기
  33. Pyun Do-Sun,KRX, Method and apparatus for testing internal circuit.
    상세보기
  34. Saunders,J. Lynn; Loudermilk,Alan R., Method for manufacturing an electronic device having an electronically determined physical test member.
    상세보기
  35. Caywood John ; Lepejian David Y, Method for using inspection data for improving throughput of stepper operations in manufacturing of integrated circuits.
    상세보기
  36. Lepejian David Yepejian, Method for using wafer navigation to reduce testing times of integrated circuit wafers.
    상세보기
  37. Hayden, Leonard; Martin, John; Andrews, Mike, Method of assembling a wafer probe.
    상세보기
  38. Gleason, Reed; Bayne, Michael A.; Smith, Kenneth, Method of constructing a membrane probe.
    상세보기
  39. Smith, Kenneth R., Method of replacing an existing contact of a wafer probing assembly.
    상세보기
  40. J. Lynn Saunders ; Alan R. Loudermilk, Methods for making contact device for making connection to an electronic circuit device and methods of using the same.
    상세보기
  41. Saunders, J. Lynn; Loudermilk, Alan R., Methods for making contact device for making connection to an electronic circuit device and methods of using the same.
    상세보기
  42. Saunders, J. Lynn; Loudermilk, Alan R., Methods for making contact device for making connection to an electronic circuit device and methods using the same.
    상세보기
  43. Saunders, J. Lynn; Loudermilk, Alan R., Methods for manufacturing an electronic device having an electronically determined physical test member.
    상세보기
  44. Saunders, J. Lynn; Loudermilk, Alan R., Methods for manufacturing an electronic device using an electronically determined test member.
    상세보기
  45. Bell Martin J. (Santa Clara CA), Netlist editor allowing for direct, interactive low-level editing of netlists.
    상세보기
  46. Strid,Eric; Campbell,Richard, On-wafer test structures for differential signals.
    상세보기
  47. Harris,Daniel L.; McCann,Peter R., Optical testing device.
    상세보기
  48. Sinsheimer Roger ; Richards Tom, Probe card changer system and method.
    상세보기
  49. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
    상세보기
  50. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
    상세보기
  51. Hayden,Leonard; Rumbaugh,Scott; Andrews,Mike, Probe for combined signals.
    상세보기
  52. Campbell,Richard L.; Andrews,Michael; Bui,Lynh, Probe for high frequency signals.
    상세보기
  53. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Probe for testing a device under test.
    상세보기
  54. Smith, Kenneth; Jolley, Michael; Van Syckel, Victoria, Probe head having a membrane suspended probe.
    상세보기
  55. Smith,Kenneth; Jolley,Michael; Van Syckel,Victoria, Probe head having a membrane suspended probe.
    상세보기
  56. Schwindt,Randy, Probe holder for testing of a test device.
    상세보기
  57. Nordgren, Greg; Dunklee, John, Probe station.
    상세보기
  58. Nordgren, Greg; Dunklee, John, Probe station.
    상세보기
  59. Peters, Ron A.; Hayden, Leonard A.; Hawkins, Jeffrey A.; Dougherty, R. Mark, Probe station having multiple enclosures.
    상세보기
  60. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
    상세보기
  61. Peters,Ron A.; Hayden,Leonard A.; Hawkins,Jeffrey A.; Dougherty,R. Mark, Probe station having multiple enclosures.
    상세보기
  62. Cowan, Clarence E.; Tervo, Paul A.; Dunklee, John L., Probe station thermal chuck with shielding for capacitive current.
    상세보기
  63. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
    상세보기
  64. Cowan,Clarence E.; Tervo,Paul A.; Dunklee,John L., Probe station thermal chuck with shielding for capacitive current.
    상세보기
  65. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
    상세보기
  66. Dunklee,John; Cowan,Clarence E., Probe station with low inductance path.
    상세보기
  67. Lesher, Timothy; Miller, Brad; Cowan, Clarence E.; Simmons, Michael; Gray, Frank; McDonald, Cynthia L., Probe station with low noise characteristics.
