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System for 3-D inspection of objects 원문보기

IPC분류정보
국가/구분 United States(US) Patent 등록
국제특허분류(IPC7판)
  • G01B-011/24
출원번호 US-0551150 (1990-07-11)
발명자 / 주소
  • Chen Sullivan (Centerport NY) Yonescu William E. (Dix Hills NY) Stern Howard K. (Greenlawn NY)
출원인 / 주소
  • Robotic Vision Systems, Inc. (East Hauppauge NY 02)
인용정보 피인용 횟수 : 49  인용 특허 : 0

초록

An inspection system for irregular objects such as solder joints wherein the system utilizes first and second sensors adapted to be pivotable about a common pivot axis and such that the projection axes of the sensors and the pivot axes are able to intersect at a common.

대표청구항 ▼

An apparatus for inspecting objects comprising: first sensor means for projecting electromagnetic radiation along a first projection axis and viewing reflected radiation along a first viewing axis; second sensor means for projecting electromagnetic radiation along a second projection axis and viewin

이 특허를 인용한 특허 (49)

  1. Ljungblad, Ulric; Wildheim, Martin, Additive manufacturing method and apparatus.
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  2. Jonasson, Daniel, Additive manufacturing of three-dimensional articles.
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  3. Jonasson, Daniel, Additive manufacturing of three-dimensional articles.
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  4. Jonasson, Daniel, Additive manufacturing of three-dimensional articles.
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  5. Ljungblad, Ulric; Ackelid, Ulf, Additive manufacturing of three-dimensional articles.
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  6. Ackelid, Ulf, Apparatus for additive manufacturing.
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  7. Backlund, Johan; Lock, Tomas, Apparatus, method, and computer program product for fusing a workpiece.
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  8. Backlund, Johan; Lock, Tomas, Apparatus, method, and computer program product for fusing a workpiece.
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  9. Backlund, Johan; Lock, Tomas, Apparatus, method, and computer program product for fusing a workpiece.
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  10. Sundman,Arjen; Davis,Jeff, Compact optical contour digitizer.
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  11. Fager, Mattias, Computer program products configured for additive manufacturing of three-dimensional articles.
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  12. Snis, Anders, Energy beam position verification.
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  13. Snis, Anders, Energy beam position verification.
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  14. Snis, Anders, Energy beam size verification.
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  15. Snis, Anders, Energy beam size verification.
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  16. Lavelle,Joseph P.; Schuet,Stefan R., High speed three-dimensional laser scanner with real time processing.
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  17. Sundman, Arjen; Davis, Jeffery L., Impression foam digital scanner.
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  18. Garvey, III, Raymond Earl; Skeirik, Robert Darrell, Infrared imaging for evaluating performance characteristics.
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  19. Liu,Lang, Method and a device for measuring the three dimension surface shape by projecting moire interference fringe.
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  20. Ackelid, Ulf, Method and apparatus for additive manufacturing.
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  21. Ljungblad, Ulric, Method and apparatus for detecting defects in freeform fabrication.
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  22. Leonard,Patrick F.; Scarpine,Victor; Evans,Frank, Method and apparatus for evaluating integrated circuit packages having three dimensional features.
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  23. Ljungblad, Ulric; Loewgren, Lars; Snis, Anders; Fager, Mattias, Method and apparatus for forming a three-dimensional article.
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  24. Kiest, Cary S.; Lenzke, Jr., William F., Method and apparatus for illuminating projecting features on the surface of a semiconductor wafer.
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  25. Hellestam, Calle; Olsson, Jenny; Elfstroem, Isak, Method and apparatus for manufacturing porous three-dimensional articles.
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  26. Jonasson, Daniel; Larsson, Morgan; Ackelid, Ulf; Snis, Anders; Lock, Tomas, Method and apparatus for producing three-dimensional objects.
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  27. Lock, Tomas, Method and device for characterizing an electron beam.
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  28. Svetkoff, Donald J.; Kilgus, Donald B. T.; Lin, Warren; Ehrmann, Jonathan S., Method and system for 3D imaging of target regions.
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  29. Donald J. Svetkoff ; Donald B. T. Kilgus ; Jonathan S. Ehrmann, Method and system for high speed measuring of microscopic targets.
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  30. Donald J. Svetkoff ; Donald B. T. Kilgus ; Warren Lin ; Jonathan S. Ehrmann, Method and system for high speed measuring of microscopic targets.
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  31. Svetkoff Donald J. ; Kilgus Donald B. T. ; Lin Warren ; Ehrmann Jonathan S., Method and system for high speed measuring of microscopic targets.
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  32. Svetkoff Donald J. ; Kilgus Donald B. T. ; Lin Warren ; Ehrmann Jonathan S., Method and system for high speed measuring of microscopic targets.
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  33. Svetkoff Donald J. ; Kilgus Donald B. T. ; Lin Warren ; Ehrmann Jonathan S., Method and system for high speed measuring of microscopic targets.
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  34. Svetkoff,Donald J.; Kilgus,Donald B. T.; Lin,Warren; Ehrmann,Jonathan S., Method and system for high speed measuring of microscopic targets.
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  35. Svetkoff Donald J. ; Kilgus Donald B. T., Method and system for suppressing unwanted reflections in an optical system.
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  36. Svetkoff Donald J. (Ann Arbor MI) Rohrer Donald K. (Whitmore Lake MI) Noblett David A. (Agoura CA) Jackson Robert L. (Moorpark CA), Method and system for triangulation-based, 3-D imaging utilizing an angled scaning beam of radiant energy.
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  37. Elfstroem, Isak; Hellestam, Calle; Fager, Mattias, Method for additive manufacturing.
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  38. Hellestam, Calle, Method for additive manufacturing.
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  39. Hellestam, Calle, Method for additive manufacturing.
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  40. Fager, Mattias, Method for additive manufacturing of three-dimensional articles.
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  41. Bowers, Mark W., Optical distance measurement device and method thereof.
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  42. Eckhard Sperschneider DE, Process and circuit for testing a solder joint for faults.
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  43. Bieman,Leonard H., Scanning phase measuring method and system for an object at a vision station.
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  44. Liu,Lang, Sensing device for measuring the three-dimension shape and its measuring method.
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  45. Sato Tsuyoshi,JPX, Shape measurement apparatus and method.
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  46. Jefferson,Stanley T., System and method for parallel image reconstruction of multiple depth layers of an object under inspection from radiographic images.
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  47. Mamiya,Takahiro; Futamura,Ikuo, Three-dimensional measuring instrument.
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  48. Svetkoff Donald J. ; Rohrer Donald K. ; Kelley Robert W., Triangulation-based 3-D imaging and processing method and system.
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  49. Svetkoff Donald J. ; Kilgus Donald B. T., Versatile method and system for high speed, 3D imaging of microscopic targets.
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