[특허]Confocal laser scanning transmission microscope

Confocal laser scanning transmission microscope 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G02B-026/10
출원번호	US-0538526 (1990-06-15)
발명자 / 주소	Ellis, Gordon W. Ichie, Koji
출원인 / 주소	Hamamatsu Photonics K.K.
대리인 / 주소	Cushman, Darby & Cushman
인용정보	피인용 횟수 : 37 인용 특허 : 3

초록 ▼

This invention relates to a confocal laser scanning transmission microscope including a deflecting element for deflecting a light beam at a set scanning frequency in a main scanning direction and an auxiliary scanning direction perpendicular to the main scanning direction to irradiate the light spot to a specimen, and the microscope further comprises an infinity compensating objective lens for collecting a transmitted light through the specimen to form into a parallel beam and a cube-corner-reflector disposed on the opposite side of the specimen across the objective lens and on the exit pupil position of the infinity compensating objective lens.

대표청구항 ▼

1. A confocal laser scanning transmission microscope including a deflecting element for deflecting a light beam at a set scanning frequency in a main scanning direction and an auxiliary scanning direction perpendicular to the main scanning direction to irradiate the light spot to a specimen, the microscope comprising: an infinity compensating objective lens for collecting a light beam transmitted through the specimen to form into a parallel beam; and a cube-corner-reflector disposed on the opposite side of the specimen across the infinity compensating objective lens and on the exit pupil position of the infinity compensating objective lens. 2. A confocal laser scanning transmission microscope according to claim 1 further comprising an objective lens disposed on the opposite side of the infinity compensating objective lens across the specimen, and the light beam irradiated to the specimen passes through the entrance pupil of this objective lens.

이 특허에 인용된 특허 (3)

Edwards Byron (Orange CA) Stewart ; Jr. George W. (Costa Mesa CA), Free expansion pseudo-zoom for laser projector.
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Van Arnam Donald E. (Ontario CA) McFeaters Earl W. (La Crescenta CA) Baggarley Richard R. (Arcadia CA), Retroreflectometer.
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Dunning Gilmore J. (Newbury Park CA), System and method for low noise optical retroreflection with gain.
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이 특허를 인용한 특허 (37)

Sanii, Babak; Burgess, James R., Anamorphic recording method and apparatus.
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Takahashi Tomoichi,JPX ; Tateishi Kazuyoshi,JPX ; Watabe Akinori,JPX, Apparatus for extracting pattern features.
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Takahashi Tomoichi,JPX ; Tateishi Kazuyoshi,JPX ; Watabe Akinori,JPX, Apparatus for extracting pattern features.
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Thomas, Sure, Confocal microscope.
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Mizuno,Rogerio Jun, Confocal probe.
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Lanni Frederick ; Taylor D. Lansing ; Bailey Brent, Field synthesis and optical subsectioning for standing wave microscopy.
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Cobb Joshua Monroe ; Florence ; Jr. Robert Francis ; Topolovec Franz X. ; Ziemins Uldis Artis, Illumination/viewing system for features in transparent materials.
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Tertitski, Leonid M.; Kuttannair, Krishna Kumar; Hunter, Aaron Muir; Moffatt, Stephen, Laser beam positioning system.
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Sukhman, Yefim P.; Noto, Stefano J.; Kaufman, Cheryl, Laser beam positioning systems for material processing and methods for using such systems.
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Kusunose Haruhiko,JPX, Laser microscope and a pattern inspection apparatus using such laser microscope.
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Kusunose Haruhiko,JPX, Laser microscope and a pattern inspection apparatus using such laser microscope.
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Krause Andrew W. ; Liang Minhua ; Stehr Robert L., Light modulated confocal optical instruments and method.
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DiFrancesco, David; Burgess, James, Method and apparatus for beam deflection using multiple beam scanning galvanometers.
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Worster Bruce W. ; Lee Ken K., Method for characterizing defects on semiconductor wafers.
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Worster, Bruce W.; Lee, Ken K., Method for characterizing defects on semiconductor wafers.
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Worster,Bruce W.; Lee,Ken K., Method for characterizing defects on semiconductor wafers.
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Worster,Bruce W.; Lee,Ken K., Method for characterizing defects on semiconductor wafers.
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Ooki, Hiroshi; Kadomatsu, Yuji; Ogino, Katsumi, Microscope.
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Mueller, Gerhard J.; Wolleschensky, Ralf, Microscope for reflected-light and transmitted-light microscopy.
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Mueller,Gerhard J.; Wolleschensky,Ralf, Microscope for reflected-light and transmitted-light microscopy.
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Fleming, Patrick R.; DeVoe, Robert J.; Leatherdale, Catherine A.; Ballen, Todd A.; Florczak, Jeffrey M., Multidirectional photoreactive absorption method.
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Fleming,Patrick R.; DeVoe,Robert J.; Leatherdale,Catherine A.; Ballen,Todd A.; Florczak,Jeffrey M., Multipass multiphoton absorption method and apparatus.
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DeVoe, Robert J.; Leatherdale, Catherine A.; Florczak, Jeffrey M.; Fleming, Patrick R.; Potts, John E., Multiphoton curing to provide encapsulated optical elements.
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DeVoe, Robert J.; Leatherdale, Catherine A.; Florczak, Jeffrey M.; Fleming, Patrick R.; Potts, John E., Multiphoton curing to provide encapsulated optical elements.
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Kimura, Shigeharu, Optical device for transmission-type scanning by moving scanning beam without moving observation sample.
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Otsuki Shinya,JPX ; Tanaami Takeo,JPX, Optical microscope.
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Gugel,Hilmar, Phase filter.
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White, John G., Photon-sorting spectroscopic microscope system.
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Bashkansky Mark ; Duncan Michael ; Reintjes John, Rapid, high-resolution scanning of flat and curved regions for gated optical imaging.
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Han Ke, Ring dilation and erosion techniques for digital image processing.
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Boettner Matthew C. ; Ouderkirk Steven J., Scanning confocal microscope with oscillating objective lens.
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Cloutier, Sylvain G., Scanning optical microscope with long working distance objective.
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Nakata Naotaro,JPX ; Yoshida Akihisa,JPX, Semiconductor laser and optical system having a collimator lens.
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Nakata, Naotaro; Yoshida, Akihisa, Semiconductor laser and optical system having a collimator lens.
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White John G. ; Wokosin David L., Signal enhancement for fluorescence microscopy.
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Krause Andrew W. (Sparks MD), Spatially light modulated confocal microscope and method.
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Lee, Ken K., Surface extraction from a three-dimensional data set.
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IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

연합인증

Confocal laser scanning transmission microscope 원문보기