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High resolution amorphous silicon radiation detectors 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01T-001/24
출원번호 US-0448240 (1989-12-11)
발명자 / 주소
  • Street Robert A. (Palo Alto CA) Kaplan Selig N. (El Cerrito CA) Perez-Mendez Victor (Berkeley CA)
출원인 / 주소
  • The Regents of the University of California (Oakland CA 02)
인용정보 피인용 횟수 : 66  인용 특허 : 0

초록

A radiation detector employing amorphous Si:H cells in an array with each detector cell having at least three contiguous layers (n type, intrinsic, p type), positioned between two electrodes to which a bias voltage is applied. An energy conversion layer atop the silicon cells intercepts incident rad

대표청구항

Detector elements in an array of such elements for high energy particles or photons that move through the detector, with each detector element comprising: first and second electrodes lying in approximately parallel planes and being spaced apart from each other; an amorphous film including a mixture

이 특허를 인용한 특허 (66)

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