[특허]Contact assembly

[미국특허] Contact assembly 원문보기

IPC분류정보
국가/구분	United States(US) Patent 등록
국제특허분류(IPC7판)	H01R-009/09
출원번호	US-0807666 (1991-12-16)
발명자 / 주소	Wilson Albert H. (Los Angeles CA)
출원인 / 주소	ITT Corporation (Secaucus NJ 02)
인용정보	피인용 횟수 : 42 인용 특허 : 0

초록 ▼

A contact assembly is provided for connecting pairs of terminals of two circuits, which allows terminals to be positioned at high densities with minimum crosstalk, selected impedances, and minimum inductances for fast pulse rise times. The apparatus includes a dielectric frame (30, FIG. 2) having multiple miniature cavities (46), and an extendable contact assembly (26) lying in each cavity and having a pair of probes (32, 34) projecting from opposite faces of the frame. The two probes of each contact assembly are slideably engaged and are biased apart by a spring (70), the spring being constructed of dielectric material to avoid inductances and to allow for a high characteristic impedance. The frame can include a body (104, FIG. 6) having multiple plated through holes or cavities (106), and end wall structures (114) having dielectric bushings (122) shorter than the body holes and fitting into the body cavities.

대표청구항 ▼

Compression contact apparatus comprising: a frame having first and second end walls, a plurality of cavities between said end walls, and a plurality of holes in each end wall, each hole extending into one of said cavities; an extendable contact assembly lying in each of a plurality of said cavities, each contact assembly including a pair of probes projecting through holes at opposite ends of a corresponding one of said cavities and electrically connected together, and a spring device in said cavity which urges said pair of probes apart; each of said spring devices comprising a coil spring constructed of a nonelastomeric plastic dielectric material to avoid the passage of current through said coil spring.

이 특허를 인용한 특허 (42) 인용/피인용 타임라인 분석

Winter,John M.; Nelson,Larre H.; Bergeron,John C.; Sarcione,Lourie M., Apparatus for interfacing electronic packages and test equipment.
상세보기
Winter,John M.; Nelson,Larre H.; Bergeron,John C.; Sarcione,Lourie M., Apparatus for interfacing electronic packages and test equipment.
상세보기
Kocher, Douglas, Apparatus for use in an electronic component test interface having multiple printed circuit boards.
상세보기
Nakayama, Hiroshi; Hironaka, Kohei; Mabune, Yosuke, Conductive contact holder.
상세보기
Tatzel, Frank; Schiele, Georg; Schütt, Hauke, Connecting member.
상세보기
Yamamoto, Tsugio, Contact probe and socket.
상세보기
Yamamoto, Tsugio; Todoroki, Takeshi, Contact probe and socket.
상세보기
Hatanaka,Makoto, Contact structure for connector array and electronic appliance having the same.
상세보기
Dwight David Smith, Dual compression connector.
상세보기
Marx,Donald A.; Thurston,William E., Dual tapered spring probe.
상세보기
Balucani, Marco, Elastic contact device for electronic components with buckling columns.
상세보기
Gil Fisher IL; Eyal Gargir IL; Roni Mor IL; Oded Savarov IL, Electrical connecting device.
상세보기
Haseyama Makoto,JPX ; Tateishi Masaru,JPX, Electrical connecting device, and semiconductor device testing method.
상세보기
Chang, Yen-Chih; Hwang, Tzu-Yao; Chen, Ke-Hao, Electrical connector assembly with an adaptor for electrical connecting the electrical connector and the PCB.
상세보기
Bennett Glenn Edward, Electrical connector having buckling beam contacts.
상세보기
Lin, Wei-Chih; Chang, Yen-Chih, Electrical connector having improved insulative housing.
상세보기
Smith,Douglas W., Electrically shielded connector.
상세보기
Mason, Jeffery Walter; Alden, III, Wayne Stewart, Electronic interconnect devices having conductive vias.
상세보기
Swart, Mark A.; Sargeant, Steve B.; Johnston, Charles J., Flat plunger round barrel test probe.
상세보기
Scott, Larry S., High frequency compression mount receptacle with lineal contact members.
상세보기
Hoshino Masayoshi,JPX ; Yayoshi Masakazu,JPX, IC socket.
상세보기
Taylor, Paul R., Interposer assembly and method.
상세보기
Hougham,Gareth G; Fogel,Keith E; Rosner,Joanna; Lauro,Paul A; Goma,Sherif; Zinter, Jr.,Joseph, Interposer with electrical contact button and method.
상세보기
Fan, Zhineng; Li, Che-Yu, Low inductance electrical contacts and LGA connector system.
상세보기
Hougham, Gareth G; Fogel, Keith E; Rosner, Joanna; Lauro, Paul A; Goma, Sherif; Zinter, Jr., Joseph, Method for fabricating electrical contact buttons.
상세보기
Smith,Douglas W., Method of fabricating a connector.
상세보기
Choi, Don C.; Lee, Dong Hwan; Yoon, Hee Soo, Multilayer substrate and the manufacturing method thereof.
상세보기
Maughan, Michael; Jessup, Fred; Cegnar, Erik J.; Alexander, David G., Orientationless spring probe receptacle assembly.
상세보기
Kosmala, Michael Lawrence, Pogo contact.
상세보기
Konig Walter (Neusaess DEX) Modl Albert (Stadtbergen DEX) Baur Peter F. (Augsburg DEX), Printed circuit board assembly for high speed data transfer.
상세보기
Gordon A. Vinther ; Scott D. Chabineau ; Charles J. Johnston, Self-closing spring probe.
상세보기
Gordon A. Vinther ; Charles J. Johnston ; Scott D. Chabineau ; Brian L. Crisp, Self-retained spring probe.
상세보기
Haseyama, Makoto; Tateishi, Masaru, Semiconductor device testing method, using a spring-biased transformable conductive member electrode connection.
상세보기
Mason, Jeffery Walter; Alden, III, Wayne Stewart, Socket connectors and methods of assembling socket connectors.
상세보기
Di Stefano, Thomas H., Socket for an electronic device.
상세보기
Di Stefano, Thomas H., Socket for an electronic device.
상세보기
Johnston, Charles J.; Chabineau, Scott; Treibergs, Valts; Yakushev, Sergey; Swart, Mark; Kottmeyer, Edward A., Spring contact assembly.
상세보기
Johnston, Charles J.; Chabineau, Scott; Treibergs, Valts; Yakushev, Sergey; Swart, Mark; Kottmeyer, Edward A., Spring contact assembly.
상세보기
Johnston, Charles J.; Chabineau, Scott; Treibergs, Valts; Yakushev, Sergey; Swart, Mark; Kottmeyer, Edward A., Spring contact assembly.
상세보기
Motohara, Hiroyuki, Stacked mounting structure.
상세보기
Lai,Han Kuang, Test fixture for holding signal terminals or pins and related method for assembling the test fixture.
상세보기
Staab Craig C. (Mesa AZ) Olson David P. (Tempe AZ), Universal contactor system for testing ball grid array (BGA) devices on multiple handlers and method therefor.
상세보기

