[특허]Method and apparatus for process control

Method and apparatus for process control 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	G06F-015/46 G05B-013/02
출원번호	US-0559645 (1990-07-30)
발명자 / 주소	Badavas Paul C. (Southboro MA)
출원인 / 주소	The Foxboro Company (Foxboro MA 02)
인용정보	피인용 횟수 : 84 인용 특허 : 0

초록 ▼

A statistical process control system provides asymmetrical nonlinear automatic closed-loop feedback control. The system has application, for example, in the control of equipment that responds to a controlled variable signal to vary a measurable characteristic of a process. The system uses an accumulated deviation of a measured subgroup means minus a target value, divided by the subgroup standard deviation, to modify the manipulated variable each time the accumulated value exceeds a decision interval above or below the target. The system permits the use of independent slack variables subtracted from the accumulated deviation to more closely model the underlying process. Likewise, the system permits the use of independent alarm values and variable gains to permit greater control of the process.

대표청구항 ▼

An apparatus for closed-loop control of a process performed with equipment that responds to a controlled variable signal to vary a first characteristic of that process, said apparatus having the improvement comprising A. batch monitoring means for monitoring values of a first process characteristic of the process being performed and for generating a signal representative of an arithmetic mean of those monitored values and for generating a signal representative of a standard deviation of those monitored values, B. normalization means coupled to said batch monitoring means for responding to said mean value-representative signal and to said standard deviation-representative signal to generate an error signal representative of a normalized deviation of said monitored values, C. drift detection means coupled to said normalization means for responding to said error signal to detect a selected change in said first process characteristic, said drift detection means comprising i) first accumulation means for generating a high-value accumulation signal representative of a summation of time-successive values of a difference between said error signal and a first slack value, and ii) second accumulation means for generating a low-value accumulation signal representative of a summation of time-successive values of a difference between an additive inverse of said error signal and a second slack value, which may be independent of said first slack value, D. process control means coupled to said drift detection means for selectively generating a manipulated variable signal representative of a sum of a prior value of said manipulated variable signal and a scaled one of at least one of said high-value accumulation signal and said low-value accumulation signal, and E. closed-loop control means for applying said manipulated variable signal to the process-performing equipment to drive the controlled variable signal to a target value.

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IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
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A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

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Method and apparatus for process control 원문보기

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Method and apparatus for process control 원문보기

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