    상세보기
  68. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
    상세보기
  69. Lesher,Timothy; Miller,Brad; Cowan,Clarence E.; Simmons,Michael; Gray,Frank; McDonald,Cynthia L., Probe station with low noise characteristics.
    상세보기
  70. Navratil,Peter; Froemke,Brad; Stewart,Craig; Lord,Anthony; Spencer,Jeff; Runbaugh,Scott; Fisher,Gavin; McCann,Pete; Jones,Rod, Probe station with two platens.
    상세보기
  71. Lesher, Timothy E., Probe testing structure.
    상세보기
  72. Lesher,Timothy E., Probe testing structure.
    상세보기
  73. Smith, Kenneth R.; Hayward, Roger, Probing apparatus with impedance optimized interface.
    상세보기
  74. Smith, Kenneth R., Replaceable coupon for a probing apparatus.
    상세보기
  75. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for high-frequency testing of a device under test.
    상세보기
  76. Gleason, K. Reed; Lesher, Tim; Strid, Eric W.; Andrews, Mike; Martin, John; Dunklee, John; Hayden, Leonard; Safwat, Amr M. E., Shielded probe for testing a device under test.
    상세보기
  77. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
    상세보기
  78. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
    상세보기
  79. Gleason,K. Reed; Lesher,Tim; Andrews,Mike; Martin,John, Shielded probe for testing a device under test.
    상세보기
  80. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
    상세보기
  81. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe for testing a device under test.
    상세보기
  82. Gleason,K. Reed; Lesher,Tim; Strid,Eric W.; Andrews,Mike; Martin,John; Dunklee,John; Hayden,Leonard; Safwat,Amr M. E., Shielded probe with low contact resistance for testing a device under test.
    상세보기
  83. Dunklee,John, Switched suspended conductor and connection.
    상세보기
  84. Dunklee,John, Switched suspended conductor and connection.
    상세보기
  85. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
    상세보기
  86. Strid,Eric W.; Schappacher,Jerry B.; Carlton,Dale E.; Gleason,K. Reed, System for evaluating probing networks.
    상세보기
  87. Andrews, Peter; Hess, David, System for testing semiconductors.
    상세보기
  88. Negishi, Kazuki; Hansen, Mark, Test apparatus for measuring a characteristic of a device under test.
    상세보기
  89. Campbell, Richard, Test structure and probe for differential signals.
    상세보기
  90. Campbell,Richard, Test structure and probe for differential signals.
    상세보기
  91. Rumbaugh,Scott, Thermal optical chuck.
    상세보기
  92. Rumbaugh,Scott, Thermal optical chuck.
    상세보기
  93. Hayden, Leonard; Martin, John; Andrews, Mike, Wafer probe.
    상세보기
  94. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
    상세보기
  95. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
    상세보기
  96. Hayden,Leonard; Martin,John; Andrews,Mike, Wafer probe.
    상세보기
  97. Schwindt, Randy J.; Harwood, Warren K.; Tervo, Paul A.; Smith, Kenneth R.; Warner, Richard H., Wafer probe station having a skirting component.
    상세보기
  98. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
    상세보기
  99. Schwindt,Randy J.; Harwood,Warren K.; Tervo,Paul A.; Smith,Kenneth R.; Warner,Richard H., Wafer probe station having a skirting component.
    상세보기
  100. Harwood, Warren K.; Tervo, Paul A.; Koxxy, Martin J., Wafer probe station having environment control enclosure.
    상세보기
  101. Harwood,Warren K.; Tervo,Paul A.; Koxxy,Martin J., Wafer probe station having environment control enclosure.
    상세보기
  102. Campbell, Richard, Wideband active-passive differential signal probe.
    상세보기

활용도 분석정보

상세보기
다운로드
내보내기

활용도 Top5 특허

해당 특허가 속한 카테고리에서 활용도가 높은 상위 5개 콘텐츠를 보여줍니다.
더보기 버튼을 클릭하시면 더 많은 관련자료를 살펴볼 수 있습니다.

관련 콘텐츠

저작권 관리 안내
섹션별 컨텐츠 바로가기

AI-Helper ※ AI-Helper는 오픈소스 모델을 사용합니다.

AI-Helper 아이콘
AI-Helper
안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

선택된 텍스트

맨위로