활용도 분석정보

상세보기

다운로드

내보내기

활용도 Top5 특허

해당 특허가 속한 카테고리에서 활용도가 높은 상위 5개 콘텐츠를 보여줍니다.
더보기 버튼을 클릭하시면 더 많은 관련자료를 살펴볼 수 있습니다.

내보내기 메뉴

내보내기 구분

파일저장
인쇄
메일전송

구성항목

기본정보
상세정보

관리번호, 국가코드, 자료구분, 상태, 출원번호, 출원일자, 공개번호, 공개일자, 등록번호, 등록일자, 발명명칭(한글), 발명명칭(영문), 출원인(한글), 출원인(영문), 출원인코드, 대표IPC

저장형식

Text(ASCII format)
Excel format
PIAS분석(.xls)

메일정보

받는사람 (필수): @
보내는사람 (선택): @
제목
내용: KISTI 검색결과 이메일 서비스

안내

총 건의 자료가 검색되었습니다.

다운받으실 자료의 인덱스를 입력하세요. (1-10,000)

검색결과의 순서대로 최대 10,000건 까지 다운로드가 가능합니다.

데이타가 많을 경우 속도가 느려질 수 있습니다.(최대 2~3분 소요)

다운로드 파일은 UTF-8 형태로 저장됩니다.
파일의 내용이 제대로 보이지 않을실 때는 웹브라우저 상단의 보기 -> 인코딩 -> 자동선택 여부를 확인하십시오.

Text(ASCII format)
Excel format

AI-Helper ※ AI-Helper는 을 사용합니다.

AI-Helper

안녕하세요, AI-Helper입니다. 좌측 "선택된 텍스트"에서 텍스트를 선택하여 요약, 번역, 용어설명을 실행하세요.
※ AI-Helper는 부적절한 답변을 할 수 있습니다.

IPC	Description
A	생활필수품
A62	인명구조; 소방(사다리 E06C)
A62B	인명구조용의 기구, 장치 또는 방법(특히 의료용에 사용되는 밸브 A61M 39/00; 특히 물에서 쓰이는 인명구조 장치 또는 방법 B63C 9/00; 잠수장비 B63C 11/00; 특히 항공기에 쓰는 것, 예. 낙하산, 투출좌석 B64D; 특히 광산에서 쓰이는 구조장치 E21F 11/00)
A62B-1/08	.. 윈치 또는 풀리에 제동기구가 있는 것

연합인증

[미국특허] Contact assembly 원문